Did You Know...
...that the inventor of the electric motor was a blacksmith named Thomas Davenport? Described as "a brilliantly unsuccessful inventor", Davenport invented the first rotary electric motor. In 1836 he headed out -- on foot -- from his Vermont home to file a patent application at the Patent Office in Washington, D.C. By the time he got there, he had squandered away his money and couldn't afford the $30 filing fee so he turned around and went home. When he later mailed in his application with money he'd raised, the Patent office was destroyed in a fire. He did finally get credit for his invention on Feb. 5, 1837.
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| Application No. | Application Title | Issue Date |
| 20090262895 | X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position An X-ray diffractometer (1; 24; 30) has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source (2) and detector (3; 31) are respectively disposed, at the same time and in a correlated fashion, wherei... | 10/22/2009 |
| 20090216373 | Mobile Device for Irradiation and Detection of Radiation A mobile equipment endowed with a neutrons source possibly in combination with other radiation sources including a robot system that, moving on a controlled trajectory, realize the conditions to observe from different positions the radiation emerging from a specimen eit... | 08/27/2009 |
| 20090010388 | MICROPLATE AND METHODS OF USING THE SAME Microplates having a body defining a plurality of wells, wherein the wells have at least one bottom portion configured to allow the sample to be analyzed by various methods in situ with minimized background interference in the data obtained, and methods of using the sam... | 01/08/2009 |
| 20080273662 | CD-GISAXS System and Method CD-GISAXS achieves reduced measurement times by increasing throughput using longer wavelength radiation (˜12×, for example) such as x-rays in reflective geometry to increase both the collimation acceptance angle of the incident beams and the scattering signal strength... | 11/06/2008 |
| 20080165929 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of... | 07/10/2008 |
| 20080043923 | Micro beam collimator for high resolution XRD investigations with conventional diffractometers A micro collimator for compressing X-ray beams for use in a X-ray diffractometer is described, wherein said collimator has a channel means for providing a channel guiding said X-ray beams, said channel having a channel entrance portion and a channel exit portion. The ob... | 02/21/2008 |
| 20070286344 | Target alignment for x-ray scattering measurements A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on a structure in the sample such that the X-rays are scattered from the structure in a pattern of stripes, and receiving the scattered X-rays using an array of detectors. A relative ... | 12/13/2007 |
| 20060245544 | Methods of transmission mode x-ray diffraction analysis and apparatuses therefor Methods for transmission mode X-ray diffraction analysis of a sample by means of apparatuses comprising an X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted by ... | 11/02/2006 |
| 20060088139 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray irradi... | 04/27/2006 |
| 20050141667 | Diffractometer and method for diffraction analysis Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis,... | 06/30/2005 |
| 20050098737 | Devices and methods for detecting the position of a beam A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising:
| |
| 20050084066 | X-ray diffractometer and method of correcting measurement position thereof Disclosed is an X-ray diffractometer that precisely analyzes a micro-crystal structure of a specimen by exactly measuring the distance between the specimen and a detector, and the position of the detector and a method of correcting a measurement position of the detector... | 04/21/2005 |
| 20050041778 | Micro-diffraction system and method of analyzing sample using the same A micro-diffraction system and a method of analyzing a sample using the same are provided. The micro-diffraction system includes an X-ray source, a slit turning an X-ray emitted from the X-ray source into a micro X-ray having a micro-sized spot, a stage on which a sampl... | 02/24/2005 |
