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Class 438/268 - Vertical channel


Subclass of Class 438 - Semiconductor device manufacturing: process
Definition: Process for making a insulated gate field effect transistor
No. of applications: 401
Last issue date: 05/24/2012


1                      
Application No.Application TitleIssue Date
20120126312VERTICAL DMOS-FIELD EFFECT TRANSISTOR
A vertical diffused metal oxide semiconductor (DMOS) field-effect transistors (FET), has a cell structure with a substrate; an epitaxial layer or well of the first conductivity type on the substrate; first and second base regions of the second conductivity type arranged...
05/24/2012
20120126314VERTICAL DMOS-FIELD EFFECT TRANSISTOR
A vertical diffused metal oxide semiconductor (DMOS) field-effect transistors (FET) comprises a substrate of a first conductivity type forming a drain region; an epitaxial layer of the first conductivity type on said substrate; first and second base regions of the secon...
05/24/2012
20120129305METHOD FOR MANUFACTURING A MOS-FIELD EFFECT TRANSISTOR
A method for manufacturing a Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET) has the step of implanting a base region of said MOSFET within an epitaxial layer of a semiconductor chip comprising an insulated gate structure used as a masking element, wherein th...
05/24/2012
20120126313ULTRA THIN DIE TO IMPROVE SERIES RESISTANCE OF A FET
A method for producing a power field effect transistor (FET) device having a low series resistance between the drain and source when switched on has the steps of: forming a vertical power FET in a semiconductor die; and back-grinding the semiconductor die to a thickness...
05/24/2012
20120068231VERTICAL DISCRETE DEVICES WITH TRENCH CONTACTS AND ASSOCIATED METHODS OF MANUFACTURING
The present technology is related generally to vertical discrete devices with a trench at the topside of the vertical discrete devices. The trench is filled with a conducting material. In this approach, a drain or cathode of the vertical discrete devices is electrically...
03/22/2012
20120052640Methods Of Forming Pluralities Of Vertical Transistors, And Methods Of Forming Memory Arrays
Some embodiments include methods of forming vertical transistors. A construction may have a plurality of spaced apart fins extending upwardly from a semiconductor substrate. Each of the fins may have vertical transistor pillars, and each of the vertical transistor pilla...
03/01/2012
20120049267SEMICONDUCTOR DEVICES AND METHOD OF MANUFACTURING THE SAME
A semiconductor device includes a pipe channel layer formed over a substrate, a first vertical channel layer formed over the pipe channel layer to couple the pipe channel layer to a bit line, a second vertical channel layer formed over the pipe channel layer to couple t...
03/01/2012
20120049264NAND Memory Constructions and Methods of Forming NAND Memory Constructions
Some embodiments include NAND memory constructions. The constructions may contain semiconductor material pillars extending upwardly between dielectric regions, with individual pillars having a pair of opposing vertically-extending sides along a cross-section. First cond...
03/01/2012
20120032227LOW VOLTAGE TUNNEL FIELD-EFFECT TRANSISTOR (TFET) AND METHOD OF MAKING SAME
A low voltage tunnel field effect transistor includes a p-n tunnel junction, a gate-dielectric, a gate, a source-contact, and a drain-contact. The p-n tunnel junction includes a depletion region interfacing together a source-layer and a drain-layer. The depletion region...
02/09/2012
20120025307METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
According to one embodiment, a method is disclosed for manufacturing a semiconductor device. The method can include simultaneously forming a first field insulating film and at least one second field insulating film on a front face side of a semiconductor layer. The at l...
02/02/2012
20120021574METHOD FOR FABRICATING VERTICAL CHANNEL TYPE NONVOLATILE MEMORY DEVICE
A method for fabricating a vertical channel type nonvolatile memory device includes: stacking a plurality of interlayer insulating layers and a plurality of gate electrode conductive layers alternately over a substrate; etching the interlayer insulating layers and the g...
01/26/2012
20120018856Semiconductor Device With Drift Regions and Compensation Regions
Disclosed is a method of forming a semiconductor device with drift regions of a first doping type and compensation regions of a second doping type, and a semiconductor device with drift regions of a first doping type and compensation regions of a second doping type....
01/26/2012
20120018799SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
A semiconductor device and a method for manufacturing the same are provided. The method includes forming a cell structure where a storage node contact is coupled to a silicon layer formed over a gate, thereby simplifying the manufacturing process of the device. The semi...
01/26/2012
20120018805SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
According to embodiments, a semiconductor device includes a semiconductor substrate and an element isolation insulating film which isolates a element formation region in a surface portion of the semiconductor substrate. A depletion-type channel region of a first conduct...
01/26/2012
20120018798Method for Protecting a Semiconductor Device Against Degradation, a Semiconductor Device Protected Against Hot Charge Carriers and a Manufacturing Method Therefor
A method for protecting a semiconductor device against degradation of its electrical characteristics is provided. The method includes providing a semiconductor device having a first semiconductor region and a charged dielectric layer which form a dielectric-semiconducto...
01/26/2012
20120018740SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD THEREFOR
A semiconductor device 100 includes: a body region 105 of a first conductivity type placed on a principal surface of a substrate 101; a silicon carbide layer 102 including a drift region 107 of a second conductivity type; a channel lay...
01/26/2012
20120012923SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
The present invention relates to a semiconductor device and a method for forming the same. The semiconductor device includes: a vertical pillar protruded from a semiconductor substrate; a first junction region provided at an upper part of the vertical pillar; a second j...
01/19/2012
20120012930SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
According to one embodiment, a semiconductor device includes a semiconductor substrate, and first and second transistors. The substrate has a first conductivity type. The first and second transistors are provided on the substrate. The first and second transistors each i...
01/19/2012
20120009747Methods of Manufacturing Nonvolatile Memory Devices
Nonvolatile memory devices and methods of manufacturing nonvolatile memory devices are provided. The method includes patterning a bulk substrate to form an active pillar; forming a charge storage layer on a side surface of active pillar; and forming a plurality of gates...
01/12/2012
20120007169SEMICONDUCTOR DEVICE AND ITS PRODUCTION METHOD
The present invention provides a semiconductor device including:a semiconductor substrate of a first conductive type; a first well region of the first conductive type formed in the semiconductor substrate; an epitaxial region of a second conductive type formed in the se...
01/12/2012
20120009746METHODS OF FORMING A SEMICONDUCTOR DEVICE
A semiconductor device and associated methods, the semiconductor device including a semiconductor substrate with a first well region, a first gate electrode disposed on the first well region, and a first N-type capping pattern, a first P-type capping pattern, and a firs...
01/12/2012
20120001257SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
A downsized semiconductor device having an excellent reverse characteristic, and a method of manufacturing the semiconductor device is sought to improve. The semiconductor device comprises a semiconductor body having a polygonal contour. An active area is formed in the ...
01/05/2012
20110318893METHODS FOR FORMING SEMICONDUCTOR DEVICE STRUCTURES
The benefits of strained semiconductors are combined with silicon-on-insulator approaches to substrate and device fabrication....
12/29/2011
20110315960TUNNEL FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING SAME
A TFET includes a source region (110, 210), a drain region (120, 220), a channel region (130, 230) between the source region and the drain region, and a gate region (140, 240) adjacent to the channel region. The source region contains a first...
12/29/2011
20110312137Vertical Power MOSFET and IGBT Fabrication Process with Two Fewer Photomasks
A process for fabrication of a power semiconductor device is disclosed in which a single photomask is used to define each of p-conductivity well regions and n-conductivity type source regions. In the process a single photomask is deposited on a layer of polysilicon on a...
12/22/2011
20110303973SEMICONDUCTOR DEVICE AND PRODUCTION METHOD
The semiconductor device according to the present invention is an nMOS SGT and is composed of a first n+ type silicon layer, a first gate electrode containing metal and a second n+ type silicon layer arranged on the surface of a first columnar silicon layer positioned v...
12/15/2011
20110303976HIGH VOLTAGE CHANNEL DIODE
A channel diode structure having a drift region and method of forming. A charge balanced channel diode structure having an electrode shield and method of forming....
12/15/2011
20110303972SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
A semiconductor device manufacturing method of an embodiment includes the steps of: forming a first insulating layer on a semiconductor substrate; forming on the first insulating layer an amorphous or polycrystalline semiconductor layer having a narrow portion; forming ...
12/15/2011
20110298027SEMICONDUCTOR DEVICE
It is an object to provide a semiconductor device with a novel structure in which stored data can be held even when power is not supplied and there is no limitation on the number of writings. A semiconductor device includes a second transistor and a capacitor provided o...
12/08/2011
20110300679PROCESS OF FORMING AN ELECTRONIC DEVICE INCLUDING A TRENCH AND A CONDUCTIVE STRUCTURE THEREIN
A process of forming an electronic device can include providing a workpiece comprising a substrate, including an underlying doped region, and a semiconductor portion overlying the underlying doped region, wherein the semiconductor portion has a primary surface spaced ap...
12/08/2011
20110291182SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
A semiconductor device and a method for forming the same are disclosed. The semiconductor device includes vertical pillars formed by etching a semiconductor substrate and junction regions which are located among the neighboring vertical pillars and spaced apart from one...
12/01/2011
20110294272SEMICONDUCTOR DEVICE PRODUCTION METHOD
This semiconductor device includes a first device and a second device provided on a semiconductor substrate and having different breakdown voltages. More specifically, the semiconductor device includes a semiconductor substrate, a first region defined on the semiconduct...
12/01/2011
20110291178SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
According to one embodiment, a semiconductor device includes a substrate, a lower gate layer, a stacked body, a dummy electrode layer, an insulating film, and a channel body. The lower gate layer is provided above the substrate. The stacked body includes a plurality of ...
12/01/2011
20110291177NONVOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
A nonvolatile memory device includes a pipe insulation layer having a pipe channel hole, a pipe gate disposed over the pipe insulation layer, a pair of cell strings each having a columnar cell channel, and a pipe channel coupling the columnar cell channels and surroundi...
12/01/2011
20110291181SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
According to one embodiment, a semiconductor device including a cell region and a terminal region includes a first semiconductor region of a first conductivity type, semiconductor pillars of the first and a second conductivity type, a second semiconductor region of the ...
12/01/2011
20110284948SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME
A semiconductor device and a fabrication method for the semiconductor device are provided in which an increase of a forward loss is suppressed and a reverse recovery loss is reduced.

A semiconductor device may include a semiconductor substr...

11/24/2011
20110284949VERTICAL TRANSISTOR AND A METHOD OF FABRICATING THE SAME
A vertical transistor and a method of fabricating the vertical transistor are provided. The vertical transistor has a substrate, a first electrode formed on the substrate, a first insulation layer formed on the first electrode, with a portion of the first electrode expo...
11/24/2011
20110281411METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
An amorphous silicon layer and a single crystal silicon layer are formed in an upper portion of a silicon pillar. Then, by performing the selective epitaxial growth method twice, an amorphous silicon layer and an amorphous silicon germanium layer are formed in this orde...
11/17/2011
20110263088POLY-SI THIN FILM TRANSISTOR AND ORGANIC LIGHT-EMITTING DISPLAY HAVING THE SAME
A thin film transistor comprises an Si-based channel having a nonlinear electron-moving path, a source and a drain disposed at both sides of the channel, a gate disposed above the channel, an insulator interposed between the channel and the gate, and a substrate support...
10/27/2011
20110241104INTEGRATED CIRCUIT DEVICE AND METHOD FOR ITS PRODUCTION
An integrated circuit device includes a semiconductor body fitted with a first electrode and a second electrode on opposite surfaces. A control electrode on an insulating layer controls channel regions of body zones for a current flow between the two electrodes. A drift...
10/06/2011
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