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| Application No. | Application Title | Issue Date |
| 20120130523 | METHOD AND A SYSTEM FOR AUTOMATIC GENERATION OF THROUGHPUT MODELS FOR SEMICONDUCTOR TOOLS The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages ... | 05/24/2012 |
| 20120130525 | ADAPTIVE AND AUTOMATIC DETERMINATION OF SYSTEM PARAMETERS A MIMO optimizer is used to identify tunable process parameters for processing equipment.... | 05/24/2012 |
| 20120109354 | TILTING-TYPE AUTOMATIC MOLTEN METAL POURING METHOD, TILTING CONTROL SYSTEM, AND STORAGE MEDIUM HAVING TILTING CONTROL PROGRAM STORED THEREIN A method of automatically pouring molten metal from a ladle into a mold by tilting the ladle. In the method, the height of molten metal located above a molten metal outlet and the weight of molten metal flowing out of the ladle are estimated using an expanded Kalman fil... | 05/03/2012 |
| 20120109355 | SUBSTRATE PROCESSING SYSTEM Embodiments of the present invention provide an apparatus and method for processing substrates in a processing system that has an increased system throughput, improved system uptime, and improved device yield performance, while maintaining a repeatable and accurate subs... | 05/03/2012 |
| 20120072001 | REMOTE MONITORING AND CONTROL OF A THREE-DIMENSIONAL OBJECT IN A FABRICATION APPARATUS A three-dimensional object fabrication apparatus. A housing encloses a work area. An interface is provided in the housing permit a processor within the housing to receive digital data defining geometry for a three-dimensional object to be fabricated. A fabrication mecha... | 03/22/2012 |
| 20120046774 | SUBSTRATE PROCESSING APPARATUS, CONTROL METHOD ADOPTED IN SUBSTRATE PROCESSING APPARATUS AND PROGRAM A substrate processing apparatus according to the present invention comprises a plurality of processing chambers, discharge systems each provided in conjunction with one of the processing chambers and a common discharge system connected with the discharge systems of at ... | 02/23/2012 |
| 20120041584 | ENDPOINT DETECTION DEVICE FOR REALIZING REAL-TIME CONTROL OF PLASMA REACTOR, PLASMA REACTOR WITH ENDPOINT DETECTION DEVICE, AND ENDPOINT DETECTION METHOD An endpoint detection device, a plasma reactor with the endpoint detection device, and an endpoint detection method are provided. The endpoint detection device includes an OES data operation unit, a data selector, a product generator, an SVM, and an endpoint determiner.... | 02/16/2012 |
| 20120029678 | INDUSTRIAL AUTOMATION INTERFACES INTEGRATED WITH ENTERPRISE MANUFACTURING INTELLIGENCE (EMI) SYSTEMS A visualization system integrated with an enterprise manufacturing intelligence (EMI) system utilizing preconfigured EMI data models, workflow reports and process event notifications to optimize a manufacturing process. The visualization system and the EMI system exchan... | 02/02/2012 |
| 20120022679 | ADVANCED PROCESS CONTROL OPTIMIZATION A method for automatic process control (APC) performance monitoring may include, but is not limited to: computing one or more APC performance indicators for one or more production lots of semiconductor devices; and displaying a mapping of the one or more APC performance... | 01/26/2012 |
| 20120016508 | SEMICONDUCTOR FABRICATION APPARATUS AND TEMPERATURE ADJUSTMENT METHOD A semiconductor fabrication apparatus includes a semiconductor wafer mounting table having a cavity therein; and a nozzle which jets a liquefied temperature adjustment medium having a temperature equal to or less than a targeted temperature to an inner wall of the cavit... | 01/19/2012 |
| 20120010743 | STATISTICAL ANALYSIS METHOD AND SUBSTRATE PROCESS SYSTEM A data analyzing method includes receiving monitor data from the substrate processing apparatus; producing representative value data based on the monitor data; associating apparatus condition information indicating a condition of the substrate processing apparatus at th... | 01/12/2012 |
| 20110313558 | METHODS AND SYSTEMS FOR MONITORING A PARAMETER OF A MEASUREMENT DEVICE DURING POLISHING, DAMAGE TO A SPECIMEN DURING POLISHING, OR A CHARACTERISTIC OF A POLISHING PAD OR TOOL Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, a characteristic of a polishing pad, or a characteristic of a polishing tool are provided. One method includes scanning a specimen with a meas... | 12/22/2011 |
| 20110301739 | CONTROL SYSTEM OF SUBSTRATE PROCESSING APPARATUS, COLLECTING UNIT, SUBSTRATE PROCESSING APPARATUS AND CONTROL METHOD OF THE SUBSTRATE PROCESSING APPARATUS There is provided a control system of a substrate processing apparatus, comprising: a collecting unit for collecting data from each component that constitutes a substrate processing apparatus, the collecting unit further comprising at least: a buffer for temporarily sto... | 12/08/2011 |
| 20110301740 | SYSTEM AND METHOD FOR MANUFACTURING A LENS, SUCH AS AN OPHTHALMIC LENS A system and method for manufacturing an ophthalmic lens is described. In some examples, the system applies a back surface to a lens blank that includes an aspherical curve having two radii of curvature. In some examples, a back surface of a peripheral portion of the le... | 12/08/2011 |
| 20110282479 | SEWING MACHINE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING SEWING MACHINE CONTROL PROGRAM A sewing machine includes a needle bar to a lower end of which a needle can be attached, a needle plate in which a needle hole is provided, an image capture device that generates, as captured image data, data that describe a captured image of a sewing object being posit... | 11/17/2011 |
| 20110270431 | WELL PRODUCTION SHUT DOWN A system for controlling production shut down of an underwater fluid production well, the well having a sensor for producing an output signal indicative of the state of the well and a valve which is actuable to shut down production activity of the well, comprises means ... | 11/03/2011 |
| 20110264252 | COMBINATORIAL PROCESSING MANAGEMENT SYSTEM A combinatorial processing management system is described, including determining an identification for a substrate, retrieving data from tools operating on the substrate, generating an analysis of the data in response to the retrieving, and storing the data and the anal... | 10/27/2011 |
| 20110251712 | SYSTEM FOR TRACKING SYSTEM PROPERTIES The invention relates to a device for actively tracking specific data on systems or the components of a metallurgical system, characterized in that at least one readable and writable memory medium for the specific data is fixedly connected to each component, and the spe... | 10/13/2011 |
| 20110231000 | POWER MONITORING DEVICE, POWER MONITORING METHOD, AND DEVICE FOR MOUNTING COMPONENT A power monitoring device is configured to monitor power consumed in a device for mounting component, which constitutes a component mounting line. The power monitoring device includes: an operation information collecting section configured to collect in time-series oper... | 09/22/2011 |
| 20110229988 | PATTERN FORMING METHOD, PROCESSING METHOD, AND PROCESSING APPARATUS According to the embodiments, a distribution of a recess portion shape is calculated based on a result obtained by measuring the recess portion shape of a first projection and recess pattern formed on a surface of a template. Next, a distribution of an application amoun... | 09/22/2011 |
| 20110224819 | METHOD FOR CONTROLLING CRITICAL DIMENSION IN SEMICONDUCTOR PRODUCTION PROCESS, AND SEMICONDUCTOR MANUFACTURING LINE SUPPORTING THE SAME A critical dimension controlling method in a semiconductor production process includes determining whether a model is to undergo a discontinuous production process when a run is inserted in a semiconductor manufacturing line, applying an offset for said model or a commo... | 09/15/2011 |
| 20110216399 | Method For Manufacturing An Optical Transmission Filter With Extended Out-Of-Band Blocking In accordance with the invention, a filter is fabricated to take into account the effect of absorption by filter material. The method is exemplified by the fabricating of an ultraviolet light transmission filter for transmitting a band within the range 230-320 nanometer... | 09/08/2011 |
| 20110218661 | METHOD FOR INDIVIDUAL TRACKING OF METALLIC HOLLOW BODIES The invention relates to a method for the individual tracking of metallic hollow bodies, in particular hot-fabricated steel tubes, wherein following a final step of hot-work the individual tube is provided with a distinctive identification on the tube circumference, whi... | 09/08/2011 |
| 20110202161 | SECURING A HAZARDOUS AREA IN THE REGIN SURROUNDING THE AUTOMATIC LOADING OF RRELS ON A REEL CHANGER A hazardous area in the region surrounding a reel transport of a reel changer is secured. A contactless protective device is located at the access boundaries of the region. This protective device can be deactivated for feeding and/or removing a known object and comprise... | 08/18/2011 |
| 20110202162 | Substrate processing apparatus A substrate processing apparatus includes a display unit having an operation screen, a first control section that transmits a control instruction for processing a substrate and a second control section that performs control according to the control instruction from the ... | 08/18/2011 |
| 20110196527 | CONTROL SYSTEM AND ASSOCIATED METHOD FOR CUTTING The present invention relates to a system for controlling the cutting of a first rip out of a first board and a second rip out of the first board or out of a second board. The system including a control module which provides instructions to stack and/or align the first ... | 08/11/2011 |
| 20110196528 | HISTORIANS EMBEDDED IN INDUSTRIAL UNITS Systems and methods that provide a historian integrated as part of an industrial unit and/or product manufactured by the industrial process. A historian integrated as part of the industrial unit itself, can increase data resolution and supply immediate and real time dat... | 08/11/2011 |
| 20110178626 | SUBSTRATE TRANSFER APPARATUS, SUBSTRATE TRANSFER MODULE, SUBSTRATE TRANSFER METHOD AND COMPUTER READABLE STORAGE MEDIUM Disclosed is a substrate transfer apparatus including a transfer arm of a joint type having an arm portion rotatably connected with a holding portion for holding a substrate, the apparatus including: a heating unit for heating the arm portion; a temperature detection un... | 07/21/2011 |
| 20110166689 | CONCRETE MATERIAL DISPENSING SYSTEM A control system for a concrete plant adds intelligent capabilities in the concrete plant that may enhance safety, localize control of the concrete plant, and assist with troubleshooting. The control system may also enhance accuracy for determining an amount of mixed co... | 07/07/2011 |
| 20110160893 | APPLICATIONS OF SONAR-BASED VF/GVF METERING TO INDUSTRIAL PROCESSING The present invention provides a new and unique processor module that features one or more modules configured to respond to one or more input signals containing information about a volumetric flow of a fluid having minerals and varying amounts of entrained gas flowing i... | 06/30/2011 |
| 20110144790 | Thermal Sensing for Material Processing Assemblies Various embodiments of thermal sensing systems and methods for monitoring thermal conditions in such material processing assemblies are described. The thermal sensing systems include a sensor cable that incorporates or is coupled to one or more thermal sensors. The sens... | 06/16/2011 |
| 20110144791 | ENERGY SAVINGS AND GLOBAL GAS EMISSIONS MONITORING Methods and apparatus for enhanced control, monitoring and recording of incoming chemical and power use, and emissions of electronic device manufacturing systems are provided. In some embodiments, integrated sub-fab system systems may monitor the energy usage of the sub... | 06/16/2011 |
| 20110137446 | PLASMA PROCESSING SYSTEM CONTROL BASED ON RF VOLTAGE A method for controlling a plasma processing system using wafer bias information derived from RF voltage information is proposed. The RF voltage is processed via an analog or digital methodology to obtain peak voltage information at least for each of the fundamental fre... | 06/09/2011 |
| 20110137447 | METHOD FOR OPERATING AN INDUSTRIAL SYSTEM The present invention relates to a method for operating an industrial system, wherein the system comprises at least one line (1, 2, 3, 4), wherein each line (1, 2, 3, 4) comprises at least one machine (10, 12, 14, 16), and wherein each machine (1... | 06/09/2011 |
| 20110118863 | METHODS AND APPARATUS FOR CONTROLLING A PLASMA PROCESSING SYSTEM A method and apparatus for compensating a bias voltage at the wafer by measuring RF voltage signals in RF driven plasma including at least an electrostatic, chuck (ESC), a capacitive divider, a signal processing and signal conditioning network is disclosed. The bias com... | 05/19/2011 |
| 20110106285 | SYSTEM FOR USE IN PERFORMANCE OF INJECTION MOLDING OPERATIONS There is provided a system for use in performance of injection molding operations, wherein the system can include a plurality of injection molding assembly components. In one embodiment, the system can be operative so that various information respecting components of th... | 05/05/2011 |
| 20110106288 | SYSTEM FOR USE IN PERFORMANCE OF INJECTION MOLDING OPERATIONS There is provided a system for use in performance of injection molding operations, wherein the system can include a plurality of injection molding assembly components. In one embodiment, the system can be operative so that various information respecting components of th... | 05/05/2011 |
| 20110097476 | COATING APPARATUS AND METHOD OF APPLYING COATING LIQUID To provide a coating apparatus and a coating method capable of accurately control the coating width of a coating liquid on an article to be coated. A coating apparatus 100 include conveying means having a plurality of rollers 21 and 22 for conveying... | 04/28/2011 |
| 20110093212 | METHOD AND DEVICE FOR MEASURING A MOISTURE VALUE OF DIELECTRIC MATERIALS Method for measuring a moisture value F of dielectric materials using at least one microwave resonator, one shift A of the resonant frequency being respectively evaluated for at least two resonance modes with resonant frequencies which are different from one another and... | 04/21/2011 |
| 20110082580 | VACUUM PUMPING SYSTEMS The present invention relates to a vacuum pumping system (10) which comprises: a vacuum pumping mechanism (12) and a motor (14) for driving the vacuum pumping mechanism. Means (16) are provided for determining a cumulative load on the vacuum ... | 04/07/2011 |
