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Class 356/326 - Utilizing a spectrometer


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein the spectroscopic examination is
No. of applications: 391
Last issue date: 05/24/2012


1                    
Application No.Application TitleIssue Date
20120127467Object Inspection Systems and Methods
Methods and systems for inspection of an object include the use of spectroscopic techniques for the detection of unwanted particles on an object's surface, based on the different responses of the unwanted particles as compared with the object to be inspected due to thei...
05/24/2012
20120125998APPARATUS FOR VERIFYING THE IDENTITY OF A FINAL FLUID PRODUCT FOR MEDICAL OR PHARMACEUTICAL USE
An apparatus (22) for verifying a final product being packaged in a final container (28), includes an optical spectroscopy analysis unit including a device for holding the final container (28), and a probe, characterized in that the holding device i...
05/24/2012
20120105846SPECTRUM MEASURING APPARATUS
Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement po...
05/03/2012
20120105844Coded Aperture Snapshot Spectral Imager and Method Therefor
The present invention enables snap-shot spectral imaging of a scene at high image generation rates. Light from the scene is processed through an optical system that comprises a coded-aperture. The optical system projects a plurality of images, each characterized by only...
05/03/2012
20120105845Imaging Spectrometer
Optical radiation from a sample is received by the slit and it is passed through an aperture in a reflective plane of a folding mirror towards a curved reflective surface of a collimating mirror. The slit and the curved reflective surface have a common optical axis. The...
05/03/2012
20120105847SPECTROMETRIC MEASUREMENT SYSTEM AND METHOD FOR COMPENSATING FOR VEILING GLARE
The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detect...
05/03/2012
20120081694OPTICAL SCANNING AND IMAGING SYSTEMS BASED ON DUAL PULSED LASER SYSTEMS
The invention relates to scanning pulsed laser systems for optical imaging. Coherent dual scanning laser systems (CDSL) are disclosed and some applications thereof. Various alternatives for implementation are illustrated, including highly integrated configurations. In a...
04/05/2012
20120069333Cells for Biochemical Analysis, Kit for Biochemical Analysis, and Biochemical Analyzer
The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate s...
03/22/2012
20120069334Efficient Optical Arrangement for Illumination and Dectection of Label-Free Biosensors and Method to Reduce Interference Fringes in Label-Free Imaging
An optical arrangement for illuminating a surface of a biosensor having a periodic surface grating structure. The arrangement includes a light source generating light, collimating optics for collimating the light from the light source, and a first reflecting surface (e....
03/22/2012
20120050735WAVELENGTH DEPENDENT OPTICAL FORCE SENSING
Sensors operate by resolving changes in orientation of a wavelength dependent structure with respect to a reference direction determined by an incident light beam, resulting in very high sensitivity and dynamic range. Said sensors are wavelength encoded, can be multiple...
03/01/2012
20120049070Continuous Referencing For Increasing Measurement Precision In Time-Domain Spectroscopy
An apparatus for incorporation into time-domain spectroscopy systems that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected employs a beam splitter to generate sample and reference pulses. A detector is positioned f...
03/01/2012
20120045855POSITION-SENSITIVE METROLOGY SYSTEM
A metrology system for analyzing a semiconductor device on a substrate can include a metrology sensor....
02/23/2012
20120044491OPTICAL FILTER, OPTICAL FILTER MODULE, SPECTROMETRIC INSTRUMENT, AND OPTICAL APPARATUS
An optical filter includes a first substrate, a second substrate facing the first substrate, a first optical film provided to the first substrate, and a second optical film provided to the second substrate and facing the first optical film, and at least one of the first...
02/23/2012
20120044492OPTICAL FILTER, OPTICAL FILTER MODULE, SPECTROMETRIC INSTRUMENT, AND OPTICAL INSTRUMENT
An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflec...
02/23/2012
20120044490Extreme Light Pulse-Front Tilt and Its Application to Single Shot Measurement of Picosecond to Nanosecond Laser Pulses
Various methods and systems are provided for generation of a laser pulse with massive pulse-front tilt (PFT) and its use for measurement of laser pulses. In one embodiment, a method includes directing a laser pulse into an etalon and propagating the laser pulse through ...
02/23/2012
20120044489Photonic crystal slot waveguide miniature on-chip absorption spectrometer
Methods and systems for label-free on-chip optical absorption spectrometer consisting of a photonic crystal slot waveguide are disclosed. The invention comprises an on-chip integrated optical absorption spectroscopy device that combines the slow light effect in photonic...
02/23/2012
20120038917Sensor for liquid and/or gas analysis
A sensor of the type for liquid and/or gas analysis, which is connected to a measuring and/or evaluating system or, respectively, to a higher-ranking control system and has a sensor housing. The circuit for the collecting, processing and transmitting measured values to ...
02/16/2012
20120033213SPECTROGRAPH HAVING MULTIPLE WAVELENGTH RANGES FOR HIGH RESOLUTION RAMAN SPECTROSCOPY
A spectrograph having multiple excitation wavelength ranges is disclosed. The spectrograph can include a wavelength switching mechanism to switch between different wavelength ranges in accordance with the wavelength of an incoming light signal. The wavelength switching ...
02/09/2012
20120033066Method and device for optically measuring the surface of a product
The present invention relates to a device (10), a method and an application thereof for optically measuring the surface of a tested product (5), especially a PCB-product for reflow soldering paste inspection. The device comprises at least one white light s...
02/09/2012
20120026495Device for On-Site Measurement of Concentration of Uranium in High Temperature Molten Salts
A device for on-site measurement of concentration of uranium in high temperature molten salts is provided. More particularly, to a device for on-site measurement of concentration of uranium in high temperature molten salts that can be directly applied to a pyroprocess f...
02/02/2012
20120019819RAMAN SPECTROSCOPY USING MULTIPLE DISCRETE LIGHT SOURCES
Raman spectroscopy apparatuses are described that detect the spectral characteristics of a sample wherein the apparatus consists of a multiplicity of modulated discrete light sources adapted to excite a sample with electromagnetic radiation, a filter adapted to isolate ...
01/26/2012
20120019823Spectrometric analysis of fluids in-situ
A box 14 having a body 13 is used with a transparent flexible bag containing a liquid such as an IV bag. First and second faces 12 are positioned relative to each other. The faces each have therewithin an end or fiber optic port 11 of a respe...
01/26/2012
20120018829TEMPERATURE-ADJUSTED SPECTROMETER
A temperature-adjusted spectrometer can include a light source and a temperature sensor....
01/26/2012
20120021539IN-LINE METROLOGY SYSTEM
A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes....
01/26/2012
20120013904 METHOD AND APPARATUS FOR DETECTING CADMIUM WITH OPTICAL EMISSION SPECTROSCOPY
An apparatus and method for detecting cadmium using optical emission spectroscopy is provided. The apparatus contains a system which uses optical emission spectroscopy which is programmed and calibrated to detect the presence of cadmium in PPM. The system is calibrated ...
01/19/2012
20120013905OPTICAL FILTER, OPTICAL FILTER MODULE, SPECTROMETRIC MEASUREMENT APPARATUS, AND OPTICAL APPARATUS
An optical filter includes a first variable wavelength bandpass filter that extracts light of a first wavelength band and has first and second spectral bands and a second variable wavelength bandpass filter that extracts light of a second wavelength band adjacent to the...
01/19/2012
20120008140Terahertz Sensing System and Method
Disclosed herein are a system and corresponding method for sensing terahertz radiation. The system collects terahertz radiation scattered from a target and upconverts the collected radiation to optical frequencies. A frequency-domain spectrometer senses spectral compone...
01/12/2012
20120008141OPTICAL FILTER, OPTICAL FILTER MODULE, SPECTROMETRIC MEASUREMENT APPARATUS, AND OPTICAL APPARATUS
An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelen...
01/12/2012
20120002200Spectrometer
A spectrometer has a motor, a reduction means for employing a wave gear device to reduce the rotation of the motor, a wavelength dispersion device for being driven by rotation that was reduced by the reduction means, and a control means for controlling the operation of ...
01/05/2012
20120002201Spectral Device and Method for Controlling Same
A spectroscopic device with high sensitivity is provided.

A spectroscopic device has a charge generating section 3 for generating a charge by using an incident light, a charge generation controlling section for controlling the charge...

01/05/2012
20120002199Means and Methods for Rapid Droplet, Aerosols and Swab Infection Analysis
The present invention provides an optical unit (320) adapted to accommodate a sample and to enable optical detection of infection within said sample; said optical unit comprising a body (100); said body is characterized by a distal end and a proximal end i...
01/05/2012
20110320147PRECISION MEASUREMENTS IN A FIBER OPTIC DISTRIBUTED SENSOR SYSTEM
A fiber optic distributed vibration sensor provides a highly sensitive measurement of a measurand with a high degree of linearity. The distributed vibration sensor includes subsections configured to have a high sensitivity to a measurand of interest interspaced in an al...
12/29/2011
20110315661ETCHING APPARATUS, ANALYSIS APPARATUS, ETCHING TREATMENT METHOD, AND ETCHING TREATMENT PROGRAM
There is provided an etching apparatus in which, without setting the information of the substance and the chemical reaction, a small number of representative wavelengths can be selected from a waveform at a lot of wavelengths, and an analysis process of etching data whi...
12/29/2011
20110317149SPECTRAL CHARACTERISTICS ESTIMATION DEVICE, IMAGE FORMING APPARATUS HAVING THE SAME, AND SPECTRAL CHARACTERISTICS ESTIMATION METHOD
Spectral characteristics of an object is estimated using an extended sensor response, which includes a product of at least two light intensity signals whose wavelength ranges are partially overlapped with each other....
12/29/2011
20110310384METHODS AND SYSTEM FOR CONFOCAL LIGHT SCATTERING SPECTROSCOPIC IMAGING
The present invention is generally directed to imaging methods and apparatus that employ angular and/or wavelength distribution of light backscattered from multiple portions of a sample in response to illumination by electromagnetic radiation to generate one, two or thr...
12/22/2011
20110299075OPTICAL SLICER FOR IMPROVING THE SPECTRAL RESOLUTION OF A DISPERSIVE SPECTROGRAPH
An optical slicer for generating an output spot comprising an image compressor which receives a substantially collimated input beam and compresses the beam, wherein the input beam, if passed through a focusing lens, produces an input spot; an image reformatter which rec...
12/08/2011
20110299076SPECTROMETER WITH VALIDATION CELL
A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed...
12/08/2011
20110299077SPECTROSCOPY MODULE
In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relations...
12/08/2011
20110299074NANOSTRUCTURE OPTOELECTRONIC DEVICE WITH INDEPENDENTLY CONTROLLABLE JUNCTIONS
Nanostructure array optoelectronic devices are disclosed. The optoelectronic device may have one or more intermediate electrical contacts that are physically and electrically connected to sidewalls of the array of nanostructures. The contacts may allow different photo-a...
12/08/2011
20110292374Nadir Emissive Hyperspectral Measurement Operation (NEHMO)
A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissiv...
12/01/2011
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