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| Application No. | Application Title | Issue Date |
| 20110310399 | HYBRID SENSOR A sensor system and method for analyzing a feature in a sensing volume. The system imaging the feature with a first sensor and a second sensor that cooperate to form a contiguous sensing volume.... | 12/22/2011 |
| 20090279102 | METHOD AND APPARATUS FOR ACQUIRING REFERENCE GRATING OF THREE-DIMENSIONAL MEASUREMENT SYSTEM USING MOIRE Disclosed herein is a method of acquiring a reference grating of a three-dimensional measurement system using moiré, wherein the three-dimensional measurement system includes a light source, a projection grating, a grating actuator and a camera, and analyzes the moiré... | 11/12/2009 |
| 20090051931 | Systems and methods for measuring sample surface flatness of continuously moving samples Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating chang... | 02/26/2009 |
| 20090051930 | METHOD FOR DETECTING SURFACE DEFECTS ON A SUBSTRATE AND DEVICE USING SAID METHOD A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the sub... | 02/26/2009 |
| 20070211258 | Three-dimensional shape measurement apparatus and method for eliminating2pi ambiguity of moire principle and omitting phase shifting means A three-dimensional (3-D) shape measurement method using a Moire measurement principle and a Stereo vision measurement principle is provided. The method comprises; a first step to detect candidate points and 3D positions of the candidate points in world coordinates whic... | 09/13/2007 |
| 20070211259 | Three-dimensional shape measuring apparatus using shadow moire A 3D shape measuring apparatus using a shadow moire, which can measure a 3D shape of a test object by selectively switching on/off a plurality of illuminating parts irrespective of a form of the test object is provided. The 3D shape measuring apparatus using the shadow ... | 09/13/2007 |
| 20070086020 | Shadow moire using non-zero talbot distance A method for measuring deformation in specimens is provided. The method includes providing a shadow moire system, the shadow moiré system including an illumination source, a reference grating and an image capture device and providing a specimen. The method further incl... | 04/19/2007 |
| 20070041023 | Measurement data processing method and apparatus An object of this invention is to provide a technique to decrease the systematic error such as the distortion aberration in the non-contact light measurement and to realize the absolute value measurement with high accuracy. A measurement data processing method according... | 02/22/2007 |
| 20060232788 | Method and a device for measuring the three dimension surface shape by projecting moire interference fringe The invention discloses a method and device for measuring 3-D surface shape by projected moiré interference fringe. The said device includes a projection device for projecting mark point and main grating line, an observation device for receiving the mark point and grat... | 10/19/2006 |
| 20060109482 | 3D and 2D measurement system and method with increased sensitivity and dynamic range The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the height profile of an object with an increase precision by combining a plurality of image features. In one large aspect of the invention, two or several images are acqui... | 05/25/2006 |
| 20060077400 | Systems and methods for measuring sample surface flatness of continuously moving samples Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating chang... | 04/13/2006 |
| 20060007450 | System and method for simultaneous 3D height measurements on multiple sides of an object An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by mo... | 01/12/2006 |
| 20050219553 | Monitoring apparatus A monitoring apparatus has a first illumination path (LS1, L1, RG1, C5, L3, C1, 27) for structured illumination, a second illumination path (LS2, L2, C2, C5, L3, C1, 27) for uniform illu... | 10/06/2005 |
| 20050046873 | Measuring technology and computer numerical control technology A measuring apparatus of this invention comprises: a projector; a camera; a generator that generates, from a photographed image of a fringe pattern projected by the projector at a time of calibration onto each of surfaces, first tuples, each including coordinates of a p... | 03/03/2005 |
