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| Application No. | Application Title | Issue Date |
| 20080037006 | METHODS AND APPARATUS FOR ANALYZING FLUID PROPERTIES OF EMULSIONS USING FLUORESCENCE SPECTROSCOPY This relates to methods and apparatus for analyzing samples by fluorescence spectroscopy. In one embodiment, the methods and apparatus use a fluorescence detection unit (FDU) of a composition fluid analyzer (CFA™) module to detect variations in fluid properties (gradi... | 02/14/2008 |
| 20080037005 | System for measuring a sample with a layer containing a periodic diffracting structure To measure the critical dimensions and other parameters of a one- or two-dimensional diffracting structure of a film, the calculation may be simplified by first performing a measurement of the thickness of the film, employing a film model that does not vary the critical... | 02/14/2008 |
| 20080030716 | Method and apparatus for measuring a position of a particle in a flow Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system ca... | 02/07/2008 |
| 20080030719 | Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography mask A photolithography mask inspection apparatus has at least two sensors. One sensor is configured to sense light transmitted through an object to be inspected, and the other sensor senses light reflected off the object. A first optical system is arranged to expose a first... | 02/07/2008 |
| 20080030718 | Detection method, microchemical system using the detection method, signal detection method, thermal lens spectroscopic system, fluorescence detection system, signal detection apparatus, signal detection system, signal detection program, and storage medium A detection method that can measure a plurality of measured substances in a fluid test sample at the same time, easily perform qualitative analysis and quantitative analysis, and reduce measurement errors between excitation energies of the measured substances, and a mic... | 02/07/2008 |
| 20080030717 | Color Measuring Apparatus Having Differently Operating Measuring Devices An apparatus performs colorimetric measurements of printing materials. The apparatus for the colorimetric measurement of printing materials has two measuring devices operating with different resolutions for registering the surface of the printing material. The two measu... | 02/07/2008 |
| 20080030715 | Best Focus Detection Method, Exposure Method, And Exposure Apparatus An aerial image of a measurement mark (PM) arranged on a measurement mask (Rm) is conformed to a center in an X-axis direction of a slit (122) arranged on a Z tilt stage (38). While illuminating the measurement mark with an illumination light (IL), a slit ... | 02/07/2008 |
| 20080024760 | MEASURING DEVICE FOR INGREDIENT DETECTION A measuring device has a sensor for registering at least one parameter selected from the group consisting of at least one ingredient, at least one property, and both, of a material being investigated by the sensor, the sensor including at least one illumination source w... | 01/31/2008 |
| 20080024768 | Method and apparatus for colour imaging a three-dimensional structure A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition mea... | 01/31/2008 |
| 20080024767 | Imaging optical coherence tomography with dynamic coherent focus An imaging optical coherence tomography (OCT) apparatus with high transverse and high axial resolution comprises an interferometer of the Michelson, Mach-Zehnder or Kosters type. Light returning in the reference beam path (27) and the object beam path (26)... | 01/31/2008 |
| 20080024766 | APPARATUS AND METHODS FOR DETECTING OVERLAY ERRORS USING SCATTEROMETRY Disclosed is a method for determining an overlay error between at least two layers in a multiple layer sample. An imaging optical system is used to measure a plurality of measured optical signals from a plurality of periodic targets on the sample. The targets each have ... | 01/31/2008 |
| 20080024765 | Appearance Inspection Apparatus It is an object of the present invention to provide an appearance inspection apparatus capable of analyzing a difference in detection characteristics of detection signals obtained by a plurality of detectors, and capable of flexibly meeting various inspection purposes w... | 01/31/2008 |
| 20080024764 | FOCUS DETECTION APPARATUS A focus detection apparatus comprising a focus detection unit adapted to employ a photoelectric conversion element to detect a relative positional relationship between a pair of object images corresponding to a focus detection field; and wherein the focus detection unit... | 01/31/2008 |
| 20080024763 | Optical Interferometer And Method Disclosed are compact optical interferometer array, miniature optical interferometer array, and miniature optical interferometer. The interferometer arrays contain a spatial phase modulator array and a detector array. They are used for conducting multiple measurements. ... | 01/31/2008 |
| 20080024758 | Optical system for a particle analyzer and particle analyzer using same A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow c... | 01/31/2008 |
| 20080018889 | MINIATURIZED SYSTEM AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receiver... | 01/24/2008 |
| 20080018883 | MULTIPLE BEAM INSPECTION APPARATUS AND METHOD Disclosed is an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident ... | 01/24/2008 |
| 20080013078 | Optical Mapping Apparatus with Optimized OCT Configuration OCT apparatus includes an interferometer, having an input beam splitter and a 50/50 output splitter. The splitting ratio of the input splitter may be optimized depending on the source power of light source and on the mismatch of the balanced receiver. The input splitter... | 01/17/2008 |
| 20080015802 | Defect Inspection Method and Apparatus A pattern inspection apparatus which compares images of regions, corresponding to each other, of patterns that are formed so as to be identical and judges that non-coincident portions in the images are defects. The pattern inspection apparatus is equipped with an image ... | 01/17/2008 |
| 20080013077 | Handheld colour measurement device A handheld colour measurement device includes a housing in which an optoelectronic measurement unit is located which receives measurement light originating from a measurement object, converts it into corresponding electrical measurement signals and processes these measu... | 01/17/2008 |
| 20080013076 | Surface Inspection Method and Surface Inspection Apparatus It is an object of the present invention to realize a surface inspection method capable of enlarging a dynamic range of a measurement system while keeping high a calculation accuracy for a particle size of a contaminant particle/defect irrespectively of the particle siz... | 01/17/2008 |
| 20080013075 | DETERMINING SURFACE PROPERTIES WITH ANGLE OFFSET CORRECTION The invention relates to an apparatus (1) for determining surface properties, comprising at least a first radiation device (3) which emits radiation onto a surface (8) to be analysed, at least a first radiation detector device (5) which recei... | 01/17/2008 |
| 20080013074 | APPARATUS AND METHOD FOR DETERMINING SURFACE PROPERTIES The invention relates to an apparatus (1) for determining surface properties, comprising at least a first radiation device (3) which emits radiation onto a surface (8) to be analysed, at least a first radiation detector device (5) which recei... | 01/17/2008 |
| 20080013073 | Measurement Method, Measurement Apparatus, Exposure Method, and Exposure Apparatus To perform high-speed and highly accurate measurement by setting desired measuring conditions for each measuring object. In an alignment sensor of exposure apparatus, in the case of performing position measurement for a plurality of sample shots, measurement is performe... | 01/17/2008 |
| 20080007715 | Seismic Exploration An instrument for studying an object (12) comprising a movable interferometer having a laser source and a plurality of detectors (24) arranged in an array. The laser source is expanded and arranged to direct a converging object beam (21) towards a p... | 01/10/2008 |
| 20080007717 | Noise Reduction Of Laser Ultrasound Detection System A method of detecting a property of an object comprising directing a detection laser beam to the object to produce a scattered laser beam modulated corresponding to a motion of said object; receiving the scattered laser beam with an optical interferometer to produce an ... | 01/10/2008 |
| 20080002185 | System and methods for non-destructive analysis A system and methods by which the state or condition of an object may be determined through the analysis of spectral bands. One embodiment of the present invention automatically detects a first spectral band having an absorption that is highly sensitive to the color of ... | 01/03/2008 |
| 20080002184 | Optical Measurement/Evaluation Method And Optical Measurement/Evaluation Apparatus A high-sensitivity evaluation technique for optical anisotropy. An optical measurement/evaluation apparatus A has an optical pulse generator 1 which generates optical pulses, half mirror 3, first mirror 5, second mirror 7, third mirror 9 | 01/03/2008 |
| 20080002183 | Multiplexing Spectrum Interference Optical Coherence Tomography The present invention achieves multiplexing spectrum interference optical coherence tomography capable of full-range OCT measurement that causes no delays in measurement time due to high-order scans and is also free from complex conjugated images. This multiplexing spec... | 01/03/2008 |
| 20080002180 | SYSTEMS AND METHODS FOR USE IN DETECTING HARMFUL AEROSOL PARTICLES The invention provides systems and methods for detecting aerosols. The systems and methods can be used to detect harmful aerosols, such as, bio-aerosols. ... | 01/03/2008 |
| 20080002182 | Device and Method for Detecting Contamination in a Container A device is disclosed for determining the possible presence of contamination of a container with a decorative exterior, for instance provided with a labelling and/or relief patterns, for liquids such as a drink such as beer or a soft drink. The device includes an irradi... | 01/03/2008 |
| 20080004842 | METHOD AND DEVICE FOR BACKSCATTER SPECTROSCOPY A method and a device determine a physical property of a medium, such as a concentration of a substance in the medium. The device includes a light source; a probe with optical fibers positioned alongside each other, with a first optical fiber delivering radiation from t... | 01/03/2008 |
| 20070296959 | Measuring Device and Method That Operates According to the Basic Principles of Confocal Microscopy A scanning system for confocal scanning of an object, comprising a light source (1), imaging optics (4) for focusing the light (5) radiated from the light source (1) onto the object (6) to be scanned, and further comprising an image de... | 12/27/2007 |
| 20070296958 | Polarization imaging apparatus A polarization imaging apparatus measures the Stokes image of a sample. The apparatus consists of an optical lens set 11, a linear polarizer 14 with its optical axis 18, a first variable phase retarder 12 with its optical axis 16 align... | 12/27/2007 |
| 20070291251 | Optical Analysis System With Background Signal Compensation The invention provides an optical analysis system for efficient compensation of spectroscopic broadband back-ground, such as spectroscopic fluorescence background or background signals that are due to the dark current of a detector. The optical analysis system effective... | 12/20/2007 |
| 20070291257 | Optical inspection of a specimen using multi-channel responses from the specimen A method and inspection system to inspect a first pattern on a specimen for defects against a second pattern that is intended to be the same where the second pattern has known responses to at least one probe. The inspection is performed by applying at least one probe to... | 12/20/2007 |
| 20070291256 | Multi mode inspection method and apparatus An inspection system for inspecting an object, the system comprising an illuminator including at least one pulsed light source, a detector assembly, and a relative motion provider operative to provide motion of the object relative to the detector assembly, alone an axis... | 12/20/2007 |
| 20070291255 | NOISE CANCELLATION IN FOURIER TRANSFORM SPECTROPHOTOMETRY Increasing signal to noise ratio in optical spectra obtained by spectrophotometers. An interferometer introduces interference effects into a source light beam. A dual beam configuration splits the source beam having the interference effects into a reference beam and a s... | 12/20/2007 |
| 20070291253 | Measuring Apparatus A measuring apparatus is provided with a light source (4), a first light-receiving element (5) and a second light-receiving element (6) which output signals corresponding to light intensity, a calculating part (12) and a memory part (13 | 12/20/2007 |
| 20070291252 | System and Method For Shade Selection Using a Fabric Brightness Factor A system and method for determining a brightness factor associated with a window shade fabric is disclosed. The brightness factor incorporates the openness factor of the fabric, visible light reflectance of the fabric and visible light transmission of the fabric. The br... | 12/20/2007 |
