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| Number | Title | Issue Date |
| 5369372 | Method for resistance measurements on a semiconductor element with controlled probe pressure A method for measuring the resistance or conductivity between two or more conductors which are placed against a semiconductor element, wherein in order to bring the contact resistance between the conductors and the element to, to hold it at,a predetermine... | 11/29/1994 |
| 5272369 | Circuit element with elimination of kink effect A circuit element which includes a source region of a first conductance type provided with a source terminal, an intermediate region of the first conductance type separated from the source region by a first volume, a first channel region portion of a seco... | 12/21/1993 |
| 5271084 | Method and device for measuring temperature radiation using a pyrometer wherein compensation lamps are used Method and apparatus for measuring the radiation originating from one side of a wafer of semiconductor material using a pyrometer, wherein non-blackbody compensation radiation is projected onto that side to compensate for the reflectivity of the wafer of ... | 12/14/1993 |
| 5035479 | Device for optical signal processing showing transistor operation An optical device provided with a junction region for reflecting radiation to be transmitted in the device, and a gate for controlling the electron density in said junction region, is fast and simple to manufacture.... | 07/30/1991 |
| 5036273 | System of measuring a state density in a semi-conductor element and a method using this system A system of measuring a state density in a semi-conductor element and a method using this system. The system measuring a state density in a semi-conductor element comprises a pulse generator and a control unit for controlling size and shape of the pulses,... | 07/30/1991 |
