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| Application No. | Application Title | Issue Date |
| 20100289519 | CIRCUIT FOR DETECTING FAULTY DIODE A circuit for detecting faulty diode comprises a diode having an anode connected to a voltage supply; a resistor having a first end connected to a cathode of the diode; a transistor having a drain connected to a second end of the resistor and a source that is grounded; ... | 11/18/2010 |
| 20100289518 | CIRCUIT AND METHOD FOR DETECTING FAULTY DIODE A circuit for detecting faulty diode is disclosed, wherein the circuit for detecting faulty diode comprises a diode having an anode connecting to a voltage supply; a first switch having a first end connected to a cathode of the diode; a testing current source connected ... | 11/18/2010 |
| 20100244055 | SEMICONDUCTOR-BASED SUB-MOUNTS FOR OPTOELECTRONIC DEVICES WITH CONDUCTIVE PATHS TO FACILITATE TESTING AND BINNING The disclosure facilitates testing and binning of multiple LED chip or other optoelectronic chip packages fabricated on a single semiconductor wafer. The testing can take place prior to dicing. For example, in one aspect, metallization on the front-side of a semiconduct... | 09/30/2010 |
| 20100164532 | APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SEMICONDUCTOR DEVICE An apparatus and method for measuring the characteristics of a semiconductor device is disclosed. The measuring apparatus may include first to M-th (wherein M is a positive integer not less than 1) starved devices each being biased in response to a bias voltage varying ... | 07/01/2010 |
| 20100121593 | IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then, the health of the solid-state light source is characterized based on an an... | 05/13/2010 |
| 20100042353 | SYSTEM AND METHOD FOR TESTING WORKING CONDITION OF LED INDICATORS ON HARD DISK DRIVES A method is provided to test working condition of LED indicators on hard disk drives connected to a computer. The method calls an API function from an operating system of the computer to create a main thread, and creates a sub thread for each of the hard disk drives con... | 02/18/2010 |
| 20090322372 | AUTOMATIC TEST EQUIPMENT A coupling line is provided for coupling a signal generator to a device under test and includes a first Zener diode and a second Zener diode. The first Zener diode and the second Zener diode are coupled in an antiserial manner. They are adapted to couple the signal gene... | 12/31/2009 |
| 20090302881 | Internal Memory for Transistor Outline Packages A transistor outline (TO) package includes a housing having a window and a substrate. Circuitry is coupled to the substrate within the housing. The circuitry comprises a laser diode and memory configured to store information related to the TO package. Electrical connect... | 12/10/2009 |
| 20090167257 | SHORTED ROTATING DIODE DETECTION AND PROTECTION An electric generator with a rotating diode fault detection device built in that operates by comparing a voltage buildup across the exciter DC supply with a preset threshold value and determining if a fault condition is present based on the comparison.... | 07/02/2009 |
| 20090115446 | Measurement method of the current-voltage characteristics of photovoltaic device, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradiance used for the solar simulator [Problem] In a solar simulator for measuring the current-voltage characteristics of photovoltaic devices, it is to provide a measurement method using a solar simulator in which locative unevenness of irradiance on the test plane of the test plane side is drastically imp... | 05/07/2009 |
| 20090096479 | System and method for automated detection of singular faults in diode or'd power bus circuits A system automatically detects singular faults in diode or'd power bus circuit comprised of a plurality of diodes. The system includes a diode test circuit that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular fa... | 04/16/2009 |
| 20090066359 | SEMICONDUCTOR DEVICE TEST SYSTEM HAVING REDUCED CURRENT LEAKAGE A test circuit tests a device under test (DUT) uses a first switching device and a second switching device. The device under test (DUT) has a terminal for receiving a test signal. The first switching device has an output terminal for use in coupling the test signal to t... | 03/12/2009 |
| 20090009208 | SEMICONDUCTOR DEVICE AND INSPECTION METHOD THEREOF A semiconductor device is disclosed. The device has a photodiode isolated by element isolating regions (Ia, 14a, 14b) characterized by the following facts: on the principal surface of first semiconductor layer 11 of the first electroco... | 01/08/2009 |
| 20080122475 | A Current Mirror with Circuitry That Allows for Over Voltage Stress Testing A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transisto... | 05/29/2008 |
| 20070268038 | Method for analyzing the reliability of optoelectronic elements rapidly A method for analyzing the reliability of optoelectronic elements rapidly is described, which has a spectrum analyzer to test and measure NEP and peak of noise power spectrum of the optoelectronic elements at the low frequency. The optoelectronic elements are imposed wi... | 11/22/2007 |
| 20070210854 | METHODS AND SYSTEMS FOR SEMICONDUCTOR DIODE JUNCTION PROTECTION Protection methods and protection systems for semiconductor devices with diode junctions. The protection methods and protection systems detect the anomalies in the behavior of the junction and protect the device from damage. ... | 09/13/2007 |
| 20070013406 | System and method for reading a test strip A system and method is disclosed which relates to reading test strips. The method may include reading and storing initial values of a front photodiode and a rear photodiode, reading current values of the front and rear photodiodes, detecting at least one change between ... | 01/18/2007 |
| 20050218925 | Laser production and product qualification via accelerated life testing based on statistical modeling A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced c... | 10/06/2005 |
