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| Number | Title | Issue Date |
| 7848483 | Magnesium silicide-based multilayer x-ray fluorescence analyzers The present invention provides a multilayer structure including a substrate having formed on a surface thereof at least one period of individual layers, the period having at least two layers including a first layer which includes magnesium silicide and a second laye... | 12/07/2010 |
| 7450685 | X-ray fluorescence spectrometer and program for use therewith A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device (18) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr—Kα line... | 11/11/2008 |
| 7356114 | X-ray fluorescence spectrometer An X-ray fluorescence spectrometer includes an X-ray source 7 for irradiating a sample 1 at a predetermined incident angle ø with primary X-rays 6, and a detecting device 9 for measuring an intensity of fluorescent X-rays 8 genera... | 04/08/2008 |
| 7187751 | X-ray fluorescence spectrometer and program used therein A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a concentration of unmeasured elements as far as unmeasured elemen... | 03/06/2007 |
| 7016463 | Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer therefor To provide a sample retainer for X-ray fluorescence analysis, which is used in pretreating a liquid sample and then in X-ray fluorescence analysis of contents of such liquid sample, can sufficiently improve the limit of detection by suppressing the background and, a... | 03/21/2006 |
| 6937691 | X-ray fluorescence spectrometric system and a program for use therein An X-ray fluorescence spectrometric system includes a sample pre-treatment apparatus 10 for retaining on a surface of a substrate a substance to be measured that is found on the surface of the substrate, after such substance has been dissolved and subsequentl... | 08/30/2005 |
| 6836533 | Multi-layer film spectroscopic element for boron fluorescene X-ray analysis There is provided a multilayered spectroscopic device effective to achieve in a short length of time the highly accurate fluorescent X-ray analysis of boron wherein the influence that may be brought about by the interfering X-rays and the background is sufficiently ... | 12/28/2004 |
| 6824746 | High-energy beam irradiating desulfurization device The present invention is to provide an efficient and highly practical novel desulfurization device capable of executing the depth desulfurization. A high-energy beam irradiating desulfurization device for a petroleum product or a petroleum semimanufactured product, ... | 11/30/2004 |
| 6735276 | Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same A sample preprocessing system for a fluorescent X-ray analysis includes a sample preprocessing apparatus for retaining on a surface of a substrate a substance to be measured that is found on the surface of the substrate, after such substance has been dissolved and s... | 05/11/2004 |
| 6708121 | Analyzing apparatus An analyzing apparatus 1, such as a fluorescence X-ray analyzer, being able to analyze samples automatically, by transferring the samples into an analysis chamber, sequentially, comprising: an interruption recover device 11 for automatically turning on... | 03/16/2004 |
| 6700951 | X-ray fluorescence spectrometer To provide an X-ray fluorescence spectrometer of a simplified structure of a type in which a sample can be transported to an irradiating position where the sample is irradiated with primary X-rays and analysis can be achieved by positioning a target area ... | 03/02/2004 |
| 6668038 | X-ray fluorescence spectrometer Where an object to be analyzed in an X-ray fluorescence analysis is a thin film sample, the X-ray fluorescence spectrometer facilitates selection of proper secondary X-ray lines to be measured to thereby facilitate an accurate analysis. The spectrometer i... | 12/23/2003 |
| 6647090 | X-ray fluorescence spectrometer To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray... | 11/11/2003 |
| 6404847 | Continuously scanning X-ray analyzer having improved readiness and accuracy An X-ray analyzing apparatus capable of accomplish a rapid and accurate analysis is provided in which a detector for X-rays is rotated or shuttled to perform a continuous scanning. Determining a counting time for each of fixed scanning intervals by means ... | 06/11/2002 |
| 6337897 | Fluorescent X-ray analyzer A fluorescent X-ray analyzer includes a detector (6) for detecting fluorescent X-rays (5) emitted from a sample piece (1) to be analyzed, and a first collimator (10) disposed between the sample piece (1) and the detector (6) supported for movement between... | 01/08/2002 |
| 6292532 | Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type A fluorescent X-ray analyzing apparatus capable of being used as either a wavelength dispersive type or an energy dispersive type is provided, with which the analysis can be performed quickly and accurately. The fluorescent X-ray analyzing apparatus inclu... | 09/18/2001 |
| 6240159 | Fluorescent X-ray analyzer with path switching device A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a first spindle (14) having a longitudinal axis (O) passing ... | 05/29/2001 |
| 6028911 | X-ray analyzing apparatus with enhanced radiation intensity An X-ray analyzing apparatus includes a drive unit for moving a sample, a plurality of field-limiting slits each having a slit size corresponding to the size of a measuring area of the sample, a selector unit for selectively bringing the field-limiting sl... | 02/22/2000 |
| 5732120 | Fluorescent X-ray analyzing apparatus A fluorescent X-ray analyzing apparatus includes a source of excitation (2) for irradiating a silicon-based sample (S) with primary X-rays (B2) to excite the silicon-based sample (S), a detector (4) for detecting fluorescent X-rays (B5) emitted from the s... | 03/24/1998 |
| 5579362 | Method of and apparatus for the quantitative measurement of paint coating An apparatus for and a method of measuring at least one painted layer formed on a sample to be analyzed, which sample may be, for example, a galvanized steel including a substrate having the painted layer formed thereon with or without an intervention of ... | 11/26/1996 |
| 5406609 | X-ray analysis apparatus An X-ray analysis apparatus including an artificial multi-layered grating for rendering X-ray beams to be monochromatic before they are incident on a specimen to be analyzed. This artificial multi-layered grating operates to diffract the X-ray beam, gener... | 04/11/1995 |
| 5132997 | X-ray spectroscopic analyzing apparatus An X-ray spectroscopic analyzing apparatus which comprises a source of X-rays, a first analyzing crystal for diffracting the X-rays from the X-ray source, and a second analyzing crystal for diffracting the X-rays from the X-ray source and also for passing... | 07/21/1992 |
| 5103470 | Characteristic X-ray detecting device An X-ray detecting device for detecting characteristic X-rays emitted from a substance to be detected, which device comprises a vessel having a window defined therein for the passage of the characteristic X-rays emitted from the substance, therethrough in... | 04/07/1992 |
