System for magnetically attaching templeless eyewear to a person
A system of eyewear that eliminates the need for hinges on the frames of the eyewear.
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 8185679 | Controlling bus access An apparatus that controls access by multiple IP cores to a bus is provided. The apparatus includes a main controller and multiple sub controllers, each of the sub controllers being associated with each IP cores. The main controller switches connection between each ... | 05/22/2012 |
| 8171220 | Cache architecture with distributed state bits Embodiments that that distribute replacement policy bits and operate the bits in cache memories, such as non-uniform cache access (NUCA) caches, are contemplated. An embodiment may comprise a computing device, such as a computer having multiple processors or multipl... | 05/01/2012 |
| 8170424 | Method and apparatus for optical signal power discrimination The present invention provides an optical power level discriminating device and method for discriminating optical power levels. The optical discriminating device includes a splitter for receiving an optical signal having first and second signal states, and splitting... | 05/01/2012 |
| 8169321 | Radio frequency-enabled electromigration fuse Embodiments of the invention provides a method, device, and system for programming an electromigration fuse (eFuse) using a radio frequency (RF) signal. A first aspect of the invention provides a method of testing circuitry on a semiconductor chip, the method compri... | 05/01/2012 |
| 8169026 | Stress-induced CMOS device A semiconductor device including: a silicon dioxide layer; an n-type field effect transistor (NFET) including at least one recessed source/drain trench and located over a portion of the silicon dioxide layer; a p-type field effect transistor (PFET) including at leas... | 05/01/2012 |
| 8166423 | Photomask design verification Solutions for verifying photomask designs are disclosed. In one embodiment, a method of verifying a photomask design includes: simulating an initial semiconductor manufacturing process using a plurality of mask shapes and variation models for the initial semiconduct... | 04/24/2012 |
| 8164190 | Structure of power grid for semiconductor devices and method of making the same An embodiment of the invention provides a semiconductor structure, which may include a stud of a first conductive material formed inside a dielectric layer; a via of a second conductive material having a bottom and sidewalls with the bottom and the sidewalls being c... | 04/24/2012 |
| 8161421 | Calibration and verification structures for use in optical proximity correction A method of training an Optical Proximity Correction (OPC) model comprises symmetrizing a complex design to be a test pattern having orthogonal symmetry. Symmetrizing may comprise establishing a axis of symmetry passing through the design, thereby dividing the desig... | 04/17/2012 |
| 8159814 | Method of operating transistors and structures thereof for improved reliability and lifetime Embodiments of the present invention provide a semiconductor device that includes a transistor device having a first, a second, and a third node; and an interconnect structure having at least one wire and the wire having a first and a second end with the first end o... | 04/17/2012 |
| 8159040 | Metal gate integration structure and method including metal fuse, anti-fuse and/or resistor A semiconductor structure and a method for fabricating the semiconductor structure provide a field effect device located and formed upon an active region of a semiconductor substrate and at least one of a fuse structure, an anti-fuse structure and a resistor structu... | 04/17/2012 |
| 8158014 | Multi-exposure lithography employing differentially sensitive photoresist layers A stack of a second photoresist having a second photosensitivity and a first photoresist having a first photosensitivity, which is greater than second photosensitivity, is formed on a substrate. A first pattern is formed in the first photoresist by a first exposure ... | 04/17/2012 |
| 8144726 | Structure for out of band signaling enhancement for high speed serial driver A design structure is provided for a microelectronic serial driver. The serial driver is operable to transmit a differential pattern signal during a burst interval and a predetermined common mode voltage level during a second interval between adjacent burst interval... | 03/27/2012 |
| 8140825 | Systems and methods for selectively closing pages in a memory Systems, methods and media for selectively closing pages in a memory in anticipation of a context switch are disclosed. In one embodiment, a table is provided to keep track of open pages for different processes. The table comprises rows corresponding to banks of mem... | 03/20/2012 |
| 8140767 | Cache management through delayed writeback The illustrative embodiments provide a method, apparatus, and computer program product for managing a number of cache lines in a cache. In one illustrative embodiment, it is determined whether activity on a memory bus in communication with the cache exceeds a thresh... | 03/20/2012 |
| 8140758 | Data reorganization in non-uniform cache access caches Embodiments that dynamically reorganize data of cache lines in non-uniform cache access (NUCA) caches are contemplated. Various embodiments comprise a computing device, having one or more processors coupled with one or more NUCA cache elements. The NUCA cache elemen... | 03/20/2012 |
| 8138053 | Method of forming source and drain of field-effect-transistor and structure thereof Embodiments of the invention provide a method of forming a field-effect-transistor (FET). The method includes implanting one or more n-type dopants to create one or more implanted regions with at least a portion of the implanted regions being designated as regions f... | 03/20/2012 |
| 8138041 | In-situ silicon cap for metal gate electrode Structure and method of improving the performance of metal gate devices by depositing an in-situ silicon (Si) cap are disclosed. A wafer including a substrate and a dielectric layer is heated through a degas process, and then cooled to approximately room temperature... | 03/20/2012 |
| 8131953 | Tracking store ordering hazards in an out-of-order store queue A method and system for processing data. In one embodiment, the method includes receiving a first store and receiving a second store subsequent to the first store. The method also includes generating a pointer that points to the last store that needs to retire befor... | 03/06/2012 |
| 8130650 | Retro flow control for arriving traffic in computer networks The decision within a packet processing device to transmit a newly arriving packet into a queue to await further processing or to discard the same packet is made by a flow control method and system. The flow control is updated with a constant period determined by st... | 03/06/2012 |
| 8128749 | Fabrication of SOI with gettering layer An SOI substrate has a gettering layer of silicon-germanium (SiGe) with 5-10% Ge, and a thickness of approximately 50-1000 nm. Carbon (C) may be added to SiGe to stabilize the dislocation network. The SOI substrate may be a SIMOX SOI substrate, or a bonded SOI subst... | 03/06/2012 |
| 8126913 | Method to identify exact, non-exact and further non-exact matches to part numbers in an enterprise database A method of searching for customer part numbers stored in an enterprise database includes creating a set of discrete search strings from a set of supplier part numbers by which a search of the customer part numbers is performed and identifying any exact, non-exact a... | 02/28/2012 |
| 8124525 | Method of forming self-aligned local interconnect and structure formed thereby Embodiments of the present invention provide a method of forming local interconnect for semiconductor devices. The method includes depositing a blanket layer of conductive material over one or more semiconductor devices; creating a pattern of local interconnect cove... | 02/28/2012 |
| 8112604 | Tracking load store ordering hazards A method and system for processing data. In one embodiment, the method includes receiving a plurality of stores into a store queue, where each store is a result from a processor, and where the plurality of stores are destined for at least one memory address. The met... | 02/07/2012 |
| 8112547 | Efficiently hashing packet keys into a firewall connection table A method for increasing the capacity of a connection table in a firewall accelerator by means of mapping packets in one session with some common security actions into one table entry. For each of five Network Address Translation (NAT) configurations, a hash function... | 02/07/2012 |
| 8108804 | Short path customized mask correction Embodiments of the present invention provide a method of performing photo-mask correction. The method includes identifying a hot-spot in a photo-mask that violates one or more predefined rules; creating a window area in the photo-mask that surrounds the hot spot; ca... | 01/31/2012 |
| 8106515 | Local metallization and use thereof in semiconductor devices An embodiment of the invention provides a method of creating local metallization in a semiconductor structure, and the use of local metallization so created in semiconductor structures. In one respect, the method includes forming an insulating layer on top of a semi... | 01/31/2012 |
| 8105887 | Inducing stress in CMOS device A first aspect of the invention provides a method of forming a semiconductor device, the method comprising: providing a complimentary metal oxide semiconductor (CMOS) device including: a silicon substrate layer; a silicon dioxide layer thereover; and an n-type field... | 01/31/2012 |
| 8099684 | Methodology of placing printing assist feature for random mask layout Embodiments of the present invention provide a method of placing printing assist features in a mask layout. The method includes providing a design layout having one or more designed features; generating a set of parameters, the set of parameters being associated wit... | 01/17/2012 |
| 8085789 | Algorithm and system for selecting acknowledgments from an array of collapsed VOQ's A method for selecting packets to be switched in a collapsed virtual output queuing array (cVOQ) switch core, using a request/acknowledge mechanism is disclosed. An egress location for an ingress port is selected based on degrees of freedom for the selection mechani... | 12/27/2011 |
| 8084788 | Method of forming source and drain of a field-effect-transistor and structure thereof A semiconductor fabrication method involving the use of eSiGe is disclosed. The eSiGe approach is useful for applying the desired stresses to the channel region of a field effect transistor, but also can introduce complications into the semiconductor fabrication pro... | 12/27/2011 |
| 8084346 | Replacement metal gate method A method includes forming a dummy gate in a dielectric layer on a substrate, the dummy gate including a sacrificial oxide layer and a dummy gate body over the sacrificial oxide layer; removing the dummy gate body resulting in a gate opening with the sacrificial oxid... | 12/27/2011 |
| 8084311 | Method of forming replacement metal gate with borderless contact and structure thereof Embodiments of the present invention provide a method of forming borderless contact for transistor in a replacement metal gate process. The method includes forming a gate on top of a substrate and forming spacers adjacent to sidewalls of the gate; lowering height of... | 12/27/2011 |
| 8080451 | Fabricating semiconductor structures Solutions for fabricating a semiconductor structure. One embodiment includes a method for fabricating a semiconductor structure, the method including: forming a first dielectric structure on a substrate, the first dielectric structure including silicon nitride (Si | 12/20/2011 |
| 8059884 | Method and system for obtaining bounds on process parameters for OPC-verification Embodiments of the present invention provide a method of performing printability verification of a mask layout. The method includes creating one or more tight clusters; computing a set of process parameters associated with a point on said mask; comparing said set of... | 11/15/2011 |
| 8053838 | Structures, fabrication methods, design structures for strained fin field effect transistors (FinFets) A semiconductor structure, a fabrication method, and a design structure for a FinFet. The FinFet includes a dielectric layer, a central semiconductor fin region on the dielectric layer, a first semiconductor seed region on the dielectric layer, and a first strain cr... | 11/08/2011 |
| 8053037 | Device and method for patterning structures on a substrate A device for patterning structures on a substrate includes an imaging device having a scanning tip, a light emitting device, and a space around the scanning tip. The space comprises a vapor of a material which is suitable for Chemical Vapor Deposition onto the subst... | 11/08/2011 |
| 8034533 | Fluorine-free heteroaromatic photoacid generators and photoresist compositions containing the same Fluorine-free photoacid generators and photoresist compositions containing fluorine-free photoacid generators are enabled as alternatives to PFOS/PFAS photoacid generator-containing photoresists. The photoacid generators are characterized by the presence of a fluori... | 10/11/2011 |
| 8030154 | Method for forming a protection layer over metal semiconductor contact and structure formed thereon In one embodiment, a method of forming a semiconductor device is provided that includes providing a gate structure on a semiconductor substrate. Sidewall spacers may be formed adjacent to the gate structure. A metal semiconductor alloy may be formed on the upper sur... | 10/04/2011 |
| 8027416 | Structure for data communications systems A machine-readable medium thereupon stored a design structure; the design structure includes a receiver for a data communications system. The receiver includes a data path for receiving a data signal from a data channel, the data path comprising an automatic gain co... | 09/27/2011 |
| 8027415 | Data communications systems A receiver for a data communications system comprises: a data path for receiving a data signal from a data channel, the data path comprising an automatic gain control (AGC) loop; and, a signal detector for generating a data valid signal indicative of the validity of... | 09/27/2011 |