Celebrity Inventors
Mark Twain (Samuel L. Clemens) received Patent No. 121,992 for "An Improvement in Adjustable and Detachable Straps for Garments." He later received two more patents: one for a self-pasting scrapbook and one for a game to help players remember important historical dates.
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| Number | Title | Issue Date |
| 7593825 | Method and apparatus for management of calibration data An electronic measurement apparatus and method provides for an instrument requiring at least one periodic calibration. The instrument has an instrument processor and an instrument memory. The instrument is configured to accept and store calibration data related to t... | 09/22/2009 |
| 7545848 | High resolution time stamps for periodic samples A method and apparatus for collecting digital sample data from a target system accesses the digital sample data at transitions of a sample clock, acquires information related to an instantaneous average period of the sample clock, and records the digital sample data... | 06/09/2009 |
| 7545507 | Displacement measurement system A displacement measurement apparatus includes a light source, a splitter grating, a measurement grating, and first a second detector arrays. The splitter grating splits a light beam into first and second measurement channels that each illuminates the measurement gra... | 06/09/2009 |
| 7531899 | Ball grid array package An apparatus and method includes an integrated circuit disposed in a ball grid array (“BGA”) package having interconnects on at least one corner without signal assignments. ... | 05/12/2009 |
| 7440113 | Littrow interferometer An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow ang... | 10/21/2008 |
| 7420744 | Ambient environment index of refraction insensitive optical system A refractive optical system may be a collimator, focusing optical system, reducer, or expander and includes an entrance optical element, an exit optical element, and a volume disposed between the entrance and exit optical elements. The volume is configured to have a... | 09/02/2008 |
| 7302282 | Communications system for implementation of synchronous, multichannel, galvanically isolated instrumentation devices An apparatus and method for synchronous communications using a serial data stream employs a housing with a controller and a back plane. The housing accepts one or more modules for interconnection with the back plane. The back plane distributes power to the modules a... | 11/27/2007 |
| 7282935 | Regenerator probe A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement... | 10/16/2007 |
| 7225359 | Method and apparatus for mapping signals of a device under test to logic analyzer measurement channels A method of mapping device pins to logic analyzer channels in preparation for a digital test includes accepting a correlation of at least one test connector to one or more logic analyzer pods and presenting a display showing available test connector pins for each de... | 05/29/2007 |
| 7126346 | Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits A method, apparatus and article of manufacture for manufacturing a balanced circuit obtains S-parameters for the balanced circuit and determines a delay value embedded at one of the single-ended terminals of the balanced circuit that reduces a differential to common... | 10/24/2006 |
| 7088109 | Method and apparatus for measuring a digital device A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus. ... | 08/08/2006 |
| 7068049 | Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electric... | 06/27/2006 |
| 7030625 | Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement A method and apparatus for calibrating a multiport measurement path using through, high reflect and line calibration standards presents the through standard between no more than N−1 other pairs of measurement ports where at least one of the other pairs is a proxim... | 04/18/2006 |
| 7001834 | Integrated circuit and method of manufacturing an integrated circuit and package A packaged IC includes an IC die with signal and signal complement traces positioned relative to each other to maximize broadside coupling for a matching impedance. The signal and signal complement traces are electrically connected to transmission or receive channel... | 02/21/2006 |
| 6973404 | Method and apparatus for administering inversion property in a memory tester A method and apparatus permits use of a tester memory (31) as storage for an inversion mask. The inversion mask indicates to the tester which cells in a DUT memory (14) are logically inverted during testing. Data information and the inverse of the data... | 12/06/2005 |
| 6968545 | Method and apparatus for no-latency conditional branching An apparatus to perform no-latency conditional branching has a sequencer for executing program instructions including one or more conditional branch instructions. The conditional branch instruction is a binary word specifying a branch condition address and a conditi... | 11/22/2005 |
| 6945313 | Heat transfer apparatus and method of manufacturing an integrated circuit and heat sink assembly A method for cooling integrated circuit assemblies uses a heat sink having a base and a displacement element having a size substantially similar to an area of heat concentration appropriately positioned on the integrated circuit. A compressive force placed upon the ... | 09/20/2005 |
| 6937032 | Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible ... | 08/30/2005 |
| 6920407 | Method and apparatus for calibrating a multiport test system for measurement of a DUT A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the... | 07/19/2005 |
| 6900533 | Apparatus for routing electrical signals An apparatus for routing electrical signals is a layered structure having a signal trace connected to a via and to a conductive stub trace on a first side. A reference layer is on a second side of the layered structure. Removing a portion of the conductive reference... | 05/31/2005 |
| 6857113 | Process and system for identifying wires at risk of electromigration A method and system of identifying one or more nets in a digital IC design that are at risk of electromigration comprises selecting a manufacturing process for the digital IC design and obtaining a clock period and process voltage. A voltage waveform transition time... | 02/15/2005 |
| 6853198 | Method and apparatus for performing multiport through-reflect-line calibration and measurement A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration sta... | 02/08/2005 |
| 6839650 | Electronic test system and method An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classe... | 01/04/2005 |
| 6832362 | Process and system for repeater insertion in an IC design A method of generating an IC design comprises the steps of generating an intermediate routing result to define interconnects between functional blocks on an IC. The next step is defining one or more repeater ranches in an interstice of the IC and generating a repeat... | 12/14/2004 |
