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Mouthguard made at least partially from an edible candy
A mouthguard includes a U-shaped upper bite plate which removably fits over upper teeth of a person, with the entire upper bite plate being made from a soft, deformable and edible gummi candy.
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| Number | Title | Issue Date |
| 8126677 | Analyzing surface structure using scanning interferometry A method includes comparing a scanning interferometry signal obtained for a location of a test object to each of multiple model signals corresponding to different model parameters for modeling the test object, wherein for each model signal the comparing includes cal... | 02/28/2012 |
| 8123593 | Configuring of lapping and polishing machines A lapping or polishing machine includes a material having a first finishing surface to process a surface of a work item, a measuring tool to measure a contour of the first finishing surface, and a conditioning tool having a second finishing surface to process the fi... | 02/28/2012 |
| 8120781 | Interferometric systems and methods featuring spectral analysis of unevenly sampled data In certain aspects, interferometry methods are disclosed that include providing one or more interferometry signals for a test object, wherein the interferometry signals correspond to a sequence of optical path difference (OPD) values which are not all equally spaced... | 02/21/2012 |
| 8107085 | Methods and systems for interferometric analysis of surfaces and related applications A method for determining a spatial property of an object includes obtaining a scanning low coherence interference signal from a measurement object that includes two or more interfaces. The scanning low coherence interference signal includes two or more overlapping l... | 01/31/2012 |
| 8107084 | Interference microscope with scan motion detection using fringe motion in monitor patterns An apparatus includes an interferometer configured to generate an interference pattern by combining test light from a test object with reference light reflected from a reference object, the interferometer being further configured to direct at least a first part of a... | 01/31/2012 |
| 8072611 | Interferometric analysis of under-resolved features In certain aspects, disclosed methods include directing test light reflected from an object to form an image of the object on a detector, where the object includes a diffractive structure. The test light at the detector includes both specularly and non-specularly re... | 12/06/2011 |
| 8045175 | Equal-path interferometer An optical assembly for use in an interferometer is provided. The optical assembly includes first and second partially reflective surfaces positioned along an optical axis and oriented at different non-normal angles to the optical axis. The second partially reflecti... | 10/25/2011 |
| 8004688 | Scan error correction in low coherence scanning interferometry In general, in one aspect, the invention features apparatus that includes a broadband scanning interferometry system including interferometer optics for combining test light from a test object with reference light from a reference object to form an interference patt... | 08/23/2011 |
| 7978338 | Compound reference interferometer Interferometry system are disclosed that include a detector sub-system including a monitor detector, interferometer optics for combining test light from a test object with primary reference light from a first reference interface and secondary reference light from a ... | 07/12/2011 |
| 7978337 | Interferometer utilizing polarization scanning In one aspect, the disclosure features methods that include using a microscope to direct light to a test object and to direct the light reflected from the test object to a detector, where the light includes components having orthogonal polarization states, varying a... | 07/12/2011 |
| 7952724 | Interferometer with multiple modes of operation for determining characteristics of an object surface Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference... | 05/31/2011 |
| 7948639 | Phase-shifting interferometry in the presence of vibration A phase-shifting interferometry (PSI) method and corresponding system including: (i) recording an interferogram for each phase in a sequence of phases between test light reflected from a test surface and reference light reflected from a reference surface, the test a... | 05/24/2011 |
| 7948638 | Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts Interferometric scanning method(s) and apparatus for measuring test optics having aspherical surfaces including those with large departures from spherical. A reference wavefront is generated from a known origin along a scanning axis. A test optic is aligned on the s... | 05/24/2011 |
| 7948637 | Error compensation in phase shifting interferometry In certain aspects, disclosed methods include combining reference light reflected from a reference surface with test light reflected from a test surface to form combined light, the test and reference light being derived from a common source, sinusoidally varying a p... | 05/24/2011 |
| 7948636 | Interferometer and method for measuring characteristics of optically unresolved surface features Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherei... | 05/24/2011 |
| 7933025 | Sinusoidal phase shifting interferometry Disclosed is a method that includes combining a first light beam and at least a second light beam to form a combined light beam, introducing a sinusoidal phase shift with a frequency f between a phase of the first light beam and a phase of the second light beam, rec... | 04/26/2011 |
| 7924435 | Apparatus and method for measuring characteristics of surface features An apparatus is disclosed which includes an interferometry system configured to operate in a first mode to produce a first set of multiple interferometry signals corresponding to different illumination angles of a test object by test light and in a second mode produ... | 04/12/2011 |
| 7894075 | Multiple-degree of freedom interferometer with compensation for gas effects The disclosure features multiple degree-of-freedom interferometers (e.g., non-dispersive interferometers) for monitoring linear and angular (e.g., pitch and/or yaw) displacements of a measurement object with compensation for variations in the optical properties of a... | 02/22/2011 |
| 7889356 | Two grating lateral shearing wavefront sensor Methods include simultaneously diffracting a beam in a first direction and a second direction orthogonal to the first direction to form a once-diffracted beam, where the beam comprises a wavefront shaped by a test object, simultaneously diffracting the once-diffract... | 02/15/2011 |
| 7889355 | Interferometry for lateral metrology A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position o... | 02/15/2011 |
| 7884947 | Interferometry for determining characteristics of an object surface, with spatially coherent illumination Disclosed is an apparatus which includes: an interferometer configured to direct broadband spatially coherent test light to a test surface of a test object over a range of illumination angles and subsequently combine it with reference light to form an interference p... | 02/08/2011 |
| 7869057 | Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis A method is disclosed including: generating a scanning interferometry signal at each of multiple wavelengths for each of at least one location on a test object; obtaining the scanning interferometry signals at each of the multiple wavelengths for each of at least on... | 01/11/2011 |
| 7826064 | Interferometer system for monitoring an object System for monitoring a position of one or more optical elements in a projection objective (PO) include a plurality of sensors each configured to receive input light and to form output light, each sensor including a first sensor optic and a second sensor optic, the ... | 11/02/2010 |
| 7826063 | Compensation of effects of atmospheric perturbations in optical metrology In general, in a first aspect, the invention features a method that includes using an interferometry assembly to provide three different output beams, each output beam including an interferometric phase related to an optical path difference between a corresponding f... | 11/02/2010 |
| 7812965 | Multiple-degree of freedom interferometer with compensation for gas effects The disclosure features multiple degree-of-freedom interferometers (e.g., non-dispersive interferometers) for monitoring linear and angular (e.g., pitch and/or yaw) displacements of a measurement object with compensation for variations in the optical properties of a... | 10/12/2010 |
| 7812964 | Distance measuring interferometer and encoder metrology systems for use in lithography tools In general, in one aspect, the invention features a system that includes a moveable stage, an interferometer configured to provide information about a first degree of freedom of the stage, an encoder configured to provide information about a second degree of freedom... | 10/12/2010 |
| 7812963 | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures A method including: imaging test light emerging from a test object over a range of angles to interfere with reference light on a detector, wherein the test and reference light are derived from a common source; for each of the angles, simultaneously varying an optica... | 10/12/2010 |
| 7796275 | Phase-shifting interferometry in the presence of vibration using phase bias A phase-shifting interferometry (PSI) method and corresponding system including: (i) recording an interferogram for each phase in a sequence of phases between test light reflected from a test surface and reference light reflected from a reference surface, the test a... | 09/14/2010 |
| 7796273 | Phase-shifting interferometry in the presence of vibration A phase-shifting interferometry (PSI) method and corresponding system including: (i) recording an interferogram for each phase in a sequence of phases between test light reflected from a test surface and reference light reflected from a reference surface, the test a... | 09/14/2010 |
| 7751064 | Interference objective for annular test surfaces An apparatus including: an interferometric objective comprising a beam splitter surface configured to separate input light into test light and reference light, and a reference surface configured to receive the reference light and direct it back to the beam splitter ... | 07/06/2010 |
| 7710580 | Vibration resistant interferometry In general, in one aspect, the invention features a method including providing scanning interferometry data for a test object using phase shifting interferometry, the data including intensity values for each of multiple scan positions for different spatial locations... | 05/04/2010 |
| 7697195 | Apparatus for reducing wavefront errors in output beams of acousto-optic devices We disclose acousto-optic modulators that include: (a) an optical element configured to receive an input optical beam that propagates along a first direction; and (b) a transducer extending along the first direction and positioned on one or more surfaces of the opti... | 04/13/2010 |
| 7684049 | Interferometer and method for measuring characteristics of optically unresolved surface features Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherei... | 03/23/2010 |
| 7639367 | Interferometer system for monitoring an object In general, in one aspect, the invention features a system including a light source, a plurality of interferometers configured to receive light from the light source and to form output light, each interferometer including a first optic and a second optic, the first ... | 12/29/2009 |
| 7636168 | Interferometry method and system including spectral decomposition In general, in one aspect, the disclosure features a method that includes directing measurement light to reflect from a measurement surface and combining the reflected measurement light with reference light, where the measurement light and reference light are derive... | 12/22/2009 |
| 7636166 | Interferometer system for monitoring an object In general, in one aspect, the invention features a system that includes a first object mounted relative to a second object, the first object being moveable with respect to the second object. The system includes a plurality of interferometers each configured to deri... | 12/22/2009 |
| 7619746 | Generating model signals for interferometry A method is disclosed which includes, for each of multiple areas of a test surface on a test object having different reflectivities, using an interferometry system to measure each area in a first mode of operation that measures information about the reflectivity of ... | 11/17/2009 |
| 7616323 | Interferometer with multiple modes of operation for determining characteristics of an object surface Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference... | 11/10/2009 |
| 7616322 | Cyclic error compensation in interferometry systems An interference signal S(t) is provided from interference between two beams directed along different paths. The signal S(t) is indicative of changes in an optical path difference n{tilde over (L)}(t) between the different paths, where n is an average refractive inde... | 11/10/2009 |
| 7612893 | Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts Interferometric scanning method(s) and apparatus for measuring test optics having aspherical surfaces including those with large departures from spherical. A reference wavefront is generated from a known origin along a scanning axis. A test optic is aligned on the s... | 11/03/2009 |
