...that to encourage use of his new invention, the shopping cart, market owner Sylvan Goldman hired fake shoppers to push the carts around his store in Oklahoma City? Seems his customers were reluctant to give up their hand-carried baskets.
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Application No. | Application Title | Issue Date |
| 20050225745 | Flow cytometer A laser light source emits a first light beam irradiating a solution including target particles and being flowed in a flow cell to generate forward scattered light and orthogonal scattered light therefrom. A light emitting diode emits a second light beam irradiating the... | 10/13/2005 |
| 20050219511 | Apparatus and method for measuring optical characteristics of an object Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of an object are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the objec... | 10/06/2005 |
| 20050219510 | Color measurement feature for information handling system enclosure A method and apparatus for ensuring consistency of color and cosmetic appearance of injection molded parts used in the fabrication of enclosures for information handling systems. A sample of polymer material having a texture and color in accordance with a predetermined ... | 10/06/2005 |
| 20050200835 | Method for collective production of optical filter components The invention relates to tunable wavelength-selective optical filters for letting light of a narrow optical spectrum band, centered around an adjustable wavelength, to pass through and to stop wavelengths lying outside this band. More particularly, the invention relates... | 09/15/2005 |
| 20050164608 | APPARATUS FOR OPTICAL INSPECTION OF WAFERS DURING PROCESSING Abstract of the Disclosure An optical system is disclosed for the inspection of wafers during polishing which also includes a measurement system for measuring the thickness of the wafers top layer. The optical system views the wafer through... | 07/28/2005 |
| 20050151965 | Spectral imaging system An imaging system and methods for resolving elements of interest through and obscuring environment by removing undesired signals from the intervening, obscuring environment is disclosed. A passive hyperspectral imaging sensor is calibrated and integrated into a system h... | 07/14/2005 |
| 20050146710 | Chromatic dispersion measurement and compensation The invention proposes a technique for measuring chromatic dispersion in an optical communication line transmitting an optical signal at a predetermined optical wavelength. The technique comprises determining the sign of chromatic dispersion and includes introducing con... | 07/07/2005 |
| 20050134836 | Cavity enhanced optical detector A cavity enhanced optical detector comprising: i) a source of continuous wave laser light; ii) a high finesse resonant cavity comprising at least three spaced apart, high-reflectivity mirrors positioned to receive light from the laser light source; iii) at least one pho... | 06/23/2005 |
| 20050105080 | Fluorometer A fluorometer with at least one light source, a measuring station with a holder for at least one specimen, a measuring head, and an evaluation station with a detector for evaluating emission signals emitted by a specimen. The measuring head is formed by three optical bl... | 05/19/2005 |
| 20050083514 | Optical measurement of device features using lenslet array illumination The properties of features formed in a substrate are measured. Lenslet array illumination is used to illuminate regions of a substrate so that the features of interest occupy a greater proportion of the illuminated area. The signal-to-noise ratio of the measurement sign... | 04/21/2005 |
| 20050036133 | Multiple adaptable 3-dimensional ultra-high speed scanning system for organic and inorganic surface topography and spectrometry A 3-dimensional ultra-high speed scanning system for organic and inorganic surface topography and spectrometry has a 3-dimensional head to scan an object to be analyzed. The scanning head is operatively associated with a path length variator which in turn is operatively... | 02/17/2005 |
| 20050018173 | Method for mobile on and off-line monitoring of colored and high-gloss automobile component surfaces A method for mobile on- and off-line monitoring of coloured and high-gloss automobile component surfaces includes a camera-supported optical scanning of the automobile surface by means of an angle-dependent spectrophotometer, connected to and initialising an optical neu... | 01/27/2005 |
| 20050012929 | Universal microplate analyzer A universal microplate analyzer capable of carrying out measurements on samples contained in the wells of microplates by fluorescence, absorbance, luminescence employs at least two light sources and optical fiber channels for directing excitation light to the sample wel... | 01/20/2005 |
| 20050009450 | Apparatus for optical inspection of wafers during processing The present invention is aimed to provide a measurement system installable within a processing equipment and more specifically within the exit station of a polishing machine. The optical scheme of this system includes a spectrophotometric channel, an imaging channel and... | 01/13/2005 |