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Class 257/78 - II-VI compound


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: Subject matter wherein the specified wide band gap material
No. of applications: 16
Last issue date: 11/03/2011


Application No.Application TitleIssue Date
20110269261DEVICES AND METHODS OF PROTECTING A CADMIUM SULFIDE FOR FURTHER PROCESSING
Methods for protecting a cadmium sulfide layer on a substrate are provided. The method can include sputtering a cadmium sulfide layer onto a substrate from a cadmium sulfide target at a sputtering pressure (e.g., about 10 mTorr to about 150 mTorr), and sputtering a cap ...
11/03/2011
20110140129LIGHT SOURCE WITH IMPROVED MONOCHROMATICITY
Light emitting systems are disclosed. The light emitting system includes an LED that emits light at a first wavelength and includes a pattern that enhances emission of light from a top surface of the LED and suppresses emission of light from one or more sides of the LED...
06/16/2011
20110140128MONOCHROMATIC LIGHT SOURCE WITH HIGH ASPECT RATIO
Light emitting systems are disclosed. The light emitting system includes an LED that emits light at a first wave-length. A primary portion of the emitted first wavelength light exits the LED from a top surface of the LED that has a minimum lateral dimension Wmin. The re...
06/16/2011
20110121319SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD OF MAKING SAME
Light emitting devices and methods of fabricating the same are disclosed. The light emitting device includes a light emitting diode (LED) that emits blue or UV light and is attached to a semiconductor construction. The semiconductor construction includes a re-emitting s...
05/26/2011
20100084664ZINC SULFIDE SUBSTRATES FOR GROUP III-NITRIDE EPITAXY AND GROUP III-NITRIDE DEVICES
A semiconductor structure includes a substrate which may be formed from a ZnS single crystal of wurtzite (2H) structure with a predetermined crystal orientation, and which has a first surface and a second surface. The structure includes a layer of a group III-nitride cr...
04/08/2010
20080020552Semiconductor substrates having low defects and methods of manufacturing the same
A semiconductor substrate includes a first semiconductor layer and a second semiconductor layer. The first semiconductor layer is formed of II-VI-group semiconductor material, III-V-group semiconductor material, or II-VI-group semiconductor material and III-V-group semi...
01/24/2008
20070131161DESIGN AND FABRICATION OF 6.1-A FAMILY SEMICONDUCTOR DEVICES USING SEMI-INSULATING ALSB SUBSTRATE
For the first time, an aluminum antimonide (AlSb) single crystal substrate is utilized to lattice-match to overlying semiconductor layers. The AlSb substrate establishes a new design and fabrication approach to construct high-speed, low-power electronic devices while es...
06/14/2007
20070128746GROUP III NITRIDE CRYSTAL AND MANUFACTURING METHOD THEREOF
A group III nitride crystal containing therein an alkali metal element comprises a base body, a first group III nitride crystal formed such that at least a part thereof makes a contact with the base body, the first group III nitride crystal deflecting threading dislocat...
06/07/2007
20070102709P-TYPE GROUP II-VI SEMICONDUCTOR COMPOUNDS
A persistent p-type group II-VI semiconductor material is disclosed. The group II-VI semiconductor includes atoms of group II elements, atoms of group VI elements, and one or more p-type dopants. The p-type dopant concentration is sufficient to render the group II-VI se...
05/10/2007
20060160345Innovative growth method to achieve high quality III-nitride layers for wide band gap optoelectronic and electronic devices
A method to achieve high quality III-nitride epitaxial layers including AlN, AlGaN, GaN, InGaN, and AlInGaN, by supplying group III precursors constantly and group V precursors periodically with the epitaxial growth systems including metal organic chemical vapor deposit...
07/20/2006
20060011925Radiation-emitting semiconductor element and method for producing the same
This invention describes a radiation-emitting semiconductor component based on GaN, whose semiconductor body is made up of a stack of different GaN semiconductor layers (1). The semiconductor body has a first principal surface (3) and a second principal su...
01/19/2006
20050280006Semiconductor device having low interface state density and method for fabricating the same
The semiconductor device comprises an intermediate layer formed on a semiconductor substrate 6, the intermediate layer 12 being formed of an oxide containing a first element which is either of a III group element and a V group element, an insulation film f...
12/22/2005
20050218411Hafnium nitride buffer layers for growth of GaN on silicon
Gallium nitride is grown by plasma-assisted molecular-beam epitaxy on (111) and (001) silicon substrates using hafnium nitride buffer layers. Wurtzite GaN epitaxial layers are obtained on both the (111) and (001) HfN/Si surfaces, with crack-free thickness up to 1.2 Om. ...
10/06/2005
20050199883Method for depositing a group III-nitride material on a silicon substrate and device therefor
The present invention is related to a device comprising a substrate comprising a silicon substrate having a porous top layer, a second layer on said top layer, said second layer made of a material comprising Ge, and a further layer of a Group III-nitride material on the...
09/15/2005
20050079650Device including an amorphous carbon layer for improved adhesion of organic layers and method of fabrication
A novel device, such as a semiconductor device, a microfluidic device, a surface acoustic wave device an imprint template, or the like, including an amorphous carbon layer for improved adhesion of organic layers and method of fabrication. The device includes a substrate...
04/14/2005
20050001218Double-gated transistor circuit
An OR gate circuit includes double-gated four terminal transistor with independent gate control. First and second inputs are independently coupled to the top and bottom gates of the transistor. The drain is coupled to an output and precharged to a low voltage. An input ...
01/06/2005
 
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