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Class 356/2 - CONTOUR PLOTTING


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter including structure responsive to two stereoscopic
No. of applications: 12
Last issue date: 11/03/2011


Application No.Application TitleIssue Date
20110267430Detection Device of Planar Area and Stereo Camera System
An object of the present invention is to provide a detection device of a planar area, which suppresses matching of luminance values in areas other than a planar area, and non-detection and erroneous detection of the planar area arising from an error in projection transf...
11/03/2011
20080218727METHOD AND APPARATUS FOR OPTICAL IMAGE RECONSTRUCTION USING CONTOUR DETERMINATION
The present invention relates to a method and a system for optical imaging of an object in transmission configuration. The method and system obtain contour coordinates of the object using source/detector configurations references and acquire optical data from a region o...
09/11/2008
20080204697Surface measurement apparatus and method using depth of field
The invention provides for surface mapping of in-vivo imaging subjects using a single camera and a moveable stage on which a subject animal for in-vivo imaging is placed. Images are taken and the stage is moved by known amounts along the optical axis, and the heights of...
08/28/2008
20080198355Surface measurement of in-vivo subjects using spot projector
The invention provides for surface mapping of in-vivo imaging subjects using a single camera and an illuminator that projects a plurality of targets such as spots on the subject. By limiting the depth-of-field of the camera lens, or of the illuminator optics, or both, a...
08/21/2008
20080165341Multiple Channel Interferometric Surface Contour Measurement System
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel ha...
07/10/2008
20080015812Parallel profile determination for an optical metrology system
A system to process requests for wafer structure profile determination from optical metrology measurements off a plurality of structures formed on one or more wafer includes a diffraction signal processor, a diffraction signal distributor, and a plurality of profile sea...
01/17/2008
20070233404Creating a library for measuring a damaged structure formed on a wafer using optical metrology
A method of creating a library for measuring a plurality of damaged structures formed on a semiconductor wafer using optical metrology includes directing an incident beam on a first damaged structure. The first damaged structure was formed by modifying at least one proc...
10/04/2007
20070188870MULTILAYER MIRROR MANUFACTURING METHOD, OPTICAL SYSTEM MANUFACTURING METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
A method for manufacturing a multilayer mirror that includes a substrate and a multilayer film formed on the substrate, and has a reflection surface shape includes the steps of estimating a surface shape variation amount as a difference between a surface shape of the su...
08/16/2007
20060250603Multisite multichannel game tracker or game monitor
This game monitor product is designed to give the hunter a independent audio and visual position or early warning of the deer or game animal as it comes or goes in or out the hunter's hunting range and possibly being out of sight. This is new in the art and field of hun...
11/09/2006
20060074509Apparatus for determining the internal outline of a duct or cavity, and in particular for determining the internal impression of the auditory canal, a probe for this apparatus, and reflection device for an optical scanning apparatus
An apparatus for determining the internal outline of a duct or cavity, comprises light-emitting means (71) suitable for generating a collimated light beam, an elongate probe element (51; 51′; 51″) suitable for being introduced into the duct and for gui...
04/06/2006
20050281561Quantum optical transmission device
In an optical detection method that requires a reference light such as homodyne detection, a signal light and the reference light must be equal to each other in the wavelength, and the phase relation between them must be maintained constant. It is generally difficult th...
12/22/2005
20050038602Terrestrial environment observation satellites
A terrestrial environment observation satellite is provided, which can solve such environmental problems as earth temperature increase, ozone layer destruction and occurrence of abnormal weather occurring on the whole earth scale on the basis of data obtained from a sen...
02/17/2005
 
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