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| Application No. | Application Title | Issue Date |
| 20120069883 | Passive Selt The present invention relates to a method for estimating properties of a transmission line by means of features of a noise spectrum generated by noise entering said transmission line at an intermediate location between the ends of the line. The invention provides possib... | 03/22/2012 |
| 20120049859 | Noise Handling in Capacitive Touch Sensors In a capacitive sensor of the type having X electrodes which are driven and Y electrodes that are used as sense channels connected to charge measurement capacitors, signal measurements may be made by driving the X electrodes to transfer successive packets of charge to t... | 03/01/2012 |
| 20120001643 | SENSING PHASE SEQUENCE TO SUPPRESS SINGLE TONE NOISE A noise suppression method for a capacitance-to-voltage converter varies a sequence of sensing signal edges during a plurality capacitance measurements to produce a number of noise responses. The sensing signal edges are varied in a repetitive rising and falling edge pa... | 01/05/2012 |
| 20110298474 | IMPLEMENTING INTEGRAL DYNAMIC VOLTAGE SENSING AND TRIGGER A method and circuit for implementing dynamic voltage sensing and a trigger circuit, and a design structure on which the subject circuits resides are provided. The voltage sensing circuit includes a first quiet oscillator generating a reference clock, and a second noisy... | 12/08/2011 |
| 20110227599 | SEMICONDUCTOR DEVICE TEST METHOD AND SEMICONDUCTOR DEVICE A transition delay test is conducted such that an internal circuit that is a test object circuit in a semiconductor device is divided into a plurality of circuit blocks and a determination test is conducted while changing concurrently operating circuit blocks, a power s... | 09/22/2011 |
| 20110181298 | MEASUREMENT APPARATUS AND TEST APPARATUS Provided is a measurement apparatus that measures a signal under measurement input thereto, comprising a plurality of signal measurement circuits that measure a level of a signal input thereto, according to a sampling clock provided thereto; a noise measuring section th... | 07/28/2011 |
| 20110109459 | INTERFERENCE DETECTOR FOR PATIENT MONITOR A system is disclosed for detecting and calculating the level of ambient and/or environmental noise, such as electromagnetic interference generated by electric power lines, ambient lights, light dimmers, television or computer displays, power supplies or transformers, a... | 05/12/2011 |
| 20110043220 | METHOD AND APPARATUS FOR POWER SEQUENCE TIMING TO MITIGATE SUPPLY RESONANCE IN POWER DISTRIBUTION NETWORK The transient load current of a circuit powered by a power distribution network is increased in a plurality of steps, with the step transition times being adjusted based on the transient noise of the power distribution network. This reduces the resonance noise that woul... | 02/24/2011 |
| 20110025346 | POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURING METHOD A power-supply noise measuring circuit includes a voltage fluctuation detecting circuit, a unit time generating circuit: a current measuring circuit, and a sampling circuit. The voltage fluctuation detecting circuit generates a detection current in accordance with a vol... | 02/03/2011 |
| 20100321035 | LOOP ELEMENT AND NOISE ANALYZER There is provided a shield-structured loop element which can suppress noise via a silicon substrate and can be manufactured by a semiconductor process. The loop element includes: a first well of a first polarity that is formed on a substrate; a deep well of a second pol... | 12/23/2010 |
| 20100315098 | METHOD FOR DETERMINING AT LEAST ONE STATE VARIABLE OF AN ELECTRIC ARC FURNACE, AND ELECTRIC ARC FURNACE In a method for determining a state variable of an electric arc furnace, especially for determining the level of the foamed slag (15) in a furnace, the energy supplied to the furnace is determined with the aid of at least one electric sensor while solid-borne noi... | 12/16/2010 |
| 20100283481 | SYSTEMS AND METHODS FOR CONDUCTING EMI SUSCEPTIBILITY TESTING System and methods for performing EMI susceptibility testing of a device is disclosed. A system may include an EMI generation unit that includes a plurality of EMI generating devices, where each EMI generating device generates EMI having substantially similar characteri... | 11/11/2010 |
| 20100231233 | SYSTEMS AND METHODS FOR BUILT IN SELF TEST JITTER MEASUREMENT An apparatus configured for built in self test (BIST) jitter measurement is described. The apparatus includes a time-to-voltage converter. The time-to-voltage converter generates a voltage signal proportional to timing jitter present in a clock/data signal input. The ap... | 09/16/2010 |
| 20100194405 | NOISE MEASUREMENT SYSTEM IN POWER STABILIZATION NETWORK, VARIABLE FILTER APPLIED TO THE SAME, AND METHOD FOR MEASURING NOISE IN POWER STABILIZATION NETWORK A noise measurement system in power stabilization network, a variable filter applied to the same and a method for measuring noise in power stabilization network are disclosed, wherein the system comprises: a power stabilization network including a power input unit for r... | 08/05/2010 |
| 20100188103 | PULSE PERIOD MEASUREMENT METHOD The effect of chattering on the measurement of the pulse period is reduced. The pulse period representing the rise interval of target pulses appearing in a pulse signal PI is measured. The pulse signal PI is sampled in synchronization with a measurement clock CLK. Measu... | 07/29/2010 |
| 20100127714 | Test system for flicker noise A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.... | 05/27/2010 |
| 20100060296 | Method and device for checking a sensor signal Depending on a sensor signal, a noise signal which suppresses a useful signal spectrum of the sensor signal is determined by filtering using a filter. A noise variable, which is a measure of a noise of the sensor signal, is determined depending on the noise signal. An e... | 03/11/2010 |
| 20100026316 | ELECTRONIC APPARATUS NOISE MEASUREMENT METHOD Second and third ports of a network analyzer are individually connected via cables to predetermined connection points on a differential transmission circuit on an object to be measured. A differential cable is connected to the differential transmission circuit. An anten... | 02/04/2010 |
| 20090278551 | CAPACITIVE SENSORS AND METHODS FOR REDUCING NOISE THEREIN Embodiments of capacitive sensors (500, 600) and methods for reducing noise in capacitive sensors are provided. Embodiments of capacitive sensors include a gain stage (510, 610), a capacitive sensor output, and an active filtered-sampling stage (550, 65... | 11/12/2009 |
| 20090134883 | DEVICE AND METHOD FOR TESTING A NOISE IMMUNITY CHARACTERISTIC OF ANALOG CIRCUITS A method for testing a noise immunity characteristic of an analog circuit of an integrated circuit. The device includes: an analog circuit, an internal stable reference signal source, an internal power supply module connected to the analog circuit and adapted to receive... | 05/28/2009 |
| 20090102490 | APPARATUS FOR PERFORMING A STRESS TEST TO ISOLATE AND MEASURE NOISE IN A PAIRED LINE AND METHOD FOR PERFORMING A STRESS TEST TO ISOLATE AND MEASURE NOISE IN A PAIRED LINE The present invention provides a circuit for performing a stress test on a paired line. The circuit provides for first and second balanced outlet pathways for applying an AC signals to the paired line. Although each of these first and second balanced outlet pathways inc... | 04/23/2009 |
| 20090079441 | ELECTRONIC CIRCUIT COMPRISING A DEVICE TO MEASURE PHASE NOISE OF AN OSCILLATING AND/OR RESONANT DEVICE An electronic circuit includes several (at least two) oscillating and/or resonant devices. The circuit uses a measuring device to measure the phase noise of one of the two oscillating/resonant devices. This measuring device is integrated on a chip on which said oscillat... | 03/26/2009 |
| 20080191710 | Integrated Circuit Arrangement An integrated circuit arrangement has a signal input 20 and a signal output 60, a signal processing unit 100 which is connected to the signal input 20 and to the signal output 60, a noise source 50 for generating a noise signal,... | 08/14/2008 |
| 20080157785 | Method For Determining the State of a Spatially Extended Body The invention relates to a long body, for example a gas-insulated electric line (1), the condition of which is tested by an electronic signal that is supplied to the body and then received by a receiver unit. The electronic signal has a predefined duration and fo... | 07/03/2008 |
| 20080106270 | Apparatus for detecting imbalances in a paired line A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which comprises a balanced center tapped termination consisting of precisely equal resistor pairs. The circuit includes an adjustable sine wave bur... | 05/08/2008 |
| 20080106324 | POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICONDUCTOR DEVIDE To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between p... | 05/08/2008 |
| 20080100308 | Apparatus for detecting imbalances in a paired line A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which comprises a balanced center tapped termination consisting of precisely equal resistor pairs. The circuit includes an adjustable sine wave bur... | 05/01/2008 |
| 20080048675 | A METHOD OF ACCURATELY COMPUTING AMPLITUDE AND PHASE NOISE OF OSCILLATORS AND GENERATING A GENERAL PURPOSE NOISE MODEL OF OSCILLATORS, MIXERS, AND AMPLIFIERS IN FREQUENCY DOMAIN ANALYSIS OF ANALOG ELECTRONIC CIRCUITS AND USING SAME A method of accurately computing amplitude and phase noise of oscillators and generating a general purpose noise model of oscillators, mixers, and amplifiers in frequency domain analysis of analog electronic circuits and using same. A method for computing amplitude jitt... | 02/28/2008 |
| 20080021690 | Simulation method, simulation apparatus, and computer readable medium storing simulation program A circuit analysis portion obtains an output characteristic of each of first noise source candidates. A noise evaluate portion obtains intensity of a noise crosstalking from each of the first noise source candidates to a low noise-tolerance terminal based on a second tr... | 01/24/2008 |
| 20080012575 | Systems and techniques for radio frequency noise cancellation Various embodiments for radio frequency (RF) noise cancellation are described. In one embodiment, an apparatus may comprise an RF noise cancellation system arranged to sense platform noise observed by a radio subsystem, create an inverse version of the sensed platform n... | 01/17/2008 |
| 20070164754 | On-chip high frequency power supply noise sensor The lower power on-chip power supply noise sensor detects high frequency overshoots and undershoots of the power supply voltage. The sensor has two resistor chains that span the full power rail, with a reactive element to form a low pass filter as part of one of the res... | 07/19/2007 |
| 20070164753 | Power supply history monitor A power supply history monitor. The monitor receives a short duration anomalous signal, e.g., from a power supply, and produces a digitized signal representing the anomalous signal as an output. The monitor receives a signal from a signal input, and includes an analog d... | 07/19/2007 |
| 20070030013 | Noise measurement semiconductor apparatus A noise measurement semiconductor apparatus for measuring 1/f noise characteristics generated by a device includes a device to be measured of 1/f noise, a control circuit for providing a control signal to a control terminal of the device, in which the device and the con... | 02/08/2007 |
| 20070007970 | System and method for measuring on-chip supply noise A method and system for measuring noise of an on-chip power supply. In an embodiment, the system comprises a delay line that receives as an input a signal such as a square wave. The delay line may comprise a series of inverters connected to the power supply. The output ... | 01/11/2007 |
| 20060181287 | Testing method A testing method for measuring electromagnetic interference of a noise on a to-be-tested printed circuit board, has the steps of: a) injecting a signal simulating an expected noise of a predetermined device mounted on the to-be-tested printed circuit board, into the to-... | 08/17/2006 |
| 20050248354 | Frequency rectification tool for shorter waveforms A method of detecting a signal (S) of interest contained within a waveform (F) comprised of a plurality of signals within a frequency spectrum, as well as random noise. After first detecting the waveform, a determination is made as to whether the duration (Td) of the wa... | 11/10/2005 |
| 20050218908 | METHOD TO INCLUDE DELTA-I NOISE ON CHIP USING LOSSY TRANSMISSION LINE REPRESENTATION FOR THE POWER MESH The present invention relates to a method for analyzing the noise prediction within one or more electrical circuits, wherein the electrical circuits have a power mesh grid distribution system that feeds power levels to the electrical circuits that are connected by signa... | 10/06/2005 |
| 20050212528 | Power supply noise measuring device According to one embodiment, a signal from a power supply line is caused to pass through a high pass filter, and a first signal is generated by adding a voltage-divided signal to the signal. In addition, a second signal obtained by adding the voltage-divided signal to a... | 09/29/2005 |
