Assignee: Hynix Semiconductor, Inc.

Location: KR
No. of patents: 23

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Number	Title	Issue Date
8164195	Pad structure of semiconductor integrated circuit apparatus A pad structure of a semiconductor integrated circuit apparatus includes a semiconductor substrate upon which circuit patterns forming a device are disposed, a pad disposed on an uppermost part of the semiconductor substrate, and a plurality of fixing parts, each di...	04/24/2012
8154326	Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuit A power control circuit includes a check unit that receives a reference clock and generates a check signal for cyclically activating a feedback loop of a DLL circuit, a phase detecting unit that detects a phase difference between the reference clock and a feedback c...	04/10/2012
8149953	Data receiver of semiconductor integrated circuit A semiconductor integrated circuit equipped with an equalizer which has a circuit structure simpler than that of a related equalizer according to an FFE scheme or a DFE scheme and is capable of preventing a noise component from being amplified. The data receiver inc...	04/03/2012
8149639	Test apparatus of semiconductor integrated circuit and method using the same A test apparatus includes a test fuse unit for generating a test fuse signal in response to a test mode signal during a test time and generating a test fuse signals according to a fuse cutting after a termination of the test time, a combination signal generating uni...	04/03/2012
RE42976	Semiconductor memory device with reduced data access time A memory device includes at least two cell blocks connected to a global bit line for outputting data in response to an instruction; at least one global bit line connection unit for selectively connecting the global bit line to each cell block under control of a cont...	11/29/2011
8065550	Digital delay locked loop circuit using mode register set A semiconductor memory device includes a mode register set for establishing information on a delay time, a delay time calculator for calculating an I/O path delay time of a data clock on a basis of a unit period of a system clock, and a delay locked clock generator ...	11/22/2011
8050135	Semiconductor memory device A semiconductor memory device includes: a first address buffer configured to be used in a test mode and a normal mode and to receive more addresses in the test mode than in the normal mode; and a second address buffer configured to be used in the normal mode and dis...	11/01/2011
8050113	Core voltage discharger and semiconductor memory device with the same A core voltage discharger is capable of adjusting an amount of a current discharged according to temperature. The discharger for decreasing a level of a predetermined voltage receives temperature information from an on die thermal sensor and discharges a different a...	11/01/2011
8049262	Semiconductor device with increased channel length and method for fabricating the same A semiconductor device includes a trench formed in a predetermined portion of a substrate and a first recess region beneath the trench. A field oxide layer is buried into both the trench and the first recess region. An active region is defined by the field oxide lay...	11/01/2011
8035442	Semiconductor device A semiconductor device including a pumping capacitor for inducing a high voltage, a switching circuit for transferring the high voltage induced by the pumping capacitor and a switching control circuit for controlling the switching circuit, wherein the switching cont...	10/11/2011
8026557	Semiconductor device with increased channel length and method for fabricating the same A semiconductor device with an increased channel length and a method for fabricating the same are provided. The semiconductor device includes: a substrate with an active region including a planar active region and a prominence active region formed on the planar acti...	09/27/2011
8024628	Apparatus and method for testing semiconductor memory device A semiconductor memory device for performing a reliability test includes a write driving block for generating a predetermined test voltage in a test mode and delivering a data inputted from an external circuit into the local I/O line pair during a data access operat...	09/20/2011
8022409	Semiconductor device with omega gate and method for fabricating a semiconductor device A substrate has an active region divided into storage node contact junction regions, channel regions and a bit line contact junction region. Device isolation layers are formed in the substrate isolating the active region from a neighboring active region Recess patte...	09/20/2011
7957213	Semiconductor memory apparatus A semiconductor memory apparatus includes: a compensation voltage input node; a core voltage generator configured to generate a core voltage using an external power source voltage and supply the core voltage to the compensation voltage input node; a compensation con...	06/07/2011
7683684	Power-down mode control apparatus and DLL circuit having the same A power-down mode control apparatus includes an internal power-down control block configured to receive a locking completion signal and to generate an internal power-down signal, which is toggled for a predetermined time; a noise check block configured to check occu...	03/23/2010
7667330	Semiconductor device for preventing inflow of high current from an input/output pad and a circuit for preventing inflow of high current thereof A semiconductor device includes an input/output pad, an input line of an internal circuit, and a plurality of metal lines formed on a lower portion of the input/output pad to have a buffer area overlapping with a plane area of the input/output pad, wherein one of an...	02/23/2010
7656729	Circuit and method for decoding column addresses in semiconductor memory apparatus A column address decoding circuit of a semiconductor memory apparatus includes a predecoder configured to combine a column address and a decoding test signal, thereby outputting a decoding address. A main decoder receives the decoding address, thereby outputting a p...	02/02/2010
7643361	Redundancy circuit capable of reducing time for redundancy discrimination A redundancy circuit in a semiconductor memory apparatus includes a comparison signal receiving unit to receive a plurality of comparison signals and a fuse enable signal in parallel, wherein the comparison signals are generated by comparing a plurality of row addre...	01/05/2010
7619433	Test circuit for a semiconductor integrated circuit A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated in read operation; and a data output buffer for masking some of data...	11/17/2009
7580320	Multi-port memory device There is provided a column repair technology of a semiconductor memory device. The semiconductor memory device includes: a normal bus connection part for transmitting/receiving data between global data buses and local data buses of each bank; a redundant bus connect...	08/25/2009
7567117	Data output clock signal generating apparatus and semiconductor integrated circuit with the same A data clock control apparatus includes a bias voltage generator configured to receive a plurality of test mode signals and a plurality of fuse signals and to generate a bias voltage to secure a predetermined potential difference from an external driving power suppl...	07/28/2009
7507657	Method for fabricating storage node contact in semiconductor device Disclosed is a method for fabricating a plurality of storage node contacts in a semiconductor device capable of minimizing an influence of a slurry residue and planarizing cruspidal patterns caused during a storage node contact isolation process. In accordance with ...	03/24/2009
7505297	Semiconductor memory device Provided are semiconductor design technologies, especially a bit line sense amplifier array of a semiconductor memory device. The semiconductor memory device includes a plurality of unit bit line sense amplifiers, a pull-up power line which is a power line of the pl...	03/17/2009

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Assignee: Hynix Semiconductor, Inc.