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An armor with rollers is provided that enables a user to move in all positions by rolling on a hard and smooth surface while constantly varying his bearing points on the ground.
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| Number | Title | Issue Date |
| 7683318 | Laser atom probe A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the... | 03/23/2010 |
| 7652269 | Laser atom probe methods A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the... | 01/26/2010 |
| 7157702 | High resolution atom probe A three dimensional atom probe comprising a sharp specimen (10) coupled to a mounting means (12) where emission of charged particles is caused by application of a potential to the specimen tip (10) such that charged particles are influenced by f... | 01/02/2007 |
| 7019307 | Delay line anodes In detectors for imaging and other applications, delay line anodes are arrayed so as to allow detection of the location and/or timing of particle hits. The anodes are arrayed to provide an upper anode and one or more lower anodes, with particles incident on the uppe... | 03/28/2006 |
| 6762415 | Vacuum chamber with recessed viewing tube and imaging device situated therein A vacuum chamber includes chamber walls separating a chamber interior and a chamber exterior, with one or more access ports defined in the chamber walls. A viewing tube extends from the chamber exterior into the chamber interior and terminates in a window. A positio... | 07/13/2004 |
| 6700121 | Methods of sampling specimens for microanalysis Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study obj... | 03/02/2004 |
| 6576900 | Methods of sampling specimens for microanalysis Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study obj... | 06/10/2003 |
