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Class 359/373 - Side-by-side fields


Subclass of Class 359 - Optical: systems and elements
Definition: Subject matter wherein at least two of the separate paths
No. of applications: 7
Last issue date: 07/29/2010


Application No.Application TitleIssue Date
20100188739Tomographic Light Field Microscope
An optical tomography system includes a light field microscope including an objective lens, a computer-controlled light source, a condenser lens assembly and a microlens array aligned along an optical axis. A carrier containing a specimen is coupled to a rotational driv...
07/29/2010
20090180177Comparison Optical System
A comparison optical system (1) comprising several image-acquiring optical subsystems is disclosed. A bridge (3) mechanically and optically connects the optical subsystems to one another. Each of the image-acquiring optical subsystems possesses an XYZ stag...
07/16/2009
20090174936MICROSCOPE ARRAY FOR MULTANEOUSLY IMAGING MULTIPLE OBJECTS
A microscope array for simultaneously imaging multiple objects. A preferred embodiment of a method according to the invention includes arranging the objects into an array, providing a microscope array having a plurality of imaging elements with respective fields of view...
07/09/2009
20080037113STEREOMICROSCOPE
A stereomicroscope includes a microscope main body and a camera for assistant. The microscope main body includes therein an objective optical system, a zoom optical system and an eyepiece optical system. The camera for assistant is detachably mounted to the microscope m...
02/14/2008
20070153371DISPLAY DEVICE, METHOD OF MANUFACTURING THE SAME, AND COMPOSITION FOR USE IN MANUFACTURING THE SAME
A display device includes an insulating substrate, barriers surrounding predetermined regions on the insulating substrate, wherein ink composition is supplied in the predetermined regions, the ink composition including a first solvent which remains in a solid state in a...
07/05/2007
20050213096Pattern recognition system
A star pattern recognition system (1) comprises an optical filter arrangement (10) in the form of an array (12) of independently tiltable mirrors (M1), (M2). Light from a distant starfield (2) is incident upon the mirror array (...
09/29/2005
20050128572Jig for microscopic inspection of bulk micro defects in single crystals
A jig for holding a Czochralski grown crystalline sample for optical microscopic inspection is disclosed. The jig can be mounted on another inspection jig typical of the semiconductor industry, or can be mounted directly on the base plate of the optical microscope. Spri...
06/16/2005
 
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