Bizarre Patents
Crispy Chip Sandwich and Process of Producing a Sandwich Product
A food product comprising a multilayer cookie or snack having outer layers formed from a crispy type edible food product such as a potato chip or corn chip, etc. with an intermediate marshmallow layer being in contact with the inner surface of each crispy chip and one or more filler substances.
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| Number | Title | Issue Date |
| 7952082 | Sample preparation system A sample preparation system in which an ion beam is made to hit the surface of a sample while rotating the sample about an axis perpendicular to the processed surface of the sample under the condition where the processed surface of the sample is not perpendicular to... | 05/31/2011 |
| 7387016 | Atomic force microscope and method of energy dissipation imaging using the same An atomic force microscope and method of energy dissipation imaging using such atomic force microscope. The atomic force microscope has a cantilever equipped with a probe for making contact with a sample, a vibrating unit for vibrating the cantilever, a vibration co... | 06/17/2008 |
| 7329881 | Charged-particle beam system A charged-particle beam system used to fabricate or inspect semiconductor devices comprises the charged-particle beam accurately brought into position on a workpiece. The system has a workpiece stage, a laser metrology system for measuring movement of the stage, a f... | 02/12/2008 |
| 7278296 | Scanning probe microscope The present invention is intended to solve the problem that the tip of the probe of a scanning probe microscope cannot be conditioned stably due to overload in a contact region. This problem is solved by a scanning probe microscope for scanning the probe and a sampl... | 10/09/2007 |
| 7270783 | Analysis system and analysis method An analysis system which permits sample pretreatment which comprises: a sample rack; a sample container supply, a sample dispenser, a solvent-removing evaporator, a solvent dispenser for dispensing a second solvent, a sample-stirring means, a sample aspirating-and-t... | 09/18/2007 |
| 7245126 | NMR method and apparatus There is disclosed an NMR measurement method and NMR apparatus in which the temperature of the NMR detection coil or the RF irradiation coil hardly varies if pulsed RF power is applied to the coil during NMR measurements. The apparatus includes the detection coil or... | 07/17/2007 |
| 7241995 | Electron microscope equipped with magnetic microprobe There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microsco... | 07/10/2007 |
| 7230234 | Orthogonal acceleration time-of-flight mass spectrometer An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer has an ion source producing ions, a first region of a low degree of vacuum, an ion reservoir, and a second region of a high degree of vacuum. A space for transporting the ions produced by the ion s... | 06/12/2007 |
| 7202476 | Charged-particle beam instrument A charged-particle beam instrument is offered which can inspect side and rear surfaces of a sample. Two electron optical microscope columns are mounted in a vacuum chamber. Each of the microscope columns has an electron gun, a condenser lens system, a deflector, and... | 04/10/2007 |
| 7202471 | Method and apparatus for mass spectrometry A method of mass spectrometry. The method starts with gaining a total ion chromatogram by a mass spectrometer. An accumulation mass spectrum indicating vicinities of a desired peak top of the total ion chromatogram is displayed. The operator selects a desired mass p... | 04/10/2007 |
| 7189977 | Electrospray mass spectrometer and ion source An inexpensive electrospray mass spectrometer capable of performing measurements consecutively from the ESI mode to the cold-spray ionization mode and vice versa. The electrospray mass spectrometer has an electrospray ion source, a nebulization nozzle, and a samplin... | 03/13/2007 |
| 7161149 | Scanning electron microscope and method of controlling same A scanning electron microscope has an electron gun producing the electron beam, an objective lens for sharply focusing the beam onto the specimen, a tilting mechanism for tilting the specimen relative to the beam, and a power supply for applying the negative voltage... | 01/09/2007 |
| 7154092 | Method of three-dimensional image reconstruction and transmission electron microscope Method of three-dimensional image reconstruction and transmission electron microscope capable of producing three-dimensional images. When a TEM image is taken at each tilt angle of a specimen, the amount of defocus Δf is switched to plural amounts Δf1, ... | 12/26/2006 |
| 7112963 | NMR measurement method There is disclosed an NMR measurement method and NMR apparatus in which the temperature of the NMR detection coil or the RF irradiation coil hardly varies if pulsed RF power is applied to the coil during NMR measurements. The apparatus includes the detection coil or... | 09/26/2006 |
| 7106059 | Method of quantifying magnetic resonance spectrum A method is offered which is capable of quantifying all the peaks of a magnetic resonance spectrum based on a theoretical relationship between the real and imaginary parts of the spectrum without phase correcting the peaks. First, the spectra of the real and imagina... | 09/12/2006 |
| 7095031 | Method of automatically correcting aberrations in charged-particle beam and apparatus therefor The present invention provides method and apparatus for automatically correcting aberrations in a charged-particle beam. The apparatus extracts line profiles from the probe profile of the charged-particle beam. Features indicative of the line profile, i.e., μ, σ, ... | 08/22/2006 |
| 7091498 | Rotating specimen holder A specimen holder having a holder body and a specimen-holding member is used. The holder body has a hole in which a step surface is formed. The specimen-holding member is supported from the step surface in the hole of the holder body and positioned within the hole. ... | 08/15/2006 |
| 7069195 | Magnetic field gradient coil assembly and method of designing same A method of designing a small-sized, self-shielding magnetic field gradient coil assembly that is for use in an NMR spectrometer, provides high approximation accuracy, is simple in structure, and has a large inside diameter. The gradient coil assembly consists of ti... | 06/27/2006 |
| 7064326 | Electron microscope An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computeriz... | 06/20/2006 |
| 7060985 | Multipole field-producing apparatus in charged-particle optical system and aberration corrector Spherical aberration correction optics are offered which have an auxiliary function of determining control parameters easily and at any time while canceling deflecting and quadrupole fields in the instrument. The correction optics have a control unit for determining... | 06/13/2006 |
| 7049505 | Wire member and method of fabricating same A wire member adapted to be used in a detection coil of an NMR spectrometer's probe. The wire member has a sleeve made of a copper tube having a high electrical conductivity, strands made of platinum, and a thin film of gold or rhodium formed on the surface of the s... | 05/23/2006 |
| 7049611 | Charged-particle beam lithographic system When the focal point of the objective lens of a charged-particle beam lithographic system is shifted according to the deflection position within a writing field, the image magnification of the objective lens will vary. In the present invention, the focal point of th... | 05/23/2006 |
| 7049605 | Detector using microchannel plates and mass spectrometer A mass spectrometer detector having a coupling capacitor including an anode that is placed at a high potential of say −4.9 kV. An annular electrode is placed outside the anode. A voltage of say −5 kV is applied to the annular electrode. This reduces the potentia... | 05/23/2006 |
| 7049609 | Method of verifying proximity effect correction in electron beam lithography Verifying whether correcting data used for proximity effect correction is normal before or during actual lithographic writing. A lithographically written region is virtually divided into subfields. Verification of a correcting value for proximity effect correction f... | 05/23/2006 |
| 7034288 | Time-of-flight mass spectrometer A time-of-flight mass spectrometer capable of cutting out a major portion of carrier gas-derived ions ahead of the ion reservoir. The ion source is of the electron impact type and has source magnets for deflecting some of the produced ions away from the center axis ... | 04/25/2006 |
| 7030389 | Electron beam apparatus having electron analyzer and method of controlling lenses An electron beam apparatus having an electron analyzer is achieved which can control the illumination lens system by feedback without adversely affecting the imaging action even if a specimen is positioned within the magnetic field of the objective lens. The apparat... | 04/18/2006 |
| 7026614 | Automatic methods for focus and astigmatism corrections in charged-particle beam instrument Automatic methods for focus and astigmatism corrections in a charged-particle beam instrument find an amount of excitation of the objective lens that provides the position of a circle of least confusion and can perform accurate automatic corrections of focus and ast... | 04/11/2006 |
| 7023208 | Method of optimizing NMR measurement condition There is disclosed a method of finding a reliable optimum value of a measurement condition in an NMR measurement. This method starts with gaining NMR measurement data while varying the value of the measurement condition to be optimized. Then, a certain property is e... | 04/04/2006 |
| 6983644 | Specimen observation method in atomic force microscopy and atomic force microscope A method and apparatus for observing a specimen in atomic force microscopy with a vibrating cantilever maintained in resonance while a probe attached to the cantilever is maintained in contact with the specimen. The Q factor of the cantilever is determined based upo... | 01/10/2006 |
| 6968043 | X-ray analyzer There is disclosed an X-ray analyzer capable of precisely measuring a trace amount of cadmium contained in plastic. The analyzer has an X-ray filter assembly between an X-ray tube having an Rh target and a plastic sample. The filter assembly consists of first, secon... | 11/22/2005 |
| 6960763 | Energy filter and electron microscope An energy filter with reduced aberration. The energy filter has a first stage of filter for receiving an electron beam entering along the optical axis and for focusing the beam in one direction vertical to the optical axis and a second stage of filter positioned alo... | 11/01/2005 |
| 6949736 | Method of multi-turn time-of-flight mass analysis A method of mass analysis using a multi-turn time-of-flight mass spectrometer starts with recording plural heterogeneous turn number spectra F1(t), F2(t), . . . , Fq(t) containing plural ion peaks that might be different in number of... | 09/27/2005 |
| 6930312 | Charged-particle beam instrument and method of correcting aberration therein An aberration correction method and charged-particle beam instrument with four stages of multipole units. The two central stages of multipole units function as two stages of magnetic quadrupole components for superimposing a magnetic potential distribution analogous... | 08/16/2005 |
| 6924488 | Charged-particle beam apparatus equipped with aberration corrector A charged-particle beam instrument with an aberration corrector which comprises four stages of electrostatic quadrupole elements, two stages of magnetic quadrupole elements for superimposing a magnetic potential distribution analogous to the electric potential distr... | 08/02/2005 |
| 6914430 | NMR probe A nuclear magnetic resonance (NMR) probe is offered which can minimize positional shift of the detector portion caused by shrinkage of the support post due to cooling of the detector portion. The NMR probe has a vacuum-insulated container and the detector portion de... | 07/05/2005 |
| 6904164 | Method of inspecting accuracy in stitching pattern elements A method of quickly and accurately inspecting the stitching accuracy at which regions of a lithographic pattern are stitched at boundaries. The numerous regions of the lithographic pattern are exposed or delineated, one at a time. Inspected regions are scanned with ... | 06/07/2005 |
| 6888137 | Instrument and method for observing selected stored images acquired from a scanning charged-particle beam There is disclosed a scanning electron charged-particle beam instrument facilitating a search for a desired field of view on a specimen. Also, a method of observing a specimen image with this instrument is disclosed. In field of view search mode, low-magnification i... | 05/03/2005 |
| 6882517 | Raw material composite for carbon material used in electric double layer capacitor, manufacturing method of the same, electric double layer capacitor, and manufacturing method of the same A raw material composite 10 for a carbon material used in an electric double layer capacitor contains microcrystalline carbon having a layered crystal structure similar to graphite, and is formed a carbon material for an electric double layer capacitor by undergoing... | 04/19/2005 |
| 6858845 | Scanning electron microscope A scanning electron microscope has an electron gun for producing an electron beam, a specimen holder holding the specimen, an objective lens for sharply focusing the beam onto the specimen, and a power supply for applying a negative voltage to the specimen. A shield... | 02/22/2005 |
| 6855747 | Method of producing ion sensitive film for ion sensor There is disclosed a method of easily producing a long-lived ion sensitive film having excellent durability and used in an ion sensor. The method starts with preparing a monomer mixture consisting chiefly of monomer units including a functional group and a second gr... | 02/15/2005 |
