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Patent No. 5356330

Apparatus for Simulating a High Five

A self-righting hand-arm configuration which is adapted to pivot when struck by a user, thereby simulating a "high five."

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Class 378/58 - Flaw analysis


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter including detection and location of a structural
No. of applications: 35
Last issue date: 02/23/2012


Application No.Application TitleIssue Date
20120045032METHOD FOR FILMLESS RADIOGRAPHOC INSPECTION OF COMPONENTS
With filmless radiographic inspection of components by means of digital X-ray technology, an uneven surface geometry of the component is smoothened by defining a digital virtual smoothening layer for better, preferably automated, recognition of defects, where the digita...
02/23/2012
20120033788System for Non-Destructively Examining Degradation of an Interior of a Device
A system and method for monitoring degradation of a device having a metal layer and a composite layer, such as a vehicle-mounted boom arm. The system can include a collar mounted on an outer surface of the device, a radiography device movably coupled to the collar, and ...
02/09/2012
20120033787METHOD FOR RADIOGRAPHIC INSPECTION OF COMPONENTS
During the radiographic inspection of components by X-rays for better detection of defects, preferably automated, an uneven surface topography (2) of the component (1) is covered with a smoothening layer (8) made of a material whose volume-specific ...
02/09/2012
20110274243Positioning Device For Analyzing A Double Seam Cross-Section And The Double Seam Pleat Formation Using X-Rays
A positioning device for the examination of a double seam cross section and wrinkle formation by X-rays comprising an X-ray source with a first stop associated with the latter for a can to be examined in the area of the exit opening for the X-rays and detectors for rece...
11/10/2011
20110185868Exact Weight Cutting System for Food Products
A system for cutting blocks of food product into bars of substantially equal weight. The system includes a cutter conveyor configured to receive incoming blocks of food product and move the blocks along an in-line processing path in a plane for cutting; a programmable l...
08/04/2011
20110182405NON-DESTRUCTIVE DETECTION METHOD FOR DETECTING STATE OF SOLDER BALL
A detection method detects cracks with small thickness and solder voids with small volume in a solder ball. The method immerses a washed solder ball into a high absorption material solution for a first predetermined time period. The immersed solder ball is then dried in...
07/28/2011
20110176661X-RAY SENSITIVE BATTERY SEPARATORS AND RELATED METHODS
The instant application relates to an X-ray sensitive battery separator for a secondary lithium battery and a method for detecting the position of a separator in a secondary lithium battery. The X-ray sensitive battery separator includes a microporous membrane having an...
07/21/2011
20110170654NUCLEAR FUEL PELLET INSPECTION
A system for inspecting nuclear fuel pellets is provided. The inspection system is configured to use X-ray radiation at one or more energies to probe nuclear fuel pellets disposed within a nuclear fuel rod for nuclear fuel pellet defects. In some implementations of the ...
07/14/2011
20110096902HEATING APPARATUS FOR X-RAY INSPECTION
In a heating apparatus for X-ray inspection which heats at least one surface of a sample (7) by convection to perform an X-ray inspection, a planar heater 1 formed of an X-ray transmitting material having an opening 1b for passing gas is prov...
04/28/2011
20110069811METHOD FOR SCANNING THE INTERNAL QUALITY OF WOODEN ELEMENTS HAVING A MAIN DIRECTION OF EXTENSION, SUCH AS LOGS OR PLANKS
A method for scanning the internal quality of wooden elements (1) such as logs or planks comprises the operating steps of irradiating the wooden element (1) with at least one beam (3) of electromagnetic radiation according to one or more directions ...
03/24/2011
20110058651DEVICE AND METHOD FOR X-RAY EXAMINATION OF AN OBJECT FOR MATERIAL DEFECTS BY MEANS OF X-RAYS
In a device and a method for testing an object for material defects, a multi-emitter x-ray source, at least one x-ray detector and a control system to activate emitters of the multi-emitter x-ray source are thereby used. A selective activation of individual emitters or ...
03/10/2011
20110019796METHOD AND SYSTEM FOR THE AUTOMATED TESTING AND/OR MEASURING OF A PLURALITY OF SUBSTANTIALLY IDENTICAL COMPONENTS USING X-RAY RADIATION
A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a convey...
01/27/2011
20100329532X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
An X-ray inspecting apparatus capable of high-speed inspection of a prescribed inspection area of an object of inspection is provided. The X-ray inspecting apparatus includes: a scanning X-ray source for outputting X-ray; an X-ray detector driving unit on which a plural...
12/30/2010
20100316187X-Ray inspection device and X-Ray inspection method
In order to prevent misdetection and erroneous detection by clearly determining only a contrast caused by a foreign matter, there are provided an X-ray inspection method and an X-ray inspection device including: an X-ray tube (11) for irradiating a measurement sa...
12/16/2010
20100294747X-RAY MICROSCOPY FOR CHARACTERIZING HOLE SHAPE AND DIMENSIONS IN SURGICAL NEEDLES
A novel method of characterizing laser drilled boreholes is disclosed. The method uses x-ray microscopy for dimensional characterization. The x-ray output may be processed to control manufacturing equipment in automated production systems, including laser drilling syste...
11/25/2010
20100290589X-RAY INSPECTION DEVICE
An X-ray inspection device is adapted to detect foreign matter in a target object while the target object is conveyed. The X-ray inspection device includes an X-ray emission device, a scintillator unit, a slit member and a photodiode array. The scintillator unit extends...
11/18/2010
20100233594SYSTEM AND METHOD FOR QUALITY ASSURANCE FOR RETICLES USED IN MANUFACTURING OF INTEGRATED CIRCUITS
System and method for quality assurance for reticles used in manufacturing of integrated circuits. According to an embodiment, the present invention provides a method for inspecting one or more blanks For example, the blanks are prepared to be used as reticles for manuf...
09/16/2010
20100166264APPARATUS AND METHOD FOR ANALYSING A SECURITY DOCUMENT
We provide an apparatus and method for analysing a security document. An x-ray source is adapted to illuminate at least one inspection region of the security document when located at an inspection position. An x-ray detector adapted to receive x-rays from the at least o...
07/01/2010
20100135459X-RAY INSPECTION DEVICE AND PRODUCTION SYSTEM
An X-ray inspection device includes a conveying unit, an identification part, and an operation control part. The X-ray inspection device irradiates articles with X-rays while the article is being conveyed, and the article is inspected. The conveying unit is configured a...
06/03/2010
20100057380X-RAY INSPECTION APPARATUS
An X-ray inspection apparatus includes a storage device, a setting device, a determining device, a calculating device and a display control device. The setting device is configured to set a hypothetical reference value that is different from an actual reference value th...
03/04/2010
20100054397METHOD AND ARRANGEMENT FOR IMPROVING TOMOGRAPHIC DETERMINATIONS, PARTICULARLY SUITABLE FOR INSPECTION OF STEEL REINFORCEMENT BARS IN CONCRETE STRUCTURES
A method and arrangement for improving tomographic determinations by means of radiation, specially suitable for steel bars in concrete. The method comprising irradiating said body with penetrating radiation, recording said radiation transmitted through said body in reco...
03/04/2010
20090268869X-Ray Inspection System and Method
The invention provides an automatic system and method using x-ray inspection to image arrays of electrical interconnections on electronic devices. The electron beam of a rotating anode X-ray tube is deflected relative to the anode to cause emission of x-rays from differ...
10/29/2009
20090147914Device for destruction-free inspection of a conveyor belt
The invention relates to a device for destruction-free inspection of a conveyor belt (1) made of elastomer material, having a carrying side for the goods to be conveyed, and a running side, as well as having an embedded strength support, whereby the conveyor belt...
06/11/2009
20080226028Method and apparatus for automated, digital, radiographic inspection of aerospace parts
A system and method for automatic digital radiographic inspection of round aerospace parts (18) and irregularly shaped aerospace parts (19) includes a radiation source (14) and a radiation detector (16) located on opposite sides of the aerosp...
09/18/2008
20080205596Method for Inspecting Ceramic Structures
There is provided a nondestructive method for inspecting ceramic structures, the method which not only easily detects the position and size of an internal defect in a ceramic structure in a short time, but also accurately identifies the position, shape, and size of the ...
08/28/2008
20080159477SYSTEM AND METHOD FOR RADIOGRAPHIC INSPECTION WITHOUT A-PRIORI INFORMATION OF INSPECTED OBJECT
A method of radiographic inspection of an object includes the steps of: providing a radiation source and a radiation detector located on opposite sides of the object; positioning the radiation detector to receive radiation transmitted through the object from the radiati...
07/03/2008
20070195927METHOD AND APPARATUS FOR INSPECTING CIRCUIT BOARDS
An apparatus and method for inspecting a sample is described. The apparatus can have an X-ray source and detector, a housing, an access aperture in the housing, an access door covering the access aperture, and a stage positionable to extend through the access aperture t...
08/23/2007
20070133745Systems and Methods for Non-Instrusive Inspections of High-Voltage Circuit Breakers
Systems and methods are disclosed for non-intrusively inspecting circuit breakers, which may include one or more connector assemblies. An X-ray unit may be placed at a first location around the circuit breaker while at least one digital imaging plate may be placed at a ...
06/14/2007
20070104315Printed circuit board inspection system combining x-ray inspection and visual inspection
A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit (3) that lands an inspected object (1) safely thereon and transfers the inspected object (1) to a predetermined position; a light gener...
05/10/2007
20070076845Methodologies for non-destructive quantification of thermal barrier coating temperatures on service run parts
Methodologies for non-destructively inspecting and characterizing micro-structural features in a thermal barrier coating (TBC) on a component, wherein the micro-structural features define pores and cracks, if any, in the TBC. The micro-structural features having charact...
04/05/2007
20060245542Method for automatic defect recognition in testpieces by means of an X-ray examination unit
The invention relates to a method for automatic defect recognition in testpieces by means of an X-ray examination unit with an X-ray tube, a detector and a mechanical manipulator for positioning the testpiece in the beam path of the X-ray examination unit, wherein a pos...
11/02/2006
20060002510Inspection method and system for and method of producing component mounting substrate
On a production line for component mounting substrate, mutually communicating inspection apparatus are each provided to a different one of production processes that are carried out sequentially such as the solder printing, component mounting and soldering processes. Eac...
01/05/2006
20050195940Method and apparatus for void content measurement and method and apparatus for particle content measurement
A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes...
09/08/2005
20050105682Highly constrained tomography for automated inspection of area arrays
A tomographic reconstruction method and system incorporating Bayesian estimation techniques to inspect and classify regions of imaged objects, especially objects of the type typically found in linear, areal, or 3-dimensional arrays. The method and system requires a high...
05/19/2005
20050074088X-ray inspection apparatus and X-ray inspection method
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting th...
04/07/2005
 
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