Bizarre Patents
Dining Table Having Integral Dishwasher
A space-saving dishwasher, which may be installed within a counter top or table, having a dish-carrying rack that is vertically shiftable through the open top of the dishwasher for facilitating loading and unloading of the dishes.
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| Number | Title | Issue Date |
| 7349103 | System and method for high intensity small spot optical metrology An apparatus and method for examining features of a sample with a broadband beam of light obtained from a long-wavelength source that may include two distinct emitters that emit a long-wavelength radiation and a short-wavelength source that emits a short-wavelength ... | 03/25/2008 |
| 7330256 | Spectrophotometric system with reduced angle of incidence A system uses reflectance spectrophotometry to characterize a sample having any number of structures. The system uses toroidal mirrors that are shaped in such a way that the angle of reflectance off of the target is small. The small angle of reflectance may allow fo... | 02/12/2008 |
| 7327457 | Apparatus and method for optical characterization of a sample over a broadband of wavelengths while minimizing polarization changes An apparatus and method for optically characterizing the reflection and transmission properties of a sample with a beam of light having a small diameter on a surface of the sample over a broadband of wavelengths, from 190 nm to 1100 nm. Reflective optical components... | 02/05/2008 |
| 7290978 | Photomask flipper and single direction inspection device for dual side photomask inspection A flipper for rotating and positioning a photomask in two flip orientations includes a flip unit rotatably held in a base. The flip unit includes a flip frame in which clamps are preferably spring loaded guided such that the clamps are oppositely and laterally displ... | 11/06/2007 |
| 7289214 | System and method for measuring overlay alignment using diffraction gratings A system and method for optical offset measurement is provided. An offset between two grating layers in a compound grating is measured by illuminating the gratings with light having a plane of incidence that is neither parallel with nor perpendicular to the grating ... | 10/30/2007 |
| 7253909 | Phase shift measurement using transmittance spectra An apparatus and method for determining a physical parameter of features on a substrate by illuminating the substrate with an incident light covering an incident wavelength range Δλ, e.g., from 190 nm to 1000 nm, where the substrate is at least semi-transparent. A... | 08/07/2007 |
| 7248364 | Apparatus and method for optical characterization of a sample over a broadband of wavelengths with a small spot size An apparatus and method for optically characterizing the reflection and transmission properties of a sample with a beam of light having a small diameter on a surface of the sample over a broadband of wavelengths, from 190 nm to 1100 nm. Reflective optical components... | 07/24/2007 |
| 7212293 | Optical determination of pattern feature parameters using a scalar model having effective optical properties Optical characterization of lateral features of a pattern is provided. A plane-wave optical response is calculated for each feature. At least one of these plane-wave responses is calculated from an effective optical property (e.g., a waveguide modal refractive index... | 05/01/2007 |
