U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Icon_funbox Did You Know...

...that "patent leather" got its name because the process of applying the polished black finish to leather was once patented?

Newsletter  PatentStorm News

Make the Most of Our Site

See this month's Top Inventors and Most Cited Patents.

Stay on top of the latest innovations by subscribing to an RSS feed.

Registered users: Manage your profile.

 

Class 356/505 - Gap


Subclass of Class 356 - Optics: measuring and testing
Definition: Dimensional measurement including an arrangement for measuring
No. of applications: 6
Last issue date: 08/07/2008


Application No.Application TitleIssue Date
20080186507HIGHLIGHTING GAPS IN A SURFACE
A surface gap detector facilitates determining conformance of a surface of an object by providing a light source integrated into the detector that diffusely illuminates the surface of the object so that a user may observe the light that passes between the detector and t...
08/07/2008
20070064241Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same
An algorithm and method for calculating an interferometric gap is disclosed that comprises providing an interferometric sensor having a first gap and an interferometric correlation element having a second gap placed in series with the first gap. A correlation burst wave...
03/22/2007
20060274323High intensity fabry-perot sensor
In a Fabry-Perot interferometer based sensor if insufficient light reflected from the sensor re-enters the fiber, the results from the Fabry-Perot interferometer-based sensor are compromised. Accordingly, a sensor assembly is provided that comprises an optical fiber hav...
12/07/2006
20060192976Highly-sensitive displacement-measuring optical device
Micron-scale displacement measurement devices having enhanced performance characteristics are disclosed. One embodiment of a micron-scale displacement measurement device includes a phase-sensitive reflective diffraction grating for reflecting a first portion of an incid...
08/31/2006
20060181712Highly-sensitive displacement-measuring optical device
Micron-scale displacement measurement devices having enhanced performance characteristics are disclosed. One embodiment of a micron-scale displacement measurement device includes a phase-sensitive reflective diffraction grating for reflecting a first portion of an incid...
08/17/2006
20060017934Interferometer calibration methods and apparatus
A method for calibrating an interferometer uses an actuator adapted to control an optical gap in response to application of an electrical signal. The interferometer is illuminated with a beam of light having a predetermined substantially monochromatic wavelength, orient...
01/26/2006
 
Sign InRegister
Username  
Password   
forgot password?