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| Application No. | Application Title | Issue Date |
| 20090066359 | SEMICONDUCTOR DEVICE TEST SYSTEM HAVING REDUCED CURRENT LEAKAGE A test circuit tests a device under test (DUT) uses a first switching device and a second switching device. The device under test (DUT) has a terminal for receiving a test signal. The first switching device has an output terminal for use in coupling the test signal to t... | 03/12/2009 |
| 20080204068 | METHOD FOR ESTIMATING DEFECTS IN AN NPN TRANSISTOR ARRAY A method for testing bipolar transistors in an integrated circuit includes first measuring first conductances of leakage paths between collectors and emitters of a first plurality of bipolar transistors with a known number of defects, calculating a per defect conductanc... | 08/28/2008 |
| 20070096766 | CHOPPER TYPE COMPARATOR In some examples, a chopper type comparator for comparing an analog voltage to be measured and a reference voltage by sampling and outputting an “H” level signal or an “L” level signal depending on the comparison result includes a capacitor configured to store a... | 05/03/2007 |
| 20070085559 | Test device A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag i... | 04/19/2007 |
