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Patent No. 5926857

Armor With Rollers

An armor with rollers is provided that enables a user to move in all positions by rolling on a hard and smooth surface while constantly varying his bearing points on the ground.

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Class 257/E29.309 - With charge trapping gate insulator (e.g., MNOS-memory transistors) (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E29.255. This subclass
No. of applications: 916
Last issue date: 05/24/2012


1                      
Application No.Application TitleIssue Date
20120126307NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
A non-volatile memory and a manufacturing method thereof are provided. The non-volatile memory includes a substrate, a gate structure, a first doped region, a second doped region and a pair of isolation structures. The gate structure is disposed on the substrate. The ga...
05/24/2012
20120126306NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, a memory cell includes a charge storage layer. A first air gap is provided between charge storage layers adjacent in a word line direction. A second air gap is provided between charge storage layers adjacent in a bit line direction....
05/24/2012
20120127795NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF AND OPERATING METHOD OF MEMORY CELL
A non-volatile memory and a manufacturing method thereof and a method for operating a memory cell are provided. The non-volatile memory includes a substrate, first and second doped regions, a charged-trapping structure, first and second gates and an inter-gate insulatio...
05/24/2012
20120126308NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
A non-volatile memory device includes a plurality of memory cells stacked along a channel protruded from a substrate, a first select transistor connected to one end of the plurality of memory cells, a first interlayer dielectric layer for being coupled between a source ...
05/24/2012
20120126299SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
A semiconductor device is disclosed. The semiconductor device includes a semiconductor substrate; a gate insulating film formed above the semiconductor substrate; a charge storage layer formed above the gate insulating film; a multilayered interelectrode insulating film...
05/24/2012
20120104483NON-VOLATILE MEMORY AND LOGIC CIRCUIT PROCESS INTEGRATION
A method of making a logic transistor in a logic region of a substrate and a non-volatile memory cell in an NVM region of the substrate includes forming a gate dielectric layer on the substrate. A first polysilicon layer is formed on the gate dielectric. The first polys...
05/03/2012
20120104484NONVOLATILE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
A nonvolatile memory device includes a substrate, a stacked structure with conductive materials and first insulating materials and the conductive materials and the first insulating materials are alternately stacked on the substrate, and a plurality of pillars in contact...
05/03/2012
20120104485Nonvolatile Memory Devices And Methods Of Manufacturing The Same
A method of manufacturing a nonvolatile memory device includes forming a tunnel dielectric layer, a charge storage layer, and a hard mask layer on a substrate in sequential order. Active portions are defined by forming trenches in the substrate. A tunnel dielectric patt...
05/03/2012
20120080739NONVOLATILE PROGRAMMABLE LOGIC SWITCH
A nonvolatile programmable logic switch according to an embodiment includes: a memory cell transistor including: a first source region and a first drain region of a second conductivity type formed at a distance from each other in a first semiconductor region of a first ...
04/05/2012
20120080740CHARGE TRAPPING DIELECTRIC STRUCTURES
A dielectric structure may be arranged having a thin nitrided surface of an insulator with a charge blocking insulator over the nitrided surface. The insulator may be formed of a number of different insulating materials such as a metal oxide, a metal oxycarbide, a semic...
04/05/2012
20120068254NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
According to one embodiment, a memory device includes a semiconductor substrate, first, second, third and fourth fin-type stacked layer structures, each having memory strings stacked in a first direction perpendicular to a surface of the semiconductor substrate, and eac...
03/22/2012
20120068255THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES
Three-dimensional (3D) nonvolatile memory devices include a substrate having a well region of second conductivity type (e.g., P-type) therein and a common source region of first conductivity type (e.g., N-type) on the well region. A recess is provided, which extends par...
03/22/2012
20120068251SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, a semiconductor memory device includes a multilayer body, a block layer, a charge storage layer, a tunnel layer, and a semiconductor pillar. The multilayer body includes a plurality of insulating films and electrode films alternately stacked...
03/22/2012
20120068159NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, a nonvolatile semiconductor memory device includes a first memory portion. The first memory portion includes a first base semiconductor layer, a first electrode, a first channel semiconductor layer, a first base tunnel insulating film, a fir...
03/22/2012
20120068252SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, a semiconductor memory device includes a substrate, a multilayer body, a semiconductor member and a charge storage layer. The multilayer body is provided on the substrate, with a plurality of insulating films and electrode films alternately ...
03/22/2012
20120068245NON-VOLATILE MEMORY DEVICES INCLUDING BLOCKING INSULATION PATTERNS WITH SUB-LAYERS HAVING DIFFERENT ENERGY BAND GAPS
A non-volatile memory device may include a semiconductor substrate and an isolation layer on the semiconductor substrate wherein the isolation layer defines an active region of the semiconductor substrate. A tunnel insulation layer may be provided on the active region o...
03/22/2012
20120068257SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, there is provided a semiconductor memory device including an element region, a first gate insulating film, a charge accumulation layer, a second gate insulating film, a control gate electrode, and a control gate electrode. The charge accumul...
03/22/2012
20120049268THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAME
A 3D semiconductor device includes an electrode structure has electrodes stacked on a substrate, semiconductor patterns penetrating the electrode structure, charge storing patterns interposed between the semiconductor patterns and the electrode structure, and blocking i...
03/01/2012
20120049269ISOLATION STRUCTURE, NON-VOLATILE MEMORY HAVING THE SAME, AND METHOD OF FABRICATING THE SAME
A method of forming an isolation structure, comprising: (a) providing a base having a recess; (b) forming a stop layer on the base and in the recess; (c) forming a dielectric material on the stop layer so as to allow the rest of the recess to be filled with the dielectr...
03/01/2012
20120043601NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
In a nonvolatile semiconductor memory device, a stacked body is formed by alternately stacking dielectric films and conductive films on a silicon substrate and a plurality of through holes extending in the stacking direction are formed in a matrix configuration. A shunt...
02/23/2012
20120044760NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND DRIVING METHOD THEREOF
A nonvolatile semiconductor memory device has a first select transistor having a gate electrode connected to a first select word line, a source connected to a first sub bit line, and a drain connected to a first main bit line, and a second select transistor having a gat...
02/23/2012
20120037978NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
A nonvolatile semiconductor memory device is provided in such a manner that a semiconductor layer is formed over a substrate, a charge accumulating layer is formed over the semiconductor layer with a first insulating layer interposed therebetween, and a gate electrode i...
02/16/2012
20120037977SEMICONDUCTOR DEVICES INCLUDING VERTICAL CHANNEL PATTERN
An insulating pattern is disposed on a surface of a semiconductor substrate and includes a silicon oxynitride film. A conductive pattern is disposed on the insulating pattern. A data storage pattern and a vertical channel pattern are disposed within a channel hole forme...
02/16/2012
20120037973NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
A memory cell includes a floating gate electrode, a first inter-electrode insulating film and a control gate electrode. A peripheral transistor includes a lower electrode, a second inter-electrode insulating film and an upper electrode. The lower electrode and the upper...
02/16/2012
20120032252THICKENED SIDEWALL DIELECTRIC FOR MEMORY CELL
Methods and devices are disclosed, such as those involving memory cell devices with improved charge retention characteristics. In one or more embodiments, a memory cell is provided having an active area defined by sidewalls of neighboring trenches. A layer of dielectric...
02/09/2012
20120032248NONVOLATILE SEMICONDUCTOR MEMORY ELEMENT, NONVOLATILE SEMICONDUCTOR MEMORY, AND METHOD FOR OPERATING NONVOLATILE SEMICONDUCTOR MEMORY ELEMENT
According to an aspect of the present invention, there is provided a nonvolatile semiconductor memory element including: a semiconductor substrate including: a source region; a drain region; and a channel region; a lower insulating film that is formed on the channel reg...
02/09/2012
20120032253NONVOLATILE SEMICONDUCTOR MEMORY AND METHOD OF MANUFACTURING THE SAME
A nonvolatile semiconductor memory has a semiconductor substrate, a first insulating film formed on a channel region on a surface portion of the semiconductor substrate, a charge accumulating layer formed on the first insulating film, a second insulating film formed on ...
02/09/2012
20120032249NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
According to one embodiment, a nonvolatile semiconductor memory device includes a multilayer body, a semiconductor pillar, a memory layer, a first insulating film and a second insulating film. The multilayer body includes a plurality of interelectrode insulating films a...
02/09/2012
20120032251NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
First and second memory cells have first and second channels, first and second tunnel insulating films, first and second charge storage layers formed of an insulating film, first and second block insulating films, and first and second gate electrodes. A first select tra...
02/09/2012
20120032250SEMICONDUCTOR DEVICES
A semiconductor device can include a first substrate and conductive patterns on the first substrate, where the conductive patterns are disposed in stacks vertically extending from the substrate. An active pillar can be on the first substrate vertically extend from the f...
02/09/2012
20120025297NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
According to one embodiment, a nonvolatile semiconductor memory device includes a source region and a drain region provided on a surface area of a semiconductor region, a tunnel insulating film provided on a channel between the source region and the drain region, a char...
02/02/2012
20120018790NON-VOLATILE MEMORY AND FABRICATING METHOD THEREOF
A non-volatile memory including a substrate, a stacked gate structure, two doped regions and a plurality of spacers is provided. The stacked gate structure is disposed on the substrate, wherein the stacked gate structure includes a first dielectric layer, a charge stora...
01/26/2012
20120018795NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
A manufacturing method of a non-volatile memory is disclosed. A gate structure is formed on a substrate and includes a gate dielectric layer and a gate conductive layer. The gate dielectric layer is partly removed, thereby a symmetrical opening is formed among the gate ...
01/26/2012
20120019284Normally-Off Field Effect Transistor, a Manufacturing Method Therefor and a Method for Programming a Power Field Effect Transistor
A normally-off power field-effect transistor semiconductor structure is provided. The structure includes a channel, a source electrode, a gate electrode and trapped charges which arranged between the gate electrode and the channel such that the channel is in an off-stat...
01/26/2012
20120018796NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
According to one embodiment, a nonvolatile semiconductor memory device includes first and second stacked structures, first and second semiconductor pillars, first and second memory units, and a semiconductor connection portion. The stacked structures include electrode f...
01/26/2012
20120018797NONVOLATILE MEMORY DEVICE, AND METHODS OF MANUFACTURING AND DRIVING THE SAME
A nonvolatile memory device includes a device isolation film defining an active region in a semiconductor substrate, a pocket well region formed in an upper portion of the active region and having a first conductivity type, a gate electrode formed on the active region a...
01/26/2012
20120012920VERTICAL NON-VOLATILE MEMORY DEVICE
A vertical non-volatile memory device includes a semiconductor pattern disposed on a substrate; and a plurality of transistors of first through n-th layers that are stacked on a side of the semiconductor pattern at predetermined distances from each other, wherein the tr...
01/19/2012
201200071673D Memory Array With Improved SSL and BL Contact Layout
A 3D memory device includes a plurality of ridges, in some embodiments ridge-shaped, in the form of multiple strips of conductive material separated by insulating material, arranged as bit lines which can be coupled through decoding circuits to sense amplifiers. The str...
01/12/2012
20120008400NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME
A non-volatile semiconductor storage device includes: a memory string; a select transistor; and a carrier selection element. The select transistor has one end connected to one end of the memory string. The carrier selection element has one end connected to the other end...
01/12/2012
20120001247ULTRAHIGH DENSITY VERTICAL NAND MEMORY DEVICE AND METHOD OF MAKING THEREOF
Monolithic, three dimensional NAND strings include a semiconductor channel, at least one end portion of the semiconductor channel extending substantially perpendicular to a major surface of a substrate, a plurality of control gate electrodes having a strip shape extendi...
01/05/2012
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