Did You Know...
...that when IBM conducted a market study of Chester Carlson's invention in 1959, the company concluded that it would take only 5000 units of his new product to saturate the market? IBM therefore declined to be part of the new product introduction. Too bad for IBM. Carlson's invention was the xerography process, and his new product was the beginning of the Xerox Corporation. It is estimated that every day, worldwide, 3,000,000,000 copies are made!!
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| Number | Title | Issue Date |
| 8041541 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components. ... | 10/18/2011 |
| 8000928 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components. ... | 08/16/2011 |
| 7904279 | Methods and apparatus for data analysis Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In additi... | 03/08/2011 |
| 7437271 | Methods and apparatus for data analysis A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to pro... | 10/14/2008 |
| 7395170 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components. ... | 07/01/2008 |
| 7356430 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and app... | 04/08/2008 |
| 7225107 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components. ... | 05/29/2007 |
| 7167811 | Methods and apparatus for data analysis A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to pro... | 01/23/2007 |
| 6792373 | Methods and apparatus for semiconductor testing A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising an outlier identification element configured to identify significant data in a set of test results. The test system may be conf... | 09/14/2004 |
| 6442499 | Methods and apparatus for statistical process control of test Methods and apparatus for statistical process control of test according to various aspects of the present invention optimize the wait period between applying input signals and collecting output test signal data. In one embodiment, a tester identifies one ... | 08/27/2002 |
