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Class 700/51 - Statistical process control (SPC)


Subclass of Class 700 - Data processing: generic control systems or specific applications
Definition: Subject matter which monitors the performance of a process
No. of applications: 28
Last issue date: 12/03/2009


Application No.Application TitleIssue Date
20090299499Correction Signals
This document describes a correction signal usable to correct an effect of a disturbance signal on a controlled system or apparatus. In one case this document describes ways in which to diminish a future change to an output signal based on determining that a disturbance...
12/03/2009
20090088873APPARATUS AND METHOD FOR THERMAL MANAGEMENT OF ELECTRONIC DEVICES
A system that incorporates teachings of the present disclosure may include, for example, a thermal management device having a controller to monitor pressure parameters for hot and cold rooms where the hot and cold rooms are divided by a rack for electronic devices and a...
04/02/2009
20090078562METHOD OF SYSTEM MAINTENANCE PLANNING BASED ON CONTINUAL ROBOT PARAMETER MONITORING
At least one substrate location sensor is provided on a piece of equipment containing two adjoined chambers between which substrates may be transferred one at a time. Deviation of substrate position from a predetermined optimal position is measured as a substrate is tra...
03/26/2009
20090055000SYSTEM AND METHOD FOR ROUTING SELECTION USING STATISTICAL DATA
A system, method, and medium, the method including receiving parameter information associated with a mailer, associating the parameter information with a mailing, receiving statistical information, the statistical information including historical performance data of at ...
02/26/2009
20090043405Method and system of monitoring, sensor validation and predictive fault analysis
The present invention provides an improved method and system for real-time monitoring, validation, optimization and predictive fault analysis in a process control system. The invention monitors process operations by continuously analyzing sensor measurements and providi...
02/12/2009
20090043407Method for Controlling an Industrial Automation Device or Process
A method for controlling an industrial automation device or process including a control unit, at least one actuator, and at least one device arranged for wireless communication with the control unit. The method determines characteristics of the wireless transmissions us...
02/12/2009
20080270213Process risk estimation indication
An automatic process outputs a activity failure indicator indicating the likelihood of project failure, a delay indicator indicating the likelihood of project delay, a human resource shortage indicator indicating the likelihood of a lack of human resources and an infras...
10/30/2008
20080243271SYSTEM AND METHOD FOR QUANTIFYING AN IMPROVEMENT IN AN ADVANCED PROCESS CONTROL STRATEGY
An analysis application utilizes several quantitative metrics that characterize a controller's performance with respect to: specification limits, extreme values, and target and trend versus time. The application utilizes the metrics to provide statistical p-values....
10/02/2008
20080243270Methods for predicting dimensional stability of a wood product based on differential characteristics
Methods are provided for predicting warp of a wood product given its differential characteristics, such as, for example, curvature. The methods may involve measuring at least one original warp profile for each of one or more first wood products; measuring one or more in...
10/02/2008
20080217005AUTOMATED OIL WELL TEST CLASSIFICATION
The subject mater herein relates to oil well testing and, more particularly, automated oil well test classification. Various embodiments described herein provide systems, methods, and software for statistical analysis and classification of oil well tests. Some embodimen...
09/11/2008
20080215180ARRANGEMENT FOR DYNAMIC LEAN REPLENISHMENT AND METHODS THEREFOR
A dynamic lean replenishment method for handling inventory management is provided. The method includes performing analysis to determine a projected inventory stock. The analysis is performed in accordance with at least one of a synchronous mode and an asynchronous mode....
09/04/2008
20080125883Method and apparatus for consolidating process control
The present invention embodiments consolidate process control for a process including a plurality of control threads each associated with a stage of the process. A plurality of the control threads are analyzed to enable the process control with a reduced quantity of the...
05/29/2008
20080091282Controller and method of controlling an apparatus
In the field of electronic or computerized control apparatuses, known methods of compensating for disturbance signals rely on less than ideal analytical or empirical models. There is provided a controller (200) or method of controlling which observes and learns t...
04/17/2008
20080004723Method for operating a process plant, process plant and computer program product
A method for operating a process plant, in which at the process level a number of items of alarm information are generated to display improper operating procedures of the process plant, has a defined number of process states of the process plant, wherein each process st...
01/03/2008
20070260336Long Infrastructure Management System and Program
A long object management system for managing the history of the attribute data as well as the shape data constituting the temporal information of pipeline facilities, in which the future prediction is conducted by acquiring and managing the temporal information. The sys...
11/08/2007
20070198105Methods to support process quality and maintenance during control of an industrial process such as welding
A number of methods to support process quality and maintenance during control of an industrial process such as welding are provided. The methods provide, among other things: automatic process limit programming based on runtime data; user-initiated process limit programm...
08/23/2007
20070100487Method and system for virtual metrology in semiconductor manufacturing
Provided are a method and a system for virtual metrology in semiconductor manufacturing. Process data and metrology data are received. Prediction data is generated based on the process data and metrology data using a learning control model. The system for virtual metrol...
05/03/2007
20070010902SYSTEM AND METHOD FOR ADAPTIVE CONTROL OF UNCERTAIN NONLINEAR PROCESSES
A computer system for controlling a nonlinear physical process. The computer system comprises a linear controller and a neural network. The linear controller receives a command signal for control of the nonlinear physical process and a measured output signal from the ou...
01/11/2007
20060122728Method and system for thermal process control
A thermal process system. The thermal process system comprises a thermal processor, a metrology tool, and a controller. The thermal processor performs a thermal process as defined by a heating model to form a film on a wafer surface. The metrology tool, interfaced with ...
06/08/2006
20060116778On-line statistical process control information system and method
On-line statistical process control information system and method are disclosed, which are particularly related to system and method of real-time reflecting and controlling quality of a manufacturing process by employing a database and computer network technology. With ...
06/01/2006
20060106469Systems and methods for statistical process control
A system for performing statistical process control. A storage device stores a plurality of SPC charts, specifying data collected from a system during testing. A controller categorizes the SPC charts into a plurality of groups based on characteristics thereof. A detecto...
05/18/2006
20050267607Dynamic offset and feedback threshold
A method, system and medium are provided for enabling improved feedback and feedforward control. An error, or deviation from target result, is observed during manufacture of semi conductor chips. The error within standard deviation is caused by two components: a white n...
12/01/2005
20050203643System and method for implementing real-time applications based on stochastic compute time algorithms
A method for developing and using real time applications for a dynamic system having a sensing subsystem, actuation subsystem, a control subsystem, and an application subsystem utilizes stochastic compute time algorithms. After optimization functions, desired state and ...
09/15/2005
20050149210Methods to support process quality and maintenance during control of an industrial process such as welding
A number of methods to support process quality and maintenance during control of an industrial process such as welding are provided. The methods provide, among other things: automatic process limit programming based on runtime data; user-initiated process limit programm...
07/07/2005
20050125084System and method for processing welding data
A system and method for evaluating the use of a welding process for welding a weld joint. The method comprises providing a user with requests for data to enable a processor-based system to establish various attributes of welding a specific weld joint using a specific we...
06/09/2005
20050107893Event detection - apparatus and method for measuring the activity of neural netwoks
Apparatus for measuring neural network activity with a textured semiconductor substrate. Sensor elements have a respective detection electrode on the substrate surface for detecting neural network signals, and the detected neural signals are a basis for outputting elect...
05/19/2005
20050038543Method and system for synchronizing control limit and equipment performance
A method and system for synchronizing a control chart of an SPC system and equipment performance has a chart model (22) with new chart properties; a method for calculating a control limit based on a statistical deviation, a synchronization frequency for setting a...
02/17/2005
20050015176Method for automatic configuration of processing system
A method of automatically configuring an Advanced Process Control (APC) system for a semiconductor manufacturing environment in which an auto-configuration script is generated for executing an auto-configuration program. The auto-configuration script activates default v...
01/20/2005
 
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