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| Number | Title | Issue Date |
| 8173938 | Controller for a heating cable A controller for a heating cable. The heating cable includes first and second conductors and a separation layer interposed between the conductors. The conductors and the separation layer extend along the length of the cable and electrical resistance provided by the ... | 05/08/2012 |
| 8117293 | Method of receiving, storing, and providing device management parameters and firmware updates to application programs within a mobile device A method for the efficient persistent storage of Device Management (DM) information on a mobile device is provided. More specifically, the present design provides methods for applications to access and update this information consistent with the Open Mobile Alliance... | 02/14/2012 |
| 8101051 | Combustion gas generation device and on-vehicle combustion gas generation device using electrolysis A large amount of a gas mixture of hydrogen and oxygen can be effectively generated over a long time. A positive electrode and a negative electrode are immersed in an electrolytic cell filled with an electrolytic solution, and a DC or AC voltage is applied across th... | 01/24/2012 |
| 8092352 | Bicycling exercise apparatus with multiple element load dispersion An apparatus permitting a user to perform a simulated bicycling exercise is provided. The design includes a frame and a first (lower front) mounting point including a multiple element distributed load arrangement and a second (upper rear) mounting point configured t... | 01/10/2012 |
| 8020565 | Modulated pulsed ultrasonic power delivery system and method A method and apparatus for delivering energy during a surgical procedure such as phacoemulsification is provided. The method and apparatus include applying energy during at least one pulsed energy on period, typically sufficient or intended to rapidly induce and ben... | 09/20/2011 |
| 7952633 | Apparatus for continuous clocking of TDI sensors A method and apparatus for propagating charge through a sensor and implementation thereof is provided. The method and apparatus may be used to inspect specimens, the sensor operating to advance an accumulated charge between gates of the TDI sensor. The design implem... | 05/31/2011 |
| 7938120 | Enhanced microburst ultrasonic power delivery system and method A method and apparatus for delivering energy during a surgical procedure such as phacoemulsification is provided. The method and apparatus include applying energy during at least one pulsed energy on period, comprising applying energy during a series of short burst ... | 05/10/2011 |
| 7924892 | Fiber amplifier based light source for semiconductor inspection A laser illuminator for use in an inspection system, such as a semiconductor wafer inspection system or photomask inspection system is provided. The gain medium in the illuminator comprises optical fiber, and amplification, beam splitting, frequency and/or bandwidth... | 04/12/2011 |
| 7884998 | Catadioptric microscope objective employing immersion liquid for use in broad band microscopy An objective for imaging specimens is disclosed. The objective receives light energy from a light energy source configured to provide light energy in a wavelength range of approximately 480 to 660 nanometers, employs a Mangin mirror arrangement in conjunction with a... | 02/08/2011 |
| 7846126 | System and method for modulated surgical procedure irrigation and aspiration A method and apparatus for performing modulated fluid delivery and aspiration during a surgical procedure such as phacoemulsification is provided. The method and apparatus include delivering fluid and/or aspirating fluid in a modulated or pulsed manner during a surg... | 12/07/2010 |
| 7869121 | Small ultra-high NA catadioptric objective using aspheric surfaces A relatively high NA objective employed for use in imaging a specimen is provided. The objective includes a lens group having at least one focusing lens configured to receive light energy and form an intermediate image, at least one field lens oriented to receive th... | 01/11/2011 |
| 7842005 | System and method for pulsed ultrasonic power delivery employing cavitational effects A method and apparatus for delivering energy during a surgical procedure such as phacoemulsification is provided. The method and apparatus include delivering energy during a surgical procedure, including applying energy at a level and for a time period sufficient to... | 11/30/2010 |
| 7818229 | Method for future payment transactions A method for the online modification, submission and approval processing of a future payment request to afford a user the ability to renegotiate established loan agreement debt terms in which network communications are established between a user, such as a debtor, a... | 10/19/2010 |
| 7817260 | Beam delivery system for laser dark-field illumination in a catadioptric optical system A method and apparatus for inspecting a specimen are provided. The apparatus comprises a primary illumination source, a catadioptric objective exhibiting central obscuration that directs light energy received from the primary illumination source at a substantially n... | 10/19/2010 |
| 7814005 | Dynamic credit score alteration A method for providing credit score information for a user to the user is provided. The method comprises offering the user an option to obtain information related to a credit score via a computer networking arrangement. The method further determines credit score inf... | 10/12/2010 |
| 7773296 | Ultra-broadband UV microscope imaging system with wide range zoom capability An ultra-broadband ultraviolet (UV) catadioptric imaging microscope system with wide-range zoom capability. The microscope system, which includes a catadioptric lens group and a zooming tube lens group, has high optical resolution in the deep UV wavelengths, continu... | 08/10/2010 |
| 7728968 | Excimer laser inspection system A system and method for inspecting a specimen, such as a semiconductor wafer, including illuminating at least a portion of the specimen using an excimer source using at least one relatively intense wavelength from the source, detecting radiation received from the il... | 06/01/2010 |
| 7698698 | Method for over-the-air firmware update of NAND flash memory based mobile devices A method for receiving, storing, and applying an update package to modify an original image stored within non-volatile flash memory devices. More specifically, the present design provides a download agent responsible for communicating with a server to transfer and s... | 04/13/2010 |
| 7664310 | Advanced phase shift inspection method A method and apparatus for inspecting patterned transmissive substrates, such as photomasks, for unwanted particles and features occurring on the transmissive as well as pattern defects. A transmissive substrate is illuminated by a laser through an optical system co... | 02/16/2010 |
| 7663746 | Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first po... | 02/16/2010 |
| 7661102 | Method for reducing binary image update package sizes A system and method for reducing the update package size used to convert an original image into a new image based on the differences between the two images. From comparison of original and new images, an update package is generated which includes ADD and COPY operat... | 02/09/2010 |
| 7646533 | Small ultra-high NA catadioptric objective A relatively high spectral bandwidth objective employed for use in imaging a specimen and method for imaging a specimen is provided. The objective includes a lens group having at least one focusing lens configured to receive light energy and form focused light energ... | 01/12/2010 |
| 7639419 | Inspection system using small catadioptric objective A system for use with a reduced size catadioptric objective is disclosed. The system including the reduced size objective includes various subsystems to allow enhanced imaging, the subsystems including illumination, imaging, autofocus, positioning, sensor, data acqu... | 12/29/2009 |
| 7633675 | Catadioptric imaging system employing immersion liquid for use in broad band microscopy A reduced size catadioptric inspection system employing a catadioptric objective and immersion substance is disclosed. The objective may be employed with light energy having a wavelength in the range of approximately 190 nanometers through the infrared light range, ... | 12/15/2009 |
| 7627007 | Non-critical phase matching in CLBO to generate sub-213nm wavelengths A laser illuminator and illumination method for use in an inspection system, such as a semiconductor wafer inspection system or photomask inspection system is provided. The design comprises generating fundamental frequency laser energy at different fundamental wavel... | 12/01/2009 |
| 7609373 | Reducing variations in energy reflected from a sample due to thin film interference A system and method for inspecting a multi-layer sample, such as a silicon wafer, is disclosed. The design reduces variations in total reflected energy due to thin film interference. The design includes illuminating the sample at two incident angle ranges, where the... | 10/27/2009 |
| 7609309 | Continuous clocking of TDI sensors A method and apparatus for propagating charge through a time division and integration (TDI) sensor is provided. The method and apparatus may be used with the TDI sensor to inspect specimens, the TDI sensor operating to advance an accumulated charge between gates of ... | 10/27/2009 |
| 7528943 | Method and apparatus for simultaneous high-speed acquisition of multiple images A method and apparatus for simultaneous high-speed inspection and acquisition of multiple data channels is provided. The method and apparatus enables inspecting semiconductor wafers and reticles and comprises converting a single image region into two image sections,... | 05/05/2009 |
| 7522275 | High throughput darkfield/brightfield wafer inspection system using advanced optical techniques The broadband brightfield/darkfield wafer inspection system provided receives broadband brightfield illumination information via a defect detector, which signals for initiation of darkfield illumination. The defect detector forms a two dimensional histogram of the d... | 04/21/2009 |
| 7508589 | Soft aperture correction for lenticular screens An apparatus including an autostereoscopic image selection device having a plurality of lenticules is provided. The autostereoscopic image selection device has an opaque material applied thereto in gaps between the plurality of lenticules. The opaque material is app... | 03/24/2009 |
| 7505144 | Copper CMP flatness monitor using grazing incidence interferometry A system and method for in-line inspection of specimens such as semiconductor wafers is provided. The system provides scanning of sections of specimens having predetermined standardized characteristics using a diffraction grating that widens and passes nth order (n>... | 03/17/2009 |
| 7502177 | Broad band DUV, VUV long-working distance catadioptric imaging system A high performance objective having very small central obscuration, an external pupil for apertureing and Fourier filtering, loose manufacturing tolerances, large numerical aperture, long working distance, and a large field of view is presented. The objective is pre... | 03/10/2009 |
| 7502003 | Method for eliminating pi-cell artifacts An alternating unipolar carrier waveform is used to drive a pi-cell modulator. The pi-cell is driven by the carrier, but the carrier never changes polarity within the time period that the cell is energized. However, each time the cell is energized, i.e., once per fi... | 03/10/2009 |
| 7499156 | Closed region defect detection system A method and apparatus for inspecting specimens or patterned transmissive substrates, such as photomasks, for unwanted particles and features, particularly those associated with contacts, including irregularly shaped contacts. A specimen is illuminated by a laser th... | 03/03/2009 |
| 7492953 | Efficient method and system for reducing update requirements for a compressed binary image A system and method for lossless data compression of byte oriented digital data, including but not exclusively executable program code and related data. This lossless data compression system and method when used to process sets of similar but not identical input dat... | 02/17/2009 |
| 7489393 | Enhanced simultaneous multi-spot inspection and imaging A system and method for inspection is disclosed. The design includes focusing illumination beams of radiation at an optical axis to an array of illuminated elongated spots on the surface at oblique angle(s) of incidence to the surface, performing a linear scan along... | 02/10/2009 |
| 7477206 | Enhanced ZScreen modulator techniques A method and system for use in conjunction with a push-pull liquid crystal modulator system for creating circularly polarized light of alternating handedness is provided. The method and system comprise a pair of surface mode liquid crystal cells and a driver electri... | 01/13/2009 |
| 7474461 | Broad band objective having improved lateral color performance A system and method for inspection is disclosed. The design generally employs as many as four design principles, including employing at least one lens from a relatively low dispersion glass, at least one additional lens from an additional material different from the... | 01/06/2009 |
| 7465913 | System and method for sensing using adjustable modulation transfer function (MTF) with voltage variations relative to depletion depth at a pixel A variable modulated transfer function (MTF) design employing a variable gate voltage source for use in inspecting specimens is disclosed. The design applies a variable gate voltage to each pixel of a sensor, wherein applying the variable gate voltage to each pixel ... | 12/16/2008 |
| 7457454 | Detailed grey scale inspection method and apparatus A method for inspecting semiconductor wafers and the like is presented. The method comprises initially determining a baseline greyscale difference, such as a greyscale plot or greyscale visual representation, for at least one baseline semiconductor wafer subjected t... | 11/25/2008 |
