Celebrity Inventors
Glam girl Heddy Lamar may have used her good looks to good effect on the silver screen, but she put her smarts to better use as an inventor. During World War II, she co-patented a frequency-switching system for torpedo guidance that was considered years ahead of its time.
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| Number | Title | Issue Date |
| 7405573 | Electrical connector for semiconductor device test fixture and test assembly An interconnect assembly is for use in connection with a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable including a plurality of wires with at least one wire for sensing a si... | 07/29/2008 |
| 7172450 | High temperature open ended zero insertion force (ZIF) test socket A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plura... | 02/06/2007 |
| 7151389 | Dual channel source measurement unit for semiconductor device testing A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit ... | 12/19/2006 |
| 7126361 | Vertical probe card and air cooled probe head system A probe card is vertically mounted generally perpendicular to a wafer undergoing life tests in a heated environment to limit exposure of the probe card to heat from the wafer chuck. The probe card and probe head assembly are mounted on a support rail which has one o... | 10/24/2006 |
| 7098648 | Automatic range finder for electric current testing In an electrical circuit for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current s... | 08/29/2006 |
| 7082676 | Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards An anti-electrostatic discharge (ESD) tool for engaging electronic device under test (DUT) boards whereby ESD damage to the tested devices is prevented. The tool includes an aluminum support frame, guides on opposing edges of one side of the frame for slidably recei... | 08/01/2006 |
| 7049713 | Pulsed current generator circuit with charge booster A pulsed current generator circuit for providing current pulses to a device under test includes a current source for applying a current to the device under test and a controlled current shunt for shunting current from the device under test. A booster circuit is prov... | 05/23/2006 |
| 6798228 | Test socket for packaged semiconductor devices A test socket assembly for use in testing integrated circuits includes a spring holder plate having a plurality of holes for receiving a plurality of electrically conducting springs, and a plurality of electrically conducting springs in the plurality of holes. A tes... | 09/28/2004 |
| 6784000 | Method for measurement of electromigration in semiconductor integrated circuits Electromigration testing is accelerated in the batch fabrication of semiconductor integrated circuits by forming test structures during the metal deposition phase of the batch fabrication process. Test metal lines can be formed on steps etched in a silicon oxide ins... | 08/31/2004 |
