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Assignee: Nihon Denshi Kabushiki Kaisha


Location: Tokyo, JA
No. of patents: 29

NumberTitleIssue Date
4349242Specimen observation apparatus including an optical microscope and a scanning electron microscope
A specimen observation apparatus for obtaining both an optical microscope image and a scanning electron microscope image simultaneously from one specimen. The apparatus includes a transparent glass plate having a transparent electrically conductive layer ...
09/14/1982
4283632Electron beam aperture device
A 10 to 50 microns thick apertured foil is coated on at least one of its sides with a material having a thickness of about 10 to 100 microns. The atomic number of the coating material is such that characteristic X-rays generated are effectively absorbed....
08/11/1981
4219732Magnetic electron lens
In a scanning electron microscope, an objective lens field is generated between a pair of deflecting coils and a specimen by an objective lens having upper and lower magnetic pole pieces. A supplemental magnetic pole piece is installed between said upper ...
08/26/1980
4214163Method and apparatus for correcting astigmatism in a scanning electron microscope or the like
In a scanning electron microscope, a circle of least confusion of the electron beam is formed on a specimen without operation of a stigmator, then the circle of least confusion is minimized by a stigmator, thereby enabling lens astigmatism in said microsc...
07/22/1980
4199681Method and apparatus for automatically focusing an electron beam in a scanning beam device
An electron beam device comprising a scanning means for automatically focusing said electron beam and a related method. The scanning means is controlled at all times to operate under optimum magnification and scanning speed conditions....
04/22/1980
4179605Cold trap for electron microscope
A specimen anticontamination device for an electron microscope incorporates a cold trap installed outside the magnetic pole pieces of the objective lens. This cold trap effectively absorbs the residual gases which contribute to the specimen contamination,...
12/18/1979
4155978Automatic chemical analyzer
An automatic chemical analyzer comprising an extractor for extracting the desired sample from a plurality of liquid samples, a measuring valve for measuring out a fixed quantity of the extracted sample, a plurality of reagent storage tanks each storing a ...
05/22/1979
4135095Apparatus for obtaining an X-ray image
A computed tomography apparatus in which a fan-shaped X-ray beam is caused to pass through a section of an object, enabling absorption detection on the opposite side of the object by a detector comprising a plurality of discrete detector elements. An elec...
01/16/1979
4119854Electron beam exposure system
A reference mark, common to both an electron beam and a workpiece, is arranged above and away from, but in the vicinity of, the workpiece exposure area. The position of the workpiece with respect to the reference mark is ascertained by an optical measurin...
10/10/1978
4090848Automatic analyzing apparatus
An automatic analyzing apparatus comprising a rotatable reaction device, a plurality of reaction tubes, said reaction device stepwise rotated by a driving means whereby a reaction tube is advanced through a plurality of functional positions, that is, at t...
05/23/1978
4071759Scanning electron device
A scanning electron microscope for displaying a scanning image on a cathode ray tube screen. A high magnification image is displayed within a low magnification image displayed on a cathode ray tube screen so that the relative positions of the low and high...
01/31/1978
4068145Insulated elastic support and clamping means for resistance heaters and emitter tip of electron gun
An electron gun having a thermionic emitter held by boron carbide heating members or the like, supported by electroconductive members which have additional elastic positioning members arranged to nullify the emitter shift and other effects caused by heat ...
01/10/1978
4068123Scanning electron microscope
A scanning electron microscope having a plurality of annular shaped electron detectors. The ratio of two detector output signals is compared with some constant value indicative of a component of the specimen. On the basis of the comparison the output sign...
01/10/1978
4054796Mass spectrometer with superimposed electric and magnetic fields
A mass spectrometer comprising superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam produced by an ion source is located on an equipotential surface in the electric field. The ion beam is acce...
10/18/1977
4051429Nuclear magnetic resonance apparatus
A nuclear magnetic resonance apparatus incorporating a first trans-receiver coil, an internal lock coil, a decoupling coil, means for tuning said coils to desired frequencies, a first trans-receiving system for supplying the first trans-receiver coil with...
09/27/1977
4045672Apparatus for tomography comprising a pin hole for forming a microbeam of X-rays
In an X-ray generating column, an X-ray microbeam is generated by irradiating a target with a scanning finely focused electron beam and permitting the microbeam to pass a pin hole in a beam guide plate or baffle. The take off direction of the X-ray microb...
08/30/1977
4020343Scanning electron device
A scanning electron microscope or other type of scanning electron device incorporating a light pen for automatically changing the field of view of a specimen on a CRT. The output of said light pen controls the center and/or width of the scanning area of t...
04/26/1977
4011450Scanning electron device
A scanning electron device having means for creating an electric field for directing secondary electrons to a detecting means comprising auxiliary electrodes and power supplies therefor so as to increase both the output signal intensity and contrast obtai...
03/08/1977
3984682Mass spectrometer with superimposed electric and magnetic fields
A mass spectrometer employing superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam is located on an equipotential surface in the electric field at right angles to the magnetic field. The ions ...
10/05/1976
3980811Contacting pickup optical reproduction system
A contacting pickup optical waveguide reproduction system and method for reproducing information carried on a recording medium. The recording medium is of the type having optically reflective pits formed in an information path. Information is stored as a ...
09/14/1976
3978888Rotary measuring valve
An analyzing apparatus which automatically and sequentially analyzes a large number and variety of chemical samples which are divided into a plurality of fractions, whereby each sample is simultaneously tested with different chemicals under suitable react...
09/07/1976
3978338Illumination system in a scanning electron microscope
A scanning electron microscope comprising a double gap lens in its electron beam irradiating system. The double gap lens is arranged between the electron gun and the final stage condenser lens, and is excited by a lens current such that a large change of ...
08/31/1976
3952198Electron lens
An electron lens system comprising a plurality of quadrupole elements, a plurality of octupole elements for correcting the spherical aberrations of said plurality of quadrupole elements, and an axially symmetric lens, arranged at the inlet or outlet side ...
04/20/1976
3944829Method and apparatus for processing a video signal from a scanning electron microscope
A scanning electron microscope for displaying a scanning image utilizing a time distributed pulsed video signal. The low frequency noises in the pulsed signal are deleted according to the occurrence of sudden pulse intensity variation between adjacent vid...
03/16/1976
3944827Virtual image type double focusing mass spectrometer
A virtual image type double focusing mass spectrometer having a diverging electrostatic field and a converging magnetic field, wherein parameters related to the fringing effects in the boundaries of said fields and to the distribution of the electrostatic...
03/16/1976
3938001Protection circuit for electron gun
An electron gun comprising a changeover chamber and changeover circuit between the gun chamber and the insulated cable which connects the power supply circuits to the electrodes which enables adjustment of electrode potentials to accomplish electrode trea...
02/10/1976
3937959Method and apparatus for automatically focusing
The sum of the intensity changes of one polarity in the video signal is used as a signal indicative of the diameter of the electron beam irradiating a specimen. A storage counter which produces the signal indicative of the beam diameter is reset periodica...
02/10/1976
3936756Field emission electron gun having automatic current control
An improved field emission type electron gun is automatically controlled so as to generate a stable emission current. The preferred embodiment employs a detecting means for detecting the emission current fluctuation and a control means for controlling the...
02/03/1976
3933436Automatic analyzing apparatus
An analyzing apparatus which automatically and sequentially analyzes a large number and variety of chemical samples which are divided into a plurality of fractions, whereby each sample is simultaneously tested with different chemicals under suitable react...
01/20/1976
 
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