Did You Know...
...that it was melting ice cream that inspired the invention of the outboard motor? It was a lovely August day and Ole Evinrude was rowing his boat to his favorite island picnic spot. As he rowed, he watched his ice cream melt and wished he had a faster way to get to the island. At that moment the idea for the outboard motor was born!
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| Application No. | Application Title | Issue Date |
| 20120081710 | METHOD TO DETERMINE THE SATIN-EFFECT ON METAL PLATED SUBSTRATES Subject of the present application is a method to determine the satin-effect on metal plated substrates comprising the following steps: i) irradiate the sample with light, ii) detect the intensity distribution of the scattered light, iii) determine at least one of the f... | 04/05/2012 |
| 20120069343 | MEASUREMENT DEVICE AND MEASUREMENT METHOD A measurement device includes a light sensing element on which light from a measurement target region placing a measurement target thereon forms an image, and a plurality of light emitting elements that are disposed around the light sensing element and radiate light to ... | 03/22/2012 |
| 20120033223 | Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method for Determining a Property of a Substrate In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, b... | 02/09/2012 |
| 20120033199 | Mixture Segregation Testing Devices and Methods Methods and devices are provided to measure segregation in solid particulate mixtures. Light energy is projected through a transparent barrier and reflected off a surface of a mixture volume. The constituent fraction in the mixture is determined by analyzing the mixture... | 02/09/2012 |
| 20120019832 | OPTICAL NAVIGATION WITH SPECULAR REFLECTION BLOCKING A system for optical navigation includes a light source and an imaging system. The light source illuminates a navigation surface. The navigation surface reflects light from the light source. The imaging system is located approximately within a path of the reflected ligh... | 01/26/2012 |
| 20120010854 | Quantum Efficiency Measurement System and Method of Use A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the op... | 01/12/2012 |
| 20110310393 | CATADIOPTRIC ILLUMINATION SYSTEM FOR METROLOGY A catadioptric optical system operates in a wide spectral range. In an embodiment, the catadioptric optical system includes a first reflective surface positioned and configured to reflect radiation; a second reflective surface positioned and configured to reflect radiat... | 12/22/2011 |
| 20110279820 | DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME Disclosed are a spectroscopic optical system and a spectrometer both enabling vertical illumination by means of an optical system using only refractive lenses and enabling wide-band color correction in the DUV-UV (190 to 400 nm) range. The spectroscopic optical system a... | 11/17/2011 |
| 20110273719 | OPTICAL IMAGING FOR OPTICAL DEVICE INSPECTION An optical imaging apparatus based on optical frequency domain measurement (OFDM) collects scatter data at multiple locations within or on the DUT as a function of time. A light source launches light into a device under test (DUT) which scatters light at one or more loc... | 11/10/2011 |
| 20110273718 | IMAGING SYSTEM AND RELATED TECHNIQUES A method and apparatus for imaging using a double-clad fiber is described.... | 11/10/2011 |
| 20110267623 | Multi-Wavelength Reference Microplate For Label-Independent Optical Reader A multi-wavelength reference microplate for a label-independent optical reader is disclosed. The microplate includes a support plate that supports a plurality of reference wells. At least one of the reference wells is configured as a multi-wavelength reference well havi... | 11/03/2011 |
| 20110267624 | SENSOR SYSTEM IN A MOTOR VEHICLE A sensor system is described for detecting wetting of a window includes a photodetector having multiple light-sensitive elements and a light source for emitting light to a detection region of the window in such a way that a portion of the light is reflected at the windo... | 11/03/2011 |
| 20110261339 | SCATTEROMETER AND LITHOGRAPHIC APPARATUS A scatterometer for measuring a property of a substrate includes a focus sensing arrangement including an arrangement (65) that directs a first beam of radiation onto a focusing arrangement, to be detected by a focus sensor arrangement (61). A focus contro... | 10/27/2011 |
| 20110226940 | FUSED FIBER OPTIC COUPLER ARRANGEMENT AND METHOD FOR USE THEREOF Exemplary embodiments of an article of manufacture and method according to the present disclosure are provided. For example, a first multi-clad fiber arrangement can be provided that comprises a first core and at least one first cladding which is structured to propagate... | 09/22/2011 |
| 20110176137 | Optical Sensor The invention relates to an optical sensor for detecting characteristic reflection patterns caused by randomly distributed and/or oriented microreflectors. The invention furthermore relates to the method od using a sensor according to the invention for identifying and/o... | 07/21/2011 |
| 20110109888 | Method and Apparatus for Measuring Line End Shortening, Substrate and Patterning Device End of line effect can occur during manufacture of components using a lithographic apparatus. These end of line effects can result in line end shortening of the features being manufactured. Such line end shortening may have an adverse impact on the component being manuf... | 05/12/2011 |
| 20110109910 | NON-INVASIVE OPTICAL CHARACTERIZATION OF BIOMATERIAL MINERALIZATION In one aspect, the present invention generally provides methods for characterizing mineralization of a material, e.g., a biomaterial, by illuminating the material with radiation and analyzing radiation scattered from the material in response to the illumination. For exa... | 05/12/2011 |
| 20110102753 | Apparatus and Method of Measuring a Property of a Substrate The present invention makes the use of measurement of a diffraction spectrum in or near an image plane in order to determine a property of an exposed substrate. In particular, the positive and negative first diffraction orders are separated or diverged, detected and the... | 05/05/2011 |
| 20110083496 | SEMICONDUCTOR PROCESSING APPARATUS WITH SIMULTANEOUSLY MOVABLE STAGES A method and apparatus provide for simultaneously moving multiple semiconductor wafers in opposite directions while simultaneously performing processing operations on each of the wafers. The semiconductor wafers are orientated in coplanar fashion and are disposed on sta... | 04/14/2011 |
| 20110080643 | HARD-COATED ANTIGLARE FILM, POLARIZING PLATE AND IMAGE DISPLAY INCLUDING THE SAME, AND METHOD FOR EVALUATING THE SAME A hard-coated antiglare film that has superior antiglare properties, and reflection properties even when a haze value is low, and can improve the depth of black in black display by preventing “tinting” occurs specifically when a reflection is reduced, a polarizing p... | 04/07/2011 |
| 20110077921 | PRINT COLOR PREDICTING METHOD, PRINT COLOR PREDICTING APPARATUS, COMPUTER-READABLE RECORDING MEDIUM WITH PRINT COLOR PREDICTING PROGRAM RECORDED THEREIN, AND PROFILE GENERATING METHOD First spectral data (spectral reflectance) of a printed object is obtained, and second spectral data (optical material characteristic value) of a laminating film is estimated. Then, using the first spectral data and the second spectral data, fourth spectral data (spectr... | 03/31/2011 |
| 20110043811 | MASK DEFECT MEASUREMENT METHOD, MASK QUALITY DETERMINATION METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE A method for measuring a shape of a phase defect existing on an exposure mask includes making inspection light incident on the mask, measuring the intensity of light scattered in an angular range in which the width of an scattering area on the phase defect can be predic... | 02/24/2011 |
| 20110043812 | Method and apparatus for determining reflectance data of a subject An apparatus for obtaining reflectance data of an object includes a diffuser having a surface. The apparatus includes a mapping portion that affects a mapping between a light field at the object's surface and a light field at the diffuser surface for BRDF capture of the... | 02/24/2011 |
| 20110032121 | Method, System, And Optical Communication Assembly For Obtaining Traffic Information The present invention relates to method for obtaining traffic information by means of optical signals between a vehicle and an optical communication node, wherein the node forms part of a road network. According to the present invention there is provided a method compri... | 02/10/2011 |
| 20110026032 | Method of Assessing a Model of a Substrate, an Inspection Apparatus and a Lithographic Apparatus A method of assessing a model of a substrate is presented. A scatterometry measurement is taken using radiation at a first wavelength. The wavelength of the radiation is then changed and a further scatterometry measurement taken. If the scatterometry measurements are co... | 02/03/2011 |
| 20110020616 | Method of Determining Overlay Error and a Device Manufacturing Method A method of determining an overlay error in a set of superimposed patterns. The patterns are divided into two and a first part of the pattern has a bias of d+s/2 between the first layer and second layer. A second part of the pattern has a bias of d−s/2 between the fir... | 01/27/2011 |
| 20110019197 | Scattered Light Separation An apparatus for detecting top scattered light from a substrate. A source directs a light onto a position on the substrate. The light thereby reflects off in a specular beam, scatters off the top surface, and scatters off a bottom surface of the substrate. An objective ... | 01/27/2011 |
| 20110013193 | METHOD FOR ATTENUATED TOTAL REFLECTION FAR ULTRAVIOLET SPECTROSCOPY AND AN APPARATUS FOR MEASURING CONCENTRATIONS THEREWITH In far ultraviolet spectroscopy using attenuated total reflection, total reflection light is measured by using evanescent waves of total reflection light. The penetration depth thereof is equal to or larger than 150 nm in a wavelength range in the far ultraviolet range ... | 01/20/2011 |
| 20110007320 | LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT SUBSTRATES A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light sourc... | 01/13/2011 |
| 20110001978 | Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method A method of determining an overlay error between two successive layers produced by a lithographic process on a substrate, including using the lithographic process to form a calibration structure including a periodic structure of the same pitch on each of the layers, suc... | 01/06/2011 |
| 20100328636 | Producing a Marker Pattern and Measurement of an Exposure-Related Property of an Exposure Apparatus In order to determine whether an exposure apparatus is projecting patterns correctly, a marker pattern is used on a mask for printing a specific marker structure onto a substrate. This marker is then measured by an inspection apparatus to determine whether there are err... | 12/30/2010 |
| 20100328672 | Goniophotometer A goniophotometer has a main rotating table, a sync-rotating table, a luminaire rotating table and light detecting tubes (4-1, 4-2). The main rotating table has a main rotating axis (1-2) and a main mirror (1-4) reflectin... | 12/30/2010 |
| 20100321698 | METHOD AND APPARATUS FOR THE SIMULTANEOUS GENERATION AND DETECTION OF OPTICAL DIFFRACTION INTERFERENCE PATTERN ON A DETECTOR The present invention provides for a novel method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a photo detector. The monitoring method and apparatus disclosed herein comprises of a (any) continuous wave coher... | 12/23/2010 |
| 20100315613 | Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method A scatterometer configured to derive a property of a substrate, includes an optical arrangement that produces a beam of radiation. An objective lens is arranged to focus the beam of radiation onto a target on the substrate. The optical arrangement is arranged to change ... | 12/16/2010 |
| 20100296096 | IMAGING OPTICAL INSPECTION DEVICE WITH A PINHOLE CAMERA The invention relates to an imaging optical inspection setup for inspecting a sample (5). Said inspection setup comprises a source of light (3) illuminating a specified portion of the sample surface by non-collimated light (4) in a plane of illumina... | 11/25/2010 |
| 20100284014 | DETERMINING BIOLOGICAL TISSUE OPTICAL PROPERTIES VIA INTEGRATING SPHERE SPATIAL MEASUREMENTS An optical sample is mounted on a spatial-acquisition apparatus that is placed in or on an enclosure. An incident beam is irradiated on a surface of the sample and the specular reflection is allowed to escape from the enclosure through an opening. The spatial-acquisitio... | 11/11/2010 |
| 20100265493 | Pulsed Lasers in Frequency Domain Diffuse Optical Tomography and Spectroscopy A diffuse optical tomography system incorporating a mode-locked, tunable laser produces pulsed light that may be used to interrogate tissue with high spatial and spectral resolution. The detection signal may be heterodyne shifted to lower frequencies to allow easy and a... | 10/21/2010 |
| 20100257987 | METHOD FOR CONTROLLING THE REGISTER BETWEEN A PRINTED PATTERN AND A THREE-DIMENSIONAL PATTERN ON A PACKAGING MATERIAL A method and/or an apparatus for controlling the register between print and three-dimensional structures, such as creases in the forming of a package, and a method and/or the apparatus for controlling a unit for repeated cutting-out or perforation of a material web from... | 10/14/2010 |
| 20100241006 | APPARATUS FOR DETECTING BRAIN CONDITIONS Disclosed embodiments relate to an apparatus for detecting brain conditions. The apparatus for detecting brain conditions may include: a layer which is located adjacent to the brain of a living body; a light source which is formed on the layer and irradiates light to th... | 09/23/2010 |
| 20100225477 | DUCT GREASE DEPOSIT DETECTION DEVICES, SYSTEMS, AND METHODS Automatic devices that determine when pollutant deposits have accumulated in ductwork may be employed to notify maintenance personnel or automated cleaning equipment of the need for ducts to cleaned or replaced. Various detection devices may be employed to detect a prop... | 09/09/2010 |
