Class 250/440.11 - Analyte supports

Subclass of Class 250 - Radiant energy
Definition: Subject matter comprising structure for positioning or holding
No. of applications: 39
Last issue date: 02/02/2012

Application No.	Application Title	Issue Date
20120027650	METHODS AND DEVICES FOR PREPARING MICROSCOPY SAMPLES A system for preparing and holding specimens for microscopic analysis including a capsule having an open end, an opposite end including at least one aperture and a reservoir. The system also includes an insert with a base including at least one aperture. The insert fits...	02/02/2012
20110297827	CHARGED PARTICLE BEAM DEVICE An object of the present invention is related to detecting of a detection signal at an optimum position in such a case that a sample plane is inclined with respect to a charged particle beam. The present invention is related to a charged pa...	12/08/2011
20110284745	Sample Holder, Inspection Apparatus, and Inspection Method A sample holder, inspection apparatus, and an inspection method using the sample holder having a film including a first surface and a second surface. A liquid sample may be held on the first surface. The film is made of two or more layers. A primary beam irradiation dev...	11/24/2011
20110260056	AUXILIARY STAGE AND METHOD OF UTILIZING AUXILIARY STAGE An auxiliary stage for holding an electron microscope specimen includes a bottom part and a supporting part . The bottom part includes a first top surface, and the supporting part includes a second top surface and a side surface. The supporting part is fixed on the firs...	10/27/2011
20110240881	SPECIMEN HOLDER AND SPECIMEN HOLDER MOVEMENT DEVICE The present disclosure significantly reduces the waiting time from inserting a specimen holder into an electron microscope until high quality data acquisition is possible. Characterizing the present disclosure, it is a specimen holder partly made of low thermal expansio...	10/06/2011
20110238225	METHOD AND SYSTEM FOR AUTOMATING SAMPLE PREPARATION FOR MICROFLUIDIC CRYO TEM A method and system is provided for automatically preparing transmission electron microscopy (TEM) samples for examination by depositing extremely small samples onto a grid without need for a blotting step. A sample liquid droplet is formed at the end of a capillary, wh...	09/29/2011
20110226960	CARBON NANOTUBE FILM COMPOSITE STRUCTURE, TRANSMISSION ELECTRON MICROSCOPE GRID USING THE SAME, AND METHOD FOR MAKING THE SAME The present disclosure relates to a transmission electron microscope grid including graphene sheet-carbon nanotube film composite. The graphene sheet-carbon nanotube film composite structure includes at least one carbon nanotube film structure and at least one functiona...	09/22/2011
20110204225	ION Beam System and Machining Method An ion beam machining system which performs a predetermined machining of a sample by irradiating the sample with an ion beam includes a beam spot former which forms a beam spot shape of the ion beam to be non-axially symmetric in a perpendicular plane with respect to an...	08/25/2011
20110192987	TRANSMISSION ELECTRON MICROSCOPE MICRO-GRID A transmission electron microscope (TEM) micro-grid includes a base and a plurality of electron transmission portions. The base includes a plurality of first carbon nanotubes and the first carbon nanotubes have a first density. Each electron transmission portions includ...	08/11/2011
20110192988	TRANSMISSION ELECTRON MICROSCOPE MICRO-GRID AND METHOD FOR MANUFACTURING THE SAME A transmission electron microscope (TEM) micro-grid includes a pure carbon grid having a plurality of holes defined therein and at least one carbon nanotube film covering the holes. A method for manufacturing a TEM micro-grid includes following steps. A pure carbon grid...	08/11/2011
20110155906	TRANSMISSION ELECTRON MICROSCOPE APPARATUS COMPRISING ELECTRON SPECTROSCOPE, SAMPLE HOLDER, SAMPLE STAGE, AND METHOD FOR ACQUIRING SPECTRAL IMAGE A transmission electron microscope apparatus, a sample holder and a sample stage and a method for acquiring spectral images as well are provided which can acquire spectral images at a time from a plurality of samples and measure highly accurate chemical shifts from elec...	06/30/2011
20110140729	INSPECTION DEVICE An object of the invention is to provide an inspection device which has a function of preventing electric discharge so that an absorbed current is detected more efficiently. In the invention, absorbed current detectors are mounted in a vacu...	06/16/2011
20110101222	Z-STAGE CONFIGURATION AND APPLICATION THEREOF A stage configuration is provided, wherein a ceramic plate is used as the z-stage body to decrease the use of the metal plates in the conventional configuration, so that the compact structure of the z-stage may decrease the vibrational movements of the z-stage. Further,...	05/05/2011
20110017921	Carbon nanotube film composite structure, transmission electron microscope grid using the same, and method for making the same The present invention relates to a transmission electron microscope grid including graphene sheet-carbon nanotube film composite. The graphene sheet-carbon nanotube film composite structure includes at least one carbon nanotube film structure and at least one graphene s...	01/27/2011
20110006208	Method for Inspecting a Sample The invention describes a method for inspecting samples in an electron microscope. A sample carrier 500 shows electrodes 504, 507 connecting pads 505, 508 with areas A on which the sample is to be placed. After placing ...	01/13/2011
20100276607	Method of depositing protective structures A process of preparing a lamella from a substrate includes manufacturing a protection strip on an edge portion of the lamella to be prepared from the substrate, and preparing the lamella, wherein the manufacturing the protection strip includes a first phase of activatin...	11/04/2010
20100264330	CHARGED PARTICLE BEAM APPLICATION APPARATUS An apparatus capable of improving image quality by making it possible to suck specimens of different sizes electrostatically, and uniformalizing an electric field of a specimen edge portion, while suppressing increase in prime cost is provided. Specimen holding means is...	10/21/2010
20100224780	BEAM DEVICE SYSTEM COMPRISING A PARTICLE BEAM DEVICE AND AN OPTICAL MICROSCOPE A beam device, in particular a particle beam device, for analyzing an object is provided, as well as a system comprising a particle beam device and an optical microscope for optically analyzing an object. The beam device simplifies the exchange and reduces the time of t...	09/09/2010
20100155620	TEM GRIDS FOR DETERMINATION OF STRUCTURE-PROPERTY RELATIONSHIPS IN NANOTECHNOLOGY Silicon grids with electron-transparent SiO₂windows for use as substrates for high-resolution transmission electron microscopy of chemically-modified SiO₂surfaces are fabricated by forming an oxide layer on a silicon substrate. An aperture is def...	06/24/2010
20100140497	MEMBRANE SUPPORTS WITH REINFORCEMENT FEATURES A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscop...	06/10/2010
20100102248	Transmission Electron Microscope Sample Holder with Optical Features A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optic...	04/29/2010
20100038557	ADDRESSABLE TRANSMISSION ELECTRON MICROSCOPE GRID A planar substrate for electrochemical experimentation provides multiple isolated electrical conductors sandwiched between insulating layers of ultrananocrystaline diamond. The isolated electrical conductors may attach to conductive pads at the periphery of the substrat...	02/18/2010
20090242794	Charged particle beam equipment Charged particle beam equipment has a processing unit for calibrating dimension values of an enlarged specimen image, and means for changing the amount by which a charged particle beam is scanned. Also, a specimen stand has a mechanism for holding a specimen having a pe...	10/01/2009
20090212233	MALDI CHIP HOLDER The invention relates to a holder for a MALDI chip, having a broken corner contour, comprising a first and second respectively accessible bearing surface and a moveable fixing means which interacts with the broken corner contour and which pre-tenses the MALDI chip again...	08/27/2009
20090065708	MOON GRID FOR TRANSMISSION ELECTRON MICROSCOPY TOMOGRAPHY AND METHOD OF FABRICATING THE SAME Disclosed is a moon grid for transmission electron microscopy tomography, including a mesh sheet for protecting an upper objects and a support film formed on the mesh sheet and having nanoparticles dispersed throughout, in which the nanoparticles dispersed throughout th...	03/12/2009
20090000363	Materials and Methods for Identifying Biointeractive Nanostructures and/or Nanoparticles Disclosed herein are surface force microscope probes comprising living cells adhered thereto, as well as methods of making same. Also disclosed is a system for high throughput screening of nanostructures having biological relevance through use of surface force microscop...	01/01/2009
20080315097	Charged particle beam apparatus and specimen holder Information of a specimen holder or information of a specimen mounted on the specimen holder is stored in a memory inside the specimen holder mounted to an electron microscope. The memory is accessed to transmit the information of the specimen holder to the electron mic...	12/25/2008
20080308731	Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection Method, and Method of Fabricating Specimen Holder A specimen holder, a specimen inspection apparatus, and a specimen inspection method permitting a specimen consisting of cultured cells to be observed or inspected. Also, a method of fabricating the holder is offered. The holder has an open specimen-holding surface. At ...	12/18/2008
20080308743	CHARGED PARTICLE BEAM APPLICATION APPARATUS An apparatus capable of improving image quality by making it possible to suck specimens of different sizes electrostatically, and uniformalizing an electric field of a specimen edge portion, while suppressing increase in prime cost is provided. Specimen holding means is...	12/18/2008
20080251736	Charged Particle Gun An electron gun (1) includes an emitter (2), a tubular support (3) and an adaptor (4) for receiving the emitter. The adaptor includes a tapered plugging surface (7) and the tubular support includes a correspondingly tapered seating sur...	10/16/2008
20080185519	Charged particle beam apparatus A technology whereby removal of magnetic hysteresis is enabled in short time in parallel with a process for stage transfer, and so forth. There is executed a magnetic hysteresis removal sequence whereby current for exciting an electromagnetic coil prior to acquisition o...	08/07/2008
20080185286	METHOD FOR THINNING A SAMPLE AND SAMPLE CARRIER FOR PERFORMING SAID METHOD The invention describes a sample carrier (3) for thinning a sample (1) taken from e.g. a semiconductor wafer. The sample carrier comprises a ridged part (5), e.g. made of e.g. copper, with an outer boundary (6), and a supporting film (4	08/07/2008
20080135778	SPECIMEN KIT AND FABRICATING METHOD THEREOF A specimen kit for enclosing a specimen is described, including a first substrate, a second substrate and a sealant. The first substrate has a first observation window at which a thickness thereof is smaller than that of the other parts thereof. The second substrate has...	06/12/2008
20080135779	Ion Beam System And Machining method An ion beam system includes a sample stage which holds a sample, an irradiation optical system which irradiates a sample held on the sample stage by an ion beam, and a charged particle beam observation system for observing a cross-section of the sample which is machined...	06/12/2008
20080073561	Lithographic apparatus and device manufacturing method A stage system for a lithographic apparatus is presented and includes a movable stage, and a stationary motor coil assembly including coils to interact with a magnet of the movable stage to thereby form a moving magnet motor to drive the stage. The stage system also inc...	03/27/2008
20080067415	ALIGNMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD At least one exemplary embodiment is directed to an alignment apparatus which includes a moving member, a structural object arranged on the moving member, and an electromagnetic actuator which moves the structural object relative to the moving member. The electromagneti...	03/20/2008
20070158583	Disk assembly of ion implanter A disk assembly of an ion implanter includes a disk rotating in one direction, at least one wafer site on the disk for holding a wafer, at least one fence positioned outside an outer edge of the at least one wafer site and perpendicularly to the disk, a finger positione...	07/12/2007
20070145289	Closed observational device for electron microscope A closed observational device for an electron microscope is formed of a housing. The housing includes a liquid chamber formed therein, at least one view hole formed at each of a top side thereof and a bottom side thereof and communicating with the liquid chamber and coa...	06/28/2007
20070145287	Specimen box for electron microscope capable of observing general specimen and live cell A specimen box for an electron microscope capable of observing a general specimen or a live cell is formed of a housing. The housing includes a receiving chamber formed therein and at least one view hole formed on each of a top side thereof and a bottom side thereof and...	06/28/2007

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Class 250/440.11 - Analyte supports