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In 1608, Dutch eyeglass maker Hans Lipperhey filed the first patent for a working telescope. The patent was denied.
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| Number | Title | Issue Date |
| 5423918 | Method for reducing particulate contamination during plasma processing of semiconductor devices A technique for removing particles from above a semiconductor wafer, particularly particles that are trapped in a plasma chamber during processing of the wafer. Trapped particles are usually not all drawn out with gases exhausted from the chamber, in part... | 06/13/1995 |
| 5422724 | Multiple-scan method for wafer particle analysis A method for reducing targeting errors encountered when trying to locate contaminant particles in a high-magnification imaging device, based on estimates of the particle positions obtained from a scanning device. The method of the invention includes scann... | 06/06/1995 |
