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| Number | Title | Issue Date |
| 6318159 | Scanning force microscope with automatic surface engagement The vibrating probe of a scanning force microscope is brought into engagement with a sample surface in an initial approach process moving the probe toward the sample surface until the amplitude of probe vibration at an excitation frequency is measurably a... | 11/20/2001 |
| 6234009 | Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface The vibrating probe of a scanning force microscope is brought into engagement with a sample surface in an initial approach process moving the probe toward the sample surface until the amplitude of probe vibration at an excitation frequency is measurably a... | 05/22/2001 |
| 6220084 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope A scanning probe microscope operates in the manner of an atomic force microscope during intermittent periods of scanning motion, in which a sample surface is driven so that a scan line on the surface is moved past a probe tip being vibrated in engagement ... | 04/24/2001 |
| 6178180 | Communications adapter for processing ATM and ISDN data A communications adapter card provides an interface for a TI or E1 transmission line and a signal processing circuit which can be programmed to process receive and transmit data in either an ISDN or an ATM format. Preferably, two such interfaces and two s... | 01/23/2001 |
| 6167753 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope A scanning probe microscope operates in the manner of an atomic force microscope during intermittent periods of scanning motion, in which a sample surface is driven so that a scan line on the surface is moved past a probe tip being vibrated in engagement ... | 01/02/2001 |
| 6103990 | Laser texturing system providing even heating of textured spots on a rotating disk Laser texturing apparatus includes an acousto-optical modulator which deflects a continuous laser beam into a first optical projection path to texture a first side of a disk or into a second optical projection path to texture a second side of the disk. Th... | 08/15/2000 |
| 6093930 | Automatic probe replacement in a scanning probe microscope A scanning probe microscope having a probe attachment fixture, to which a probe assembly is removably attached during measurements, driven in an engagement direction, and a sample stage driven in scanning directions perpendicular to the engagement directi... | 07/25/2000 |
| 6065131 | Multi-speed DSP kernel and clock mechanism The processing speed of a digital signal processor or system processor is controlled in accordance with the functions required in a task to be performed by the device, with these functions being compared to a table of maximum processing speeds at which va... | 05/16/2000 |
| 6023171 | Dual-contact probe tip for flying probe tester A dual contact probe tip is provided within a flying probe circuit tester to make separate electrical contacts with a circuit under test at two closely-spaced test points. The tip includes a mounting block having an attachment section attached to a carria... | 02/08/2000 |
| 6008660 | Method for developing circuit capacitance measurements corrected for stray capacitance Accuracy of capacitance measurements taken with flying probes--probes that are movable relative to each other and surfaces of an object containing circuits being tested (e.g. a printed circuit board)--is improved by dynamically applying corrections for st... | 12/28/1999 |
| 6003863 | Apparatus and method for conveying a flexible sheet through manufacturing processes A flexible sheet to which manufacturing processes are to be applied is tensioned within a carrying fixture having tacky surfaces to which the flexible sheet is fastened. One version of the fixture includes an "L"-shaped attachment surface on a frame membe... | 12/21/1999 |
| 5973666 | Method and means for controlling the concurrent execution of a plurality of programs on a computer system A television style channel (program) changer switch is electrically coupled to the central processing unit of a computer system. A user defined lookup table assigns switch positions to programs available for execution in the system. Program controlled mea... | 10/26/1999 |
| 5951891 | Optical apparatus for monitoring profiles of textured spots during a disk texturing process A disk texturing tool is used, for example, to provide textured spots in an annular portion of both sides of a hardfile disk. An optical system includes a laser directed at a beamsplitter to split the laser beam into two beams having approximately equal p... | 09/14/1999 |
| 5940304 | Controlling a laser texturing tool having two handling stations for disks to be textured and a single texturing station A disk texturing tool is used, for example, to provide textured spots in an annular portion of both sides of a hardfile disk. Disks are moved into and out of the texturing process in cassettes, through two disk-handling stations. Control of the tool is ac... | 08/17/1999 |
| 5929983 | Optical apparatus for determining the height and tilt of a sample surface A device is provided for determining the height and/or tilt of local features on the surface of a sample. The device includes a laser projecting a collimated beam at an oblique angle at a reflection point on the sample surface and a converging lens having... | 07/27/1999 |
| 5926266 | Optical apparatus for rapid defect analysis Apparatus for inspecting the surface of a sample includes a wide scanning interferometer, which is used to locate defects, or anomalies in the surface, and a narrow scanning interferometer, which is used to develop profiles of individual defects found by ... | 07/20/1999 |
| 5907096 | Detecting fields with a two-pass, dual-amplitude-mode scanning force microscope A scanning probe microscope is used as an atomic force microscope during a first pass of a vibrating probe tip along a line extending along a sample surface, with data representing topographical features occurring along the line being stored. In a second ... | 05/25/1999 |
| 5902928 | Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator A scanning probe microscope includes a segmented piezoelectric actuator having a course segment and a fine segment, the outputs of which are combined to determine the movement of a distal end of the actuator, to which the probe is mechanically coupled. Mo... | 05/11/1999 |
| 5891295 | Fixture and method for carrying a flexible sheet under tension through manufacturing processes A flexible sheet to which manufacturing processes are to be applied is tensioned within a carrying fixture having tacky surfaces to which the flexible sheet is fastened. One version of the fixture includes an "L"-shaped attachment surface on a frame membe... | 04/06/1999 |
| 5877858 | Textured surface monitoring and control apparatus Optical apparatus is provided for inspecting a textured surface measures a level of scattered reflections from the surface, occurring when an inspection laser beam is directed at the surface. In a first version of the apparatus, the intensity of scattered... | 03/02/1999 |
| 5830514 | Controlling pulses in a laser texturing tool A disk texturing tool is used, for example, to provide textured spots in an annular portion of both sides of a hardfile disk. Disks are moved into and out of the texturing process in cassettes, through two disk-handling stations. Texturing occurs as the a... | 11/03/1998 |
| 5822211 | Laser texturing apparatus with dual laser paths having an independently adjusted parameter A disk texturing process uses a single pulsed laser to texture disks within a first group, which are carried through the texturing process on a first spindle assembly, and from a second group, which are carried through the texturing process on a second sp... | 10/13/1998 |
| 5801381 | Method for protecting a probe tip using active lateral scanning control A scanning probe microscope includes a detection mechanism producing a feedback signal indicating a condition of engagement between the scanning probe and the surface of a sample being examined. When this engagement is above a threshold level, the lateral... | 09/01/1998 |
| 5778527 | Apparatus and method for forming "L"-shaped terminals from structures stamped in a flat strip and for inserting such terminals into an electronic package A method is provided for processing a number of "L"-shaped sections within a flat strip to form terminals extending from a component. In the strip, these sections are attached to a web by connecting portions. A number of such sections are simultaneously p... | 07/14/1998 |
| 5775567 | Apparatus for wirebonding using a tubular piezoelectric ultrasonic transducer In ultrasonic wirebonding apparatus, vibrations produced using a tubular piezoelectric (piezoceramic) actuator, driven by electrical current at an ultrasonic frequency, are used to provide energy for the wirebonding process. An assembly including means fo... | 07/07/1998 |
| 5774224 | Linear-scanning, oblique-viewing optical apparatus Microscopic apparatus for inspecting electronic circuit chips includes an illumination source directing light at a chip at an oblique angle with respect to a normal plane perpendicular to its surface. To take advantage of specular reflection, a lens is ar... | 06/30/1998 |
| 5773824 | Method for improving measurement accuracy using active lateral scanning control of a probe A scanning probe microscope includes probe moved into and out of engagement with a sample surface by a combination of deflections occurring within a fast actuator, having a relatively small range of motion, and a slow actuator, having a relatively large r... | 06/30/1998 |
| 5767957 | Testing an optical cable having multiple fibers by the application of a light pulse to all fibers through optical jumpers of incrementally varying lengths A device for testing multi-fiber optical cables includes a number of test stations into which an end of a cable under test is plugged. Some to the test stations provide for the attachment of an array connector, while others provide for the attachment of a... | 06/16/1998 |
| 5710631 | Apparatus and method for storing interferometric images of scanned defects and for subsequent static analysis of such defects An interferometer is used to locate and examine defects in a test surface of a test specimen. Defects are first located as the test surface is driven past the objective of the interferometer at a constant speed, with a darkfield interferogram being examin... | 01/20/1998 |
| 5699160 | Optical apparatus for inspecting laser texture Inspection apparatus for determining the profile of textured spots extending in a pattern along a surface of a magnetic disk includes an interferometer which illuminates first and second, adjacently disposed test spots on the surface. The disk and the int... | 12/16/1997 |
| 5686820 | Voltage regulator with a minimal input voltage requirement A voltage regulator, providing a constant-voltage output through an output terminal, includes an operational amplifier and an output stage driven by an output of the amplifier. A voltage reference is applied to a negative input terminal of the amplifier, ... | 11/11/1997 |
| 5631856 | Test sequence optimization process for a circuit tester The sequential order of movements of a number of probes within a circuit test fixture is optimized through the use of an algorithm which sequentially orders test configurations provided in an input list. Each test configuration corresponds to the location... | 05/20/1997 |
| 5596280 | Apparatus and method for testing circuits by the response of a phase-locked loop A PLL (phase-locked loop) circuit is used in apparatus for testing individual circuits in circuit devices. The PLL circuit operates at an input frequency provided by the output of an input oscillator when this oscillator is connected to one of the inputs ... | 01/21/1997 |
| 5530546 | Method and apparatus for testing fiber optic jumpers A station for testing fiber optic jumper cables includes four indexing plugboard stations. A single cable to be tested is typically attached to extend between two of the plugboard stations. Each plugboard station includes three columns of plug positions, ... | 06/25/1996 |
| 5334038 | High density connector with sliding actuator An electrical connector for removably receiving a daughter card includes a first group of contact springs, which extend in their free, undeflected state into a card-receiving slot, and a second group of contact springs, which are displaced from this slot ... | 08/02/1994 |
| 5308248 | High density interconnection system A daughter card is provided with an insertion portion, including a row of contact pads on each side of an edge prepared for insertion into the slot of card edge connector, and a contact structure extending from one or both sides of the card. Contact termi... | 05/03/1994 |
| 5288241 | Cable locking covers Cover assemblies, capable of being locked and unlocked by means of a key, are configured to be placed over the connectors at each end of an external computer system cable. When these cover assemblies are locked in place, the cable cannot be unplugged from... | 02/22/1994 |
| 5083931 | Device grounding spring Electrical grounding is provided for an optional device in a computer system, and a gap of varying width adjacent to the device is filled with a conductive shield, by means of a flexible grounding spring having a folded central section from which tabs ext... | 01/28/1992 |
