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Class 356/239.3 - Patterned surface


Subclass of Class 356 - Optics: measuring and testing
Definition: Inspection of transparent or translucent material further
No. of applications: 2
Last issue date: 07/16/2009


Application No.Application TitleIssue Date
20090180109DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
An object of the invention is to provide a defect inspection method which can prevent the failure in detecting a defect, caused by saturation of a pattern signal obtained by inspecting an inspected object, so that the investigation of the cause for defect occurrence can...
07/16/2009
20090174880INSPECTION APPARATUS AND METHOD
An optical plate having an exit pupil array or a lens array aligned at a predetermined pitch is disposed at the front of a display. A test pattern is supplied to the display to light a pixel corresponding to the predetermined pitch. A first optical element transmits a l...
07/09/2009
 
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