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Attorney: Epstein; M. Y.


Number of patents: 7
Last date: February 13, 1979

NumberTitleIssue Date
4139772Plasma discharge ion source
An ion source is described in which a compound of the material of a desired ion is dissociated in a plasma discharge process to provide a beam of charged particles including the desired ions. The proportion of the desired ion in the particle beam is selec...
02/13/1979
4037454Tube forming
An unpierced metallic billet of relatively large diameter is subjected to three successive stages of deformation so as to form a metallic tube of relatively small outer diameter. In a first stage, the billet is given a generally "C"-shaped cross-sectional...
07/26/1977
3982816Method for measuring the parameters of optical fibers
Parameters of a clad optical fiber are measured by irradiating the fiber with a laser beam to generate a scattering pattern. Measurements are made of fringes and modulations in the scattering pattern and these measurements are translated into such paramet...
09/28/1976
3977926Methods for treating articles
To eliminate the manual handling of individual articles associated with loading and unloading conventional treating apparatus, a plurality of articles are simultaneously treated in the carriers which are used for batch handling prior to and subsequent to ...
08/31/1976
3970471Methods and apparatus for treating wafer-like articles
Wafer-like articles are inserted through an input port into one of a plurality of slots in a rotatable disc having a slotted periphery. The disc is disposed in a vertical plane between a pair of closely-spaced parallel plates which laterally retain the ar...
07/20/1976
3963489Method of precisely aligning pattern-defining masks
A method of precisely aligning a pattern on one side of an opaque substrate with a pattern on the opposite side thereof through the use of pattern-defining masks, wherein at least certain pattern areas previously not formed on the substrate, as defined se...
06/15/1976
3942107Method and apparatus employing thin conductive films on flexible nonconductive sheets for non-destructive measurement of electrical characteristics
In a non-destructive, production-oriented technique for measuring an electrical characteristic of a material, a first nonconductive flexible sheet having a first conductive pattern thereon is pressed against a portion of the surface of the material, and a...
03/02/1976
 
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