...that the Band-Aid Bandage was invented by a Johnson & Johnson employee whose wife had cut herself? Earl Dickson's wife was rather accident prone, so he set out to develop a bandage that she could apply without help. He placed a small piece of gauze in the center of a small piece of surgical tape, and what we know today as the Band Aid bandage was born!
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| Number | Title | Issue Date |
| 7493406 | Maximal flow scheduling for a stream processing system Disclosed is a method, upstream processing node, and computer readable medium for processing data packets. The method includes receiving an allocation for at least one computing resource. At least one data packet at one or more upstream processing elements in an ups... | 02/17/2009 |
| 7492727 | Space and time efficient XML graph labeling There is provided a method for determining reachability between any two nodes within a graph. The inventive method utilizes a dual-labeling scheme. Initially, a spanning tree is defined for a group of nodes within a graph. Each node in the spanning tree is assigned ... | 02/17/2009 |
| 7395416 | Computer processing system employing an instruction reorder buffer A method and a system for operating a plurality of processors that each includes an execution pipeline for processing dependence chains, the method comprising: configuring the plurality of processors to execute the dependence chains on execution pipelines; implement... | 07/01/2008 |
| 7085737 | Method and apparatus for meta-shopping and dynamic setup of B2B eCommerce A method, apparatus, and computer implemented instructions for generating a customized catalog for an entity or organization. Items from a base catalog are presented to a user located at a remote data processing system. One or more items are selected by a user throu... | 08/01/2006 |
| 7080118 | System and method for dynamically displaying HTML form elements A method of selectively displaying a markup language form element on a Web page when an associated object is available to a Web server, the method comprising associating the markup language form element with the object, determining whether the object is available to... | 07/18/2006 |
| 6895402 | Detecting framing of a network resource identified by a target uniform resource locator A computer-implemented method for detecting framing of a network (such as the Internet or an intranet) resource identified by a target uniform resource locator (URL), by locating a suspect URL and an associated suspect page which reference the target URL, examining ... | 05/17/2005 |
| 6721746 | Method and system for facilitating production changes in an extended enterprise environment A computer-based method and system for facilitating production changes in an extended enterprise via a network environment. The system includes a manufacturing enterprise system including a host system operating a web server, a data storage device in communication w... | 04/13/2004 |
| 6611835 | System and method for maintaining up-to-date link information in the metadata repository of a search engine A system and method for updating search engine information that is more efficient, less time-consuming, and less costly than prior techniques. In order to carry out the method a uniform resource locator indicating a Web page for which the search engine in... | 08/26/2003 |
| 6564257 | Repository protection by URL expiration Protecting a searchable repository containing a document locator when a user searches the repository for the document locator, by replacing the document locator with a unique time-sensitive key. The document locator may be a uniform resource locator, or U... | 05/13/2003 |
| 6529939 | User-initiated maintenance of document locators Maintenance of a repository of summary data about documents associated with document locators, the repository of summary data stored separately from the documents and containing the document locators, when a user requests a document associated with one of... | 03/04/2003 |
| 6021679 | Probe for slurry gas sampling Device for in-situ collection of a gaseous reaction product from a polishing slurry as a workpiece, such as a semiconductor wafer, is being polished with the slurry, including a probe capable of being placed in contact with the slurry, the probe having a ... | 02/08/2000 |
| 5940725 | Semiconductor device with non-deposited barrier layer A semiconductor device comprises a semiconductor substrate of a first conductivity type, a first conductive layer formed in the semiconductor substrate using a dopant, and being of a second conductivity type, a silicon-rich nitride film formed on the firs... | 08/17/1999 |
| 5909044 | Process for forming a high density semiconductor device A method for forming an integrated circuit device, and the product thereby produced, are disclosed. The disclosed method includes the steps of obtaining a substrate with a patterned gate conductor and cap insulator, forming a dielectric masking layer havi... | 06/01/1999 |
| 5872390 | Fuse window with controlled fuse oxide thickness A fuse window structure and method for forming the same for a semiconductor device with a fuse and a cutting site on the fuse, the structure having (1) a first oxide region substantially in register with the cutting site, the first oxide region having a f... | 02/16/1999 |
| 5796573 | Overhanging separator for self-defining stacked capacitor An overhanging separator structure with a post projecting from a surface which may be a substrate, an underlying layer on the surface, and a separator layer on the underlying layer, with the separator layer overhanging the underlying layer. A discontinuou... | 08/18/1998 |
| 5792275 | Film removal by chemical transformation and aerosol clean A film layer not susceptible to aerosol cleaning is removed from a surface by converting the film layer into a film susceptible to aerosol cleaning, and aerosol jet cleaning the converted film and any contaminants. The aerosol jet can be moved in relation... | 08/11/1998 |
| 5770948 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool An apparatus for rotary signal coupling in in-situ monitoring of a chemical-mechanical polishing process by a polisher is provided with a sensor fixed to a rotatable wafer carrier for creating a signal responsive to the chemical mechanical polishing proce... | 06/23/1998 |
| 5767017 | Selective removal of vertical portions of a film A body is provided with a substantially horizontal surface and a substantially vertical surface. A film is formed on the body with a substantially horizontal portion on the substantially horizontal surface, a substantially vertical portion on the substant... | 06/16/1998 |
| 5760451 | Raised source/drain with silicided contacts for semiconductor devices A contact for a semiconductor device is provided by depositing a layer of palladium on a silicon substrate, causing the palladium to react with the substrate for forming palladium silicide, removing unreacted palladium from the substrate, forming doped si... | 06/02/1998 |
| 5759867 | Method of making a disposable corner etch stop-spacer for borderless contacts A borderless contact method for a semiconductor device is disclosed employing a disposable etch stopping spacer to protect the upper edges of adjacent structure during contact hole etching. An exemplary FET gate structure is formed on a substrate adjacent... | 06/02/1998 |
| 5731985 | Chip sizing for hierarchical designs A method for resizing the macro cells' boundaries of an integrated chip is disclosed and that becomes effectual after the initial floorplanning process has been completed. The method of the present invention apportions any excess area that is freed-up aft... | 03/24/1998 |
| 5731697 | In-situ monitoring of the change in thickness of films The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detect... | 03/24/1998 |
| 5712759 | Sidewall capacitor with L-shaped dielectric A capacitor structure with a generally L-shaped non-conductor having a horizontal portion and a vertical portion, the vertical portion defining a first opening formed therein; a generally U-shaped conductor formed within the first opening; and a generally... | 01/27/1998 |
| 5663637 | Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool Rotary signal coupling in in-situ monitoring of a chemical-mechanical polishing process. A sensor fixed to a rotatable wafer carrier for creating a signal responsive to the chemical mechanical polishing process is coupled to a bottom half of a rotary tran... | 09/02/1997 |
| 5660672 | In-situ monitoring of conductive films on semiconductor wafers The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detect... | 08/26/1997 |
| 5659492 | Chemical mechanical polishing endpoint process control A method and apparatus are provided for determining the endpoint for chemical mechanical polishing a film on a wafer. First, a reference point polishing time indicating when a breakthrough of the film has occurred is determined, then an overpolishing time... | 08/19/1997 |
| 5644221 | Endpoint detection for chemical mechanical polishing using frequency or amplitude mode A method and apparatus for endpoint detection in removal of a film from a semiconductor wafer is provided, with a sensor for creating a signal responsive to the film removal process, a positive feedback amplifier coupled to the sensor, the positive feedba... | 07/01/1997 |
| 5636320 | Sealed chamber with heating lamps provided within transparent tubes A reactor is provided for heating a workpiece in a sealed environment. The reactor has a chamber with a gas inlet port, a gas outlet port, and at least one tube for receiving a heat source. The tube passes from outside the chamber into the inside of the c... | 06/03/1997 |
| 5612626 | System using induced current for contactless testing of wiring networks A method for measuring electrical characteristics of an electrical device having a conductive structure associated therewith involves the sequence of steps as follows: First, employ a low energy electron beam to charge all conductors on the surface of the... | 03/18/1997 |
| 5609517 | Composite polishing pad A composite polishing pad is provided, with a supporting layer, nodes attached to the supporting layer, and an upper layer attached to the supporting layer which surrounds but does not cover the nodes. The support layer, nodes, and upper layer may all be ... | 03/11/1997 |
| 5585998 | Isolated sidewall capacitor with dual dielectric An isolated sidewall capacitor with dual dielectric, which includes two capacitors. The first capacitor includes a first conductor on top of a substrate, a first non-conductor on top of and substantially in register with the first conductor, the first con... | 12/17/1996 |
| 5573623 | Apparatus for contactless real-time in-situ monitoring of a chemical etching process A contactless method and apparatus for in-situ chemical etch monitoring of an etching process during etching of a workpiece with a wet chemical etchant are disclosed. The method comprises steps of providing at least two toroidal windings in the wet chemic... | 11/12/1996 |
| 5559428 | In-situ monitoring of the change in thickness of films The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detect... | 09/24/1996 |
| 5536388 | Vertical electroetch tool nozzle and method A nozzle is provided for use in electroetching a vertically oriented workpiece, comprising a housing having a top, sides, and bottom for creating a flow of etching solution on the workpiece, and means for shaping the flow of etching solution into a moving... | 07/16/1996 |
| 5456788 | Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process A contactless method and apparatus for in-situ chemical etch monitoring of an etching process during etching of a workpiece with a wet chemical etchant are disclosed. The method comprises steps of providing a base member having a reference surface; releas... | 10/10/1995 |