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...Daniel Webster invented a "bull plow" to pull out tree stumps. It didn't catch on because it was huge and required four oxen to pull it!
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| Number | Title | Issue Date |
| 8058889 | Probe card with segmented substrate A probe card for testing of semiconductor dice is provided. The probe card includes a mounting plate and a plurality of substrate segments supported by the mounting plate. ... | 11/15/2011 |
| 8058887 | Probe card assembly with interposer probes A probe test card assembly for testing a device under test includes interposer probes to connect a printed circuit board to a substrate. The probe test card assembly includes a printed circuit board, a substrate and a substrate holder. A plurality of test probes is ... | 11/15/2011 |
| 8026734 | Dual tip test probe assembly A dual tip test probe assembly for use in both cantilever and vertical probe applications includes first and second elongated test probes, each having a body portion and a tip portion with a tip configured to make contact with a device under test. An electrically-in... | 09/27/2011 |
| 8004299 | Cantilever probe structure for a probe card assembly A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the ful... | 08/23/2011 |
| 7733104 | Low force interconnects for probe cards A probe test card assembly for testing of a device under test includes a printed circuit board, a substrate and a substrate support structure. The substrate support structure holds the substrate in position with respect to the printed circuit board. The substrate su... | 06/08/2010 |
| 7679383 | Cantilever probe card A method and apparatus for a flattened probe element wire is provided. A probe element wire includes a beam portion and a tip portion. At least a part of the tip portion is flattened. Flattened probe element wires may have greater z-direction height strength, thereb... | 03/16/2010 |
| 7675302 | Probe card assembly and method of attaching probes to the probe card assembly A probe card assembly is provided. The probe card assembly includes a substrate layer defining a plurality of apertures and a plurality of probes. Each of the probes has a base and a tip. The base of each probe is configured to be at least partially inserted within ... | 03/09/2010 |
| 7638028 | Probe tip plating A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material. ... | 12/29/2009 |
| 7637009 | Approach for fabricating probe elements for probe card assemblies using a reusable substrate An approach is provided for fabricating probe elements for probe card assemblies. Embodiments of the invention include using a reusable substrate, a reusable substrate with layered probe elements and a reusable substrate with a passive layer made of a material that ... | 12/29/2009 |
| 7637007 | Approach for fabricating cantilever probes for probe card assemblies An approach for fabricating cantilever probes for a probe card assembly includes forming posts on conductive traces on a substrate. A beam panel having beam elements formed therein is aligned to the substrate so that the beam elements are in contact with the plurali... | 12/29/2009 |
| 7637006 | Beam assembly method for large area array multi-beam DUT probe cards A method for fabricating beams for a probe card includes dividing a large beam panel into smaller sub-panels before attaching the beams to corresponding posts on a substrate. Each sub-panel may have a sufficient number of beams to test several devices under test. Th... | 12/29/2009 |
| 7583098 | Automated probe card planarization and alignment methods and tools A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal ... | 09/01/2009 |
| 7495459 | Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probes A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system is provided. The probe card assembly includes a plurality of probes supported by a support substrate, each of the plurality of probes includi... | 02/24/2009 |
