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| Application No. | Application Title | Issue Date |
| 20120103951 | CONTROL APPARATUS AND LASER PROCESSING MACHINE A control apparatus for controlling a laser processing machine, includes: a HDD as data storing means for storing shape data on a shape of a processed part to which laser processing of the laser processing machine is applied and data on a processing condition of the las... | 05/03/2012 |
| 20120083916 | DISPLACEMENT CALCULATION METHOD, DRAWING DATA CORRECTION METHOD, SUBSTRATE MANUFACTURING METHOD, AND DRAWING APPARATUS Correction values (ΔX1 to ΔX4) at the X position (X=xe) of a target point (E (xe, ye)) are calculated by calculating the amounts of shift (ΔX) in the positions of alignment marks (M11 to M14, M21 to M24, M31 to M34,... | 04/05/2012 |
| 20120034360 | Compact Appliance For Making Flat Edibles A compact apparatus for automatically making a plurality of flat edibles includes a storage and dispensing unit that makes it unnecessary for a user to pre-measure ingredients. The apparatus also includes a mixing and kneading unit for making dough of optimal consistenc... | 02/09/2012 |
| 20110282477 | ENDPOINT CONTROL OF MULTIPLE SUBSTRATES WITH MULTIPLE ZONES ON THE SAME PLATEN IN CHEMICAL MECHANICAL POLISHING A plurality of substrates are polished simultaneously on the same polishing pad. A sequence of spectra is measured from each zone of each substrate, and for each measured spectrum in the sequence of spectra for each zone of each substrate, a best matching reference spec... | 11/17/2011 |
| 20110264256 | PROCESS CONTROL METHOD AND PROCESS CONTROL SYSTEM A process control method is provided for controlling a tool which processes a deposition process on a plurality of wafers for a process time. The process control method comprises receiving a quantity of the wafers and calculating a deposition compensation time necessary... | 10/27/2011 |
| 20110231000 | POWER MONITORING DEVICE, POWER MONITORING METHOD, AND DEVICE FOR MOUNTING COMPONENT A power monitoring device is configured to monitor power consumed in a device for mounting component, which constitutes a component mounting line. The power monitoring device includes: an operation information collecting section configured to collect in time-series oper... | 09/22/2011 |
| 20110230999 | Fast Freeform Source and Mask Co-Optimization Method The present invention relates to lithographic apparatuses and processes, and more particularly to tools for optimizing illumination sources and masks for use in lithographic apparatuses and processes. According to certain aspects, the present invention significantly spe... | 09/22/2011 |
| 20110224818 | SUBSTRATE PROCESSING APPARATUS, METHOD FOR MODIFYING SUBSTRATE PROCESSING CONDITIONS AND STORAGE MEDIUM A substrate processing apparatus includes a setting unit for setting substrate processing conditions for a substrate in a substrate processing unit for performing a process on the substrate; a detection unit for detecting an abnormality of the substrate processing unit ... | 09/15/2011 |
| 20110190918 | Automated Logistics Support System Incorporating a Product Integrity Analysis System A computer implemented system includes an integrated logistics support system and a product integrity analysis system that utilize an integrated database. The product integrity analysis system includes a failure mode effects and criticality analysis (FMECA) application ... | 08/04/2011 |
| 20110183295 | METHOD AND SYSTEM FOR PROVIDING AUTOMATED HIGH SCALE FABRICATION OF CUSTOM ITEMS Method and system for providing volume manufacturing of customizable items including receiving a data package including a plurality of manufacturing parameters, each of the plurality of manufacturing parameters associated with a unique item, verifying the received data ... | 07/28/2011 |
| 20110160891 | Systems For Generating Representations of Flatness Defects on Wafers Systems and computer-readable media having computer-executable components are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of... | 06/30/2011 |
| 20110160890 | Methods For Generating Representations of Flatness Defects on Wafers Methods are disclosed for generating a representation of flatness defects on a wafer. Data is received describing the thickness of the wafer at a plurality of points on a wafer divided into a plurality of sites. A reference plane is defined for each of the plurality of ... | 06/30/2011 |
| 20110160892 | METHOD FOR COLOR MATCHING The invention relates to a method for matching the color of a dry color shade standard, said method comprising the steps of A) Measuring the dry color shade standard, B) Calculating a recipe for the dry color shade standard, C) Generating a virtual wet color shade stand... | 06/30/2011 |
| 20110137445 | TUNING ORDER CONFIGURATOR PERFORMANCE BY DYNAMIC INTEGRATION OF MANUFACTURING AND FIELD FEEDBACK A novel and non-obvious method, system and apparatus for tuning order configurator performance by dynamic integration of manufacturing and field feedback information. A method for dynamically tuning order configurator behavior by using product issue data can include col... | 06/09/2011 |
| 20110098838 | SYSTEM AND METHOD FOR CORRECTING SYSTEMATIC PARAMETRIC VARIATIONS ON INTEGRATED CIRCUIT CHIPS IN ORDER TO MINIMIZE CIRCUIT LIMITED YIELD LOSS Disclosed are a system and a method of correcting systematic, design-based, parametric variations on integrated circuit chips to minimize circuit limited yield loss. Processing information and a map of a chip are stored. The processing information can indicate an impact... | 04/28/2011 |
| 20110054658 | Method for Constant Power Density Scaling A method for constant power density scaling in MOSFETs is provided. A method for manufacturing an integrated circuit includes computing fixed scaling factors for a first fabrication process based on a second fabrication process, computing settable scaling factors for th... | 03/03/2011 |
| 20110029345 | Managing Planning of Component Requirements Component planning for a product manufacturing enterprise having a central computer device and respective local manufacturing computer devices. A BOM for product types manufactured at the multiple manufacturing plants is maintained in the central computer device, defini... | 02/03/2011 |
| 20110029119 | Process and Method for a Decoupled Multi-Parameter Run-to-Run Controller A manufacturing process including a controller method to generate a tool setting which includes a tool offset and a device offset. The controller method uses a device parameter measurement to update the tool offset and device offset. A tool weight and a device weight is... | 02/03/2011 |
| 20110029118 | METHOD AND APPARATUS FOR MODELING CHEMICALLY AMPLIFIED RESISTS Some embodiments provide a system for accurately and efficiently modeling chemically amplified resist. During operation, the system can determine a quenched acid profile from an initial acid profile by applying multiple quenching models which are associated with differe... | 02/03/2011 |
| 20110009996 | PERVASIVE MODEL ADAPTATION: THE INTEGRATION OF PLANNING AND INFORMATION GATHERING IN DYNAMIC PRODUCTION SYSTEMS A computer-based method and system for pervasive model adaptation are provided. The method includes providing a production plan to a production system, executing the production plan in the production system, collecting observation data produced by at least one sensor in... | 01/13/2011 |
| 20100332008 | Activity Based Real-Time Production Instruction Adaptation A manufacturing process for automatically delivering an appropriate level of instructions to a manufacturing operator on demand based on the manufacturing operator's level of activity and performance, the particular characteristics of the product being manufactured, and... | 12/30/2010 |
| 20100318934 | METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONTROL SYSTEM Example methods and apparatus to predict process quality in a process control system are disclosed. A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured v... | 12/16/2010 |
| 20100314029 | USER-FACILITATED MATERIAL REMOVAL IN COMPOSITE STRUCTURES A method of removing an out-of-tolerance area in a composite structure comprises determining the location of the out-of-tolerance area and selecting a volume of the composite structure to be removed based on the location of the out-of-tolerance area. The method may furt... | 12/16/2010 |
| 20100312372 | SYSTEM AND METHOD FOR PLANNING GLOBAL LOGISTICS IN TFT-LCD MANUFACTURING INDUSTRY A system and a method of planning global logistics for a TFT-LCD manufacturing industry are provided. The system includes an input module and an industry characteristic planning module with a front-end process transformation module and a back-end transportation allocati... | 12/09/2010 |
| 20100305737 | TUNING A PROCESS CONTROLLER BASED ON A DYNAMIC SAMPLING RATE A method for estimating a state of a process implemented by a tool for fabricating workpieces includes collecting metrology data associated with a subset of workpieces processed in the tool. The collecting exhibits an irregular pattern. Metrology data associated with a ... | 12/02/2010 |
| 20100305738 | SYSTEMS AND METHODS FOR CONTROLLING REGISTRATION OF ADVANCING SUBSTRATES IN ABSORBENT ARTICLE CONVERTING LINES The present disclosure relates to systems and processes for controlling the registration of advancing substrates in absorbent article converting lines. The systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and outp... | 12/02/2010 |
| 20100292824 | SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT") ADVANCED PROCESS CONTROL ("APC") WITH NOVEL SAMPLING POLICY AND ARCHITECTURE System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing a key process on a sample number of wafers of a lot of wafers; performing a key inline measurement... | 11/18/2010 |
| 20100274612 | UTILIZING SUSTAINABILITY FACTORS FOR PRODUCT OPTIMIZATION An industrial control system is provided. The system includes a processor to analyze one or more sustainability factors and a scoring component to assign a weight to the sustainability factors. An optimizer automatically adjusts a production process in view of the susta... | 10/28/2010 |
| 20100275147 | INDUSTRIAL ENERGY DEMAND MANAGEMENT AND SERVICES The innovation relates to systems and/or methodologies for facilitating industrial energy demand management and services. A demand management and services component obtains one or more utilization data elements via a communication network. The utilization data elements ... | 10/28/2010 |
| 20100274378 | TEST METHOD AND TEST APPARATUS FOR CHECKING THE FUNCTION OF A PAINTING DEVICE The disclosure relates to a test method for functional testing of a painting device, comprising: connecting a test device to the painting device, capturing at least one process parameter of the painting device, and checking of a functionality of the painting device by t... | 10/28/2010 |
| 20100241250 | Feedback and feedforward control of a semiconductor process without output values from upstream processes The present invention discloses a feedback and feedforward process control system, comprising the steps:
| 09/23/2010 |
| 20100241264 | SYSTEM AND METHOD FOR MANUFACTURING AN IN-PROCESS PART A method and system for manufacturing an in-process part is provided. The method includes manufacturing one or more primary features of the in-process part. The method also includes measuring multiple locations and attributes of the manufactured in-process part includin... | 09/23/2010 |
| 20100234976 | METHOD TO IMPROVE REQUIREMENTS, DESIGN MANUFACTURING, AND TRANSPORTATION IN MASS MANUFACTURING INDUSTRIES THROUGH ANALYSIS OF DEFECT DATA A computer-implemented method of optimizing at least one of a design, production and testing process in a mass manufacturing process includes steps of: collecting error data relating to a product; classifying the error data into categories of symptoms; mapping the sympt... | 09/16/2010 |
| 20100234970 | METHOD AND APPARATUS FOR ADVANCED PROCESS CONTROL A method includes: initializing first and second variables; operating equipment based on the variables; measuring first and second parameters; determining a new value for the first variable based on the first parameter, and calculating a new value for the second variabl... | 09/16/2010 |
| 20100234975 | ADVANCED PROCESS CONTROL FOR GATE PROFILE CONTROL A method for fabricating a integrated circuit with improved performance is disclosed. The method comprises providing a substrate; performing a plurality of processes to form a gate stack over the substrate, wherein the gate stack comprises a gate layer; measuring a grai... | 09/16/2010 |
| 20100228688 | OPTICAL DETERMINATION AND REPORTING OF GAS PROPERTIES A chemical composition analyzer may be used to optically determine and report chemical compositions associated with gases within a gas collection and transmission infrastructure. This analyzer includes a number of optical sensors which may be used to perform spectroscop... | 09/09/2010 |
| 20100191361 | Controlling a Manufacturing Process with a Multivariate Model A method, controller, and system for controlling a manufacturing process (batch-type or continuous-type) with a multivariate model are described. Dependent variable data and manipulated variable data are received. Dependent variable data represents values of uncontrolle... | 07/29/2010 |
| 20100185313 | PATTERN DATA CREATING METHOD, COMPUTER PROGRAM PRODUCT, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD A pattern data creating method comprising: referring to a first correspondence relation between an amount of dimension variation between a first pattern formed on a substrate and a second pattern formed by processing the substrate using the first pattern and either one ... | 07/22/2010 |
| 20100174393 | PHOTOMASK WITH DETECTOR FOR OPTIMIZING AN INTEGRATED CIRUCIT PRODUCTION PROCESS AND METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT USING THE SAME A photomask for integrated circuit production comprising a substrate, one or more layers and a detector for monitoring a process parameter of the integrated circuit production in combination with one or more of the following: communication circuitry for communicating wi... | 07/08/2010 |
| 20100168897 | Control Component and Method for an Energy Management Unit in an Industrial Automation Arrangement A control component and method for an energy management unit (EM) in an industrial automation arrangement which is configured to control one of a process, a subprocess and a system part of the industrial automation arrangement. Here, the control component is configured ... | 07/01/2010 |
