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Assignee: Phicom Corporation


Location: Seoul, KR
No. of patents: 19

NumberTitleIssue Date
8117740Method and apparatus for manufacturing a probe card
In a method of manufacturing a probe card, a plurality of probe modules, including a sacrificial substrate and probes on the sacrificial substrate, is prepared. The probe modules are mutually aligned to form a probe module assembly having the aligned probe modules a...
02/21/2012
8114302Method of fabricating cantilever type probe and method of fabricating probe card using the same
Disclosed is a method of fabricating a cantilever type probes. According to this method, after forming grooves each in tip portion and dummy tip portion regions of a substrate, the tip portion and dummy tip portion are formed with filling the grooves of the tip port...
02/14/2012
8012331Probe and method of making same
Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of ...
09/06/2011
7975380Method of fabricating a probe card
Provided is a probe card and method of fabricating the same. This method comprises forming soldering bumpers electrically connected to conductive patterns on a substrate, forming probes connected to the conductive patterns and supported by the soldering bumpers, and...
07/12/2011
7886957Method of bonding probes and method of manufacturing a probe card using the same
In a method of manufacturing bonding probes, bump layer patterns are formed on terminals of a multi-layered substrate. A first wetting layer pattern having a wettability with respect to a solder paste, and a non-wetting layer pattern having a non-wettability with re...
02/15/2011
7867790Substrate of probe card and method for regenerating thereof
Provided are a substrate of a probe card for installing a plurality of probes thereon to inspect an object by contacting the probes to the object, and a method for repairing the substrate. The substrate includes main channels electrically connected to the probes; an...
01/11/2011
7859280Probe card for testing semiconductor devices
A probe card is disclosed that is easily assembled and maintained and configured to prevent the controlled level of a space transformer from changing due to various causes such as a thermal deformation during a test process. The probe card includes an installation m...
12/28/2010
7830162Vertical probe and methods of fabricating and bonding the same
Disclosed is a vertical probe and methods of fabricating and bonding the same. The probe is comprised of a contactor equipped with two tips, a connector electrically linking with a measuring terminal of a measurement system, And a bump connecting the contactor to th...
11/09/2010
7804312Silicon wafer for probe bonding and probe bonding method using thereof
Disclosed herein are a silicon wafer for probe bonding and a probe bonding method using the same. The silicon wafer for probe bonding is improved in structure to facilitate probe bonding on a probe substrate. The probe bonding method involves bonding supporting beam...
09/28/2010
7678587Cantilever-type probe and method of fabricating the same
Disclosed is a cantilever-type probe and methods of fabricating the same. The probe is comprised of a cantilever being longer lengthwise relative to the directions of width and height, and a tip extending from the bottom of the cantilever and formed at an end of the...
03/16/2010
7675305Vertical-type electric contactor and manufacture method thereof
A vertical-type electric contactor connected to a bump of an electric contactor is provided. The vertical-type electric contactor includes a support beam, vertically bonded with the bump, in which at least two elastic parts are spaced apart from each other; a fixed ...
03/09/2010
7602204Probe card manufacturing method including sensing probe and the probe card, probe card inspection system
There is provided a method of manufacturing a probe card. A first passivation pattern for implementing a tip portion of an electrical inspection probe and a tip portion of a planarity sensing probe on a sacrificial substrate is formed, and an etching process using t...
10/13/2009
7511524Contact tip structure of a connecting element
The present invention relates to a contact tip structure of a connecting element designed for electric testing of electronic components. The connecting element comprises a fixing post coupled to a first electronic component; a beam extending away from said fixing po...
03/31/2009
7503811Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
The present invention relates to a method of manufacturing an interconnect device for a printed circuit board. According to one aspect of the present invention, a method of manufacturing an interconnect device comprises forming a protective film pattern on a sacrifi...
03/17/2009
7466833Bone vibrating speaker using the diaphragm and mobile phone thereby
In a bone conduction speaker, a body has a shape of a cylinder, and a vibrating plate is inserted to a mastoid to close an upper opening portion of the body. An auxiliary vibrating plate is inserted to the mastoid under the vibrating plate. A vibrating coil is attac...
12/16/2008
7452248Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
An interconnect assembly including a contact, a first guide film, a space transformer, a second guide film, and an interconnect device including a second contact section having an O-ring-like shape to be inserted into the contact hole by an interference fit, a suppo...
11/18/2008
7319773Subminiature bone vibrating speaker using the diaphragm and mobile phone thereby
The present invention relates to a subminiature bone conduction speaker by using a vibrating plate and a mobile phone having the subminiature bone conduction speaker. A subminiature bone conduction speaker using a vibrating plate according to the present invention c...
01/15/2008
7306493Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
The present invention relates to an interconnect device for a printed circuit board, a method of manufacturing the same and an inter-connect assembly having the same. According to one aspect of the present invention, the interconnect device for a printed circuit boa...
12/11/2007
7285966Probe and method of making same
Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of ...
10/23/2007
 
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