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Attorney: Wenderoth, Lind & Ponach, L.L.P.


Number of patents: 1
Last date: April 24, 2007

NumberTitleIssue Date
7207862Polishing apparatus and method for detecting foreign matter on polishing surface
A polishing apparatus comprises a polishing tool having a polishing surface, and a holder device (top ring) for holding a semiconductor wafer (a substrate). The polishing apparatus further comprises a color CCD camera for taking a color image of a region on the poli...
04/24/2007
 
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