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| Number | Title | Issue Date |
| 5475624 | Test generation by environment emulation Generation, validation and fault-grading of test patterns, and test and debug of logic circuits, are enhanced by emulation of the logic circuits in programmable gate arrays. Two emulations of the logic circuit are preferably created, one of which is a "go... | 12/12/1995 |
| 5430400 | Driver circuits for IC tester Driver circuits are provided which also serve as termination and clamp in an IC tester. When it is to drive a port of a device under test (DUT) between two predetermined voltage levels, the driver's I/O terminal is switched between two predetermined volta... | 07/04/1995 |
| 5401972 | Layout overlay for FIB operations Focused ion bean (FIB) milling through a power plane of a device to expose or cut a hidden, lower-layer conductor requires accurate positioning relative to the hidden conductor of a box defining boundaries of the FIB operation. This can in general be done... | 03/28/1995 |
| 5392222 | Locating a field of view in which selected IC conductors are unobscured Methods and apparatus are disclosed for positioning the field of view in a system for IC probing or repair, where the system comprises means for supporting an IC device having multiple physical layers and multiple internal nets, and controllable positioni... | 02/21/1995 |
| 5357116 | Focused ion beam processing with charge control Focused ion beam (FIB) systems are used for IC mask or reticle repair and imaging and other applications. The impinging ions can cause an undesirable charge build-up on the specimen. Prior to beginning repair operations in a FIB system, a fluid containing... | 10/18/1994 |
| 5270643 | Pulsed laser photoemission electron-beam probe An electron-beam test probe system (400) in which a pulsed laser-beam source (404) and a photocathode assembly (430) are used with an electron-beam column (426) to produce a pulsed electron beam at a stabilized repetition frequency. A pulse picker (414) a... | 12/14/1993 |
| 5210487 | Double-gated integrating scheme for electron beam tester A surface is probed with a pulsed electron beam and secondary electrons are detected to produce a detector signal. First portions of the detector signal are substantially dependent on the voltage of the surface being probed, while second portions of the d... | 05/11/1993 |
| 5144225 | Methods and apparatus for acquiring data from intermittently failing circuits Methods and apparatus are disclosed for conditional acquisition of potential measurements in integrated circuits, with the aid of electron-beam probes. The conditional acquisition enables display of waveform images which permit diagnosis of the causes and... | 09/01/1992 |
| 5140164 | IC modification with focused ion beam system Apparatus is provided which includes a FIB column having a vacuum chamber for receiving an IC, means for applying a FIB to the IC, means for detecting secondary charged particles emitted as the FIB is applied to the IC, and means for electrically stimulat... | 08/18/1992 |
| 5127064 | High resolution image compression methods and apparatus The present invention provides methods and apparatus for rapid compression of images composed of pixels into high-resolutions, compressed icon images, and for dynamic fault imaging of operating faults in integrated circuit devices employing such methods. ... | 06/30/1992 |
| 5054097 | Methods and apparatus for alignment of images Methods and apparatus are disclosed for rapid and interactive "warping" of a first image made up of pixels to form a resulting image made up of pixels which are aligned, pixel-for-pixel, with a second image made up of pixels. The images may be stroboscopi... | 10/01/1991 |
