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| Number | Title | Issue Date |
| 7855537 | Voltage supply circuit A voltage supply circuit includes an output transistor causing a first current to flow to an output terminal of the voltage supply circuit based on a control voltage applied from an error amplifier to a control terminal of the output transistor; and an overcurrent p... | 12/21/2010 |
| RE41880 | Semiconductor memory device A semiconductor memory device includes (a) a plurality of reference cells, (b) a plurality of memory cells, data stored in a selected reference cell among the reference cells being compared to data stored in a selected memory cell among the memory cells, (c) an addr... | 10/26/2010 |
| 7743301 | Semiconductor integrated circuit and method of testing same A semiconductor integrated circuit includes an MISR (Multiple-Input Signature Register) for generating and storing compressed code based upon code from a ROM, and for reading out and outputting the compressed data that has been stored. The MISR has a clock change-ov... | 06/22/2010 |
| 7741908 | High speed amplifier with controllable amplification and output impedance and comparator using the same In an amplifier including first and second power supply terminals, first and second output terminals, a first load connected between the first power supply terminal and the first output terminal, a second load connected between the first power supply terminal and th... | 06/22/2010 |
| 7719525 | Electronic device To reduce EMI and current consumption in internal wiring after display data have been input to a data driver. Display data DN/DP constituted by RSDS signals input to a data driver in a first stage are converted to display data DA constituted by CMOS signals, subject... | 05/18/2010 |
| 7716545 | Semiconductor integrated circuit and method for controlling the same A semiconductor integrated circuit includes a target circuit with at least a scan chain having sub scan chains of stages to sequentially shift a test data in response to a clock signal in a scan path test mode, and each of the sub scan chains includes first flip-flo... | 05/11/2010 |
| 7683819 | Analog-to-digital converting circuit Disclosed is a pipeline ADC in which an operational amplifier is shared between circuit blocks that construct local A/D converters of nth and (n+1)th stages, a sampling capacitor of the nth stage is divided into a plurality of sampling capacitors, and some of the pl... | 03/23/2010 |
| 7622801 | Thin planar semiconductor device A thin, planar semiconductor device having electrodes on both surfaces is disclosed. This semiconductor device is provided with an IC chip and a wiring layer having one side that is electrically connected to surface electrodes of the IC chip. On this surface of the ... | 11/24/2009 |
| 7602827 | Semiconductor laser and manufacturing process therefor There is provided a semiconductor laser comprising an n-InP substrate 1; a multilayer film including a strained MQW active layer 6 on the n-InP substrate 1; a p-electrode 18 on the multilayer film;... | 10/13/2009 |
| 7582970 | Carbon containing silicon oxide film having high ashing tolerance and adhesion A semiconductor device includes an interlayer insulating film formed on or over a semiconductor substrate. An opening is formed in the interlayer insulating film and reaches a lower layer metal wiring conductor. A metal plug is formed by filling the opening with Cu ... | 09/01/2009 |
| 7580293 | Semiconductor memory device A programmable non-volatile semiconductor memory device includes a select gate 3, arranged in a first region on a substrate, a floating gate 6 arranged in a second region neighboring to the first region, a first diffusion region 7 provided in a ... | 08/25/2009 |
| 7580134 | Method of measuring micro-structure, micro-structure measurement apparatus, and micro-structure analytical system This invention provides a method and an apparatus of measuring a micro-structure, capable of evaluating a geometry of a micro-structure formed typically on the surface of a semiconductor substrate, in a non-destructive, easy, precise and quantitative manner. A refle... | 08/25/2009 |
| 7528708 | Variation detection device, data communication apparatus, and method of detecting variation A variation detection device has a processor, an AD converter converting a signal voltage output from a sensor to generate an AD converted value and outputting the AD converted value to the processor, a temperature sensor detecting a temperature of the sensor, and a... | 05/05/2009 |
| 7528068 | Method for manufacturing semiconductor device A semiconductor device has through electrodes with property as an electrode and excellent in manufacturing stability. The through electrode composed of a conductive small diameter plug and a conductive large diameter plug is provided on the semiconductor device. A c... | 05/05/2009 |
| 7526697 | Memory test circuit and method To test memories operating with different operational clocks and deal with a delay involved in testing a memory at a physically remote location. A memory test circuit of the present invention tests a processor core memory and a function-specific core memory with a p... | 04/28/2009 |
| 7518242 | Semiconductor testing device A semiconductor device has a bonding pad configured to be bonded to a bonding member, a test pad configured to contact with a test probe at a test, and an internal circuit electrically connected to the bonding pad and the test pad. The bonding pad overlaps with the ... | 04/14/2009 |
| 7515150 | Semiconductor device capable of suppressing variation of current or voltage to be supplied to external circuit A semiconductor device is capable of suppressing variations of a current or a voltage to be supplied to an external circuit. The semiconductor device has a plurality of unit areas arrayed in one direction, and components in the unit areas are arranged in the same sh... | 04/07/2009 |
| 7514965 | Voltage comparator circuit with symmetric circuit topology A voltage comparator circuit is composed of a differential amplifier circuit receiving a pair of input signals to develop an output signal on an output terminal, and a waveform shaping circuit connected to the output terminal. The differential amplifier circuit incl... | 04/07/2009 |
| 7512187 | Mobile station capable of channel estimation using substantial single antenna at path switching, channel estimating apparatus and its receiving method A mobile station receives first and second signals from first and second antennas. A plurality of fingers each demodulate the signals for one propagation path. A Rake combiner combines the demodulated signals by removing phase fluctuations among the fingers. Each fi... | 03/31/2009 |
| 7476611 | Semiconductor device and manufacturing method thereof An interconnect trench is formed on a dielectric layer 12 and a first HSQ layer 14 formed on a semiconductor substrate, and a tantalum family barrier metal layer 24a is formed all over the substrate. Then a seed copper-containing metal la... | 01/13/2009 |
| 7459963 | Filter apparatus including differential slave gm-C filter with frequency characteristics automatically tuned by master circuit In a filter apparatus including a master circuit for receiving a reference frequency signal having a reference frequency to generate a control voltage and a slave gm-C filter formed by at least one operational transconductance amplifier and at least one capacitor wh... | 12/02/2008 |
| 7456444 | Field effect transistor A field effect transistor according to an embodiment of the invention includes: a semiconductor substrate; a channel layer of a first conductivity type formed on the semiconductor substrate; and a semiconductor layer of a second conductivity type that is buried in a... | 11/25/2008 |
| 7456440 | Electrostatic protection device The electrostatic protection device comprises a semiconductor substrate of a first conductivity type, a well of a second conductivity type formed on the semiconductor substrate, a first diffusion layer of the first conductivity type formed on the second conductivity... | 11/25/2008 |
| 7449393 | Method of manufacturing a semiconductor device with a shallow trench isolation structure In a method of manufacturing a semiconductor device with a shallow trench isolation structure, trenches are formed to extend into a semiconductor substrate. Subsequently, a first insulating film is formed to fill the trenches and to cover a whole surface of the semi... | 11/11/2008 |
| 7428608 | Communication system, communication circuit and communication method A communication system according to an embodiment of the invention includes: a plurality of communication nodes; and a common bus connected with the plurality of communication nodes, wherein the plurality of communication nodes individually checks a use state of the... | 09/23/2008 |
| 7421631 | Semiconductor device with termination resistor circuit A semiconductor device includes a signal line, a test load circuit and a termination circuit. The signal line is connected with an input/output node of the semiconductor device. The test load circuit has a test resistor and is provided between the signal line and a ... | 09/02/2008 |
| 7420279 | Carbon containing silicon oxide film having high ashing tolerance and adhesion An insulating film used for an interlayer insulating film of a semiconductor device and having a low dielectric constant. The insulating film comprises a carbon containing silicon oxide (SiOCH) film which has Si—CH2 bond therein. The proportion of Si—CH2 bond (1... | 09/02/2008 |
| 7408402 | Operational amplifier with less offset voltage An operational amplifier includes a differential pair section; a load section configured to function as active load of the differential pair section; and a switch section configured to switch supply of a differential input signal to the differential pair section and... | 08/05/2008 |
| 7405622 | Operational amplifier with less offset A differential amplifier includes an input stage circuit including a first differential pair and a second differential pair which are complementary to each other; a first current mirror circuit connected with the first differential pair and configured to function as... | 07/29/2008 |
| 7394270 | Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device The semiconductor device according to an aspect of the present invention is a semiconductor device having an electrode pad to be contacted a test probe for performing probe testing, a bonding area mark for defining a bonding area which performs wire boding on the el... | 07/01/2008 |
| 7382152 | I/O interface circuit of integrated circuit A plurality of transistor pairs of Pch and Nch transistors are connected in series between VDD and GND. An I/O terminal is connected to each connection point of the transistor pairs. Two transistor pairs constitute one transistor set, in which each of two Pch transi... | 06/03/2008 |
| 7360128 | Method of testing memory device A test method of a memory device equipped with an internal signal generating circuit which generates an internal signal with a fixed cycle asynchronous with a signal from the outside is disclosed in which when an entry information is input, an entry circuit generate... | 04/15/2008 |
| 7346123 | Quadrature modulator A quadrature modulator includes a local oscillator oscillating at an oscillation frequency equal to 4/(2N+1) times a carrier frequency where N is a natural number, a frequency conversion block for multiplying the oscillation frequency by a factor of (2N+1)/2, a divi... | 03/18/2008 |
| 7341945 | Method of fabricating semiconductor device A method of fabricating a semiconductor device prevents agglomeration of a seed metal layer in a recess. A recess is formed in a dielectric layer formed on or over a wafer. A seed metal layer (e.g., Cu or Cu alloy) is then formed on a bottom face and an inner side f... | 03/11/2008 |
| 7332748 | Electro-static discharge protection device An electro-static discharge protection device includes a first conductive type well and a second conductive type well which are formed in a surface of the first conductive type layer or a first conductive type substrate. A first high concentration second conductive ... | 02/19/2008 |
| 7277909 | High speed adder Provided is an adder composed of (N+1) circuit stages in the ease of 2.sup.N bits. In the case of N=4 (that is, 16 bits), provisional carries that indicate the case where carry is produced from a low order bit and the case where no carry is produced therefrom are ge... | 10/02/2007 |
| 7274090 | Electronic package and semiconductor device using the same A package for an electronic component according to one embodiment of the invention has a chip mounting area mounting a semiconductor chip in a hollow part of a metal plate and a plurality of connection electrodes to be connected to a substrate. The plurality of conn... | 09/25/2007 |
| 7266575 | Random number generator which can generate a random number based on an uniform distribution A random number generator includes a random pulse generator, a scrambler and a counter. The random pulse generator generates a plurality of random pulses. The scrambler generates an initial value. The counter generates a random number code based on the initial value... | 09/04/2007 |
| 7263539 | Circuit and method for generating fixed point data with reduced circuit scale A decoding rate is improved while reducing a circuit scale, in a fixed point data generating circuit. When a plurality of floating point data are inputted, for example, the maximum floating point data is detected as a reference data among the plurality of floating p... | 08/28/2007 |
| 7253363 | Circuit board A circuit board including a base member, an interconnect layer formed on a part of the base member, an electrically-floating conductive layer formed on a substantially remaining part of the base member and having an edge adjacent to an edge of the interconnect layer... | 08/07/2007 |
