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Assignee: Hynix Semiconductor Inc.


Location: Icheon-si, KR
No. of patents: 832

1                      
NumberTitleIssue Date
8184494Cell inferiority test circuit
A cell inferiority test circuit includes a compression data generator configured to compress selected data in response to selection signals and to generate compression data including information about cell inferiority, a strobe signal delayer configured to delay a s...
05/22/2012
8183112Method for fabricating semiconductor device with vertical channel
A method for fabricating a semiconductor device with a vertical channel includes providing a substrate over which a hard mask pattern is formed, forming pillars over the substrate using the hard mask pattern thereby forming a resultant structure, forming an insulati...
05/22/2012
8174879Biosensor and sensing cell array using the same
A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array inc...
05/08/2012
8169048Isolation structure in a memory device
An isolation structure in a memory device and a method for fabricating the isolation structure. In the method, a first trench is formed in a cell region of a semiconductor substrate and a second trench in a peripheral region of the semiconductor substrate. A liner l...
05/01/2012
8168491Method for fabricating dual poly gate in semiconductor device
A method for fabricating a dual poly gate in a semiconductor device, comprising: forming a gate insulation layer and a polysilicon layer on a semiconductor substrate that defines a first region and a second region; implanting first and second conductive type impurit...
05/01/2012
8168448Ferroelectric register, and method for manufacturing capacitor of the same
The present invention discloses a ferroelectric register and a method for manufacturing a capacitor of the same. The ferroelectric register is configured to reduce probability of data storage failure due to a weak state capacitor, by connecting a plurality of capaci...
05/01/2012
8165263Counting circuit and address counter using the same
A counting circuit includes first to fifth flip-flops (FFs) and a logic operation unit. Each of the first to fourth FFs has an initial value based on a preset control signal input through a 4-bit set terminal. Each of the first to fourth FFs receives a signal at a c...
04/24/2012
8164143Semiconductor device
A method for fabricating a semiconductor device comprises: performing a thermal process to expanding a local doped region formed between gate patterns on a semiconductor substrate; and etching a central region of an expanded local doped region so that the expanded l...
04/24/2012
8163646Interconnection wiring structure of a semiconductor device and method for manufacturing same
A method for manufacturing an interconnection wiring structure of a semiconductor device includes forming an isolation region, which arranges active regions in a diagonal direction, in a semiconductor substrate; forming first damascene trenches, which open upper por...
04/24/2012
8163627Method of forming isolation layer of semiconductor device
A method of forming an isolation layer of a semiconductor device is disclosed herein, the method comprising the steps of providing a semiconductor substrate in which a tunnel insulating layer and a charge storage layer are formed on an active area and a trench is fo...
04/24/2012
8163614Method for forming NAND typed memory device
A method for fabricating a NAND type flash memory device includes defining a select transistor region and a memory cell region in a semiconductor substrate, forming a tunnel insulating layer, a floating gate conductive layer, and a dielectric layer over a semiconduc...
04/24/2012
8163446Method for manufacturing photomask using self-assembled molecule layer
A method for fabricating a photomask using a self-assembled molecule layer, comprising: forming, on a transparent substrate, a stacked structure of a phase shift pattern and a light shielding pattern over the phase shift pattern, the stacked structure exposing a por...
04/24/2012
8163445Extreme ultraviolet mask and method for fabricating the same
An EUV mask comprises a multi-reflecting layer is formed over a substrate and reflecting EUV light; an absorber layer pattern defining a sidewall formed over the multi-reflecting layer formed and selectively exposing a region of the multi-reflecting layer; and a ref...
04/24/2012
8163190Method for fabricating a fine pattern
In a method for fabricating a fine pattern, a target layer to be patterned is formed on a semiconductor substrate. A sacrificial pattern is formed on the target layer. The sacrificial pattern includes first sacrificial patterns arranged at a first spacing, and secon...
04/24/2012
8159883Semiconductor memory device having a block decoder for preventing disturbance from unselected memory blocks
A semiconductor memory device can improve electrical properties by prohibiting a leakage current, which flows through a memory cell, in such a way as to turn off a drain select transistor, a source select transistor and a side transistor of an unselected memory cell...
04/17/2012
8158305Photomask for extreme ultraviolet lithography and method for fabricating the same
A method for fabricating a photomask for extreme ultraviolet lithography is provided. A reflection layer reflecting extreme ultraviolet light is formed over a transparent substrate having a main chip region and a frame region. A phase shifter pattern is formed over ...
04/17/2012
8154949Burst termination control circuit and semiconductor memory device using the same cross-references to related application
A burst termination control circuit includes: a pull-up unit for pulling up a first node in response to a burst termination signal, a latch unit for latching a signal of the first node, a buffer for generating a first termination control signal for stopping data out...
04/10/2012
8153483Semiconductor device having a vertical transistor and method for manufacturing the same
A semiconductor device having a vertical transistor comprises a silicon substrate; a drain region, a channel region and a source region vertically stacked on the silicon substrate; a buried type bit line formed under the drain region in the silicon substrate to cont...
04/10/2012
8153447Nonvolatile ferroelectric perpendicular electrode cell, FeRAM having the cell and method for manufacturing the cell
A nonvolatile ferroelectric perpendicular electrode cell comprises a ferroelectric capacitor and a serial PN diode switch. The ferroelectric capacitor includes a word line perpendicular electrode as a first electrode and a storage perpendicular electrode as a second...
04/10/2012
8152029Pump dispenser with bypass back flow
A dispensing apparatus is disclosed. The dispensing apparatus has a product container for holding the fluid; a chamber including a dispensing cylinder having an inlet and an outlet; an inlet check valve disposed at the inlet of the chamber, the inlet check valve bei...
04/10/2012
8151222Method for decomposing designed pattern layout and method for fabricating exposure mask using the same
A method for decomposing a designed pattern layout and a method for fabricating an exposure mask using the same. After the designed pattern layout is automatically decomposed to obtain a plurality of mask layouts, a problematic region is determined through simulatio...
04/03/2012
8149642Semiconductor memory device
A semiconductor memory device includes a first power switch for interrupting supply of a first power voltage to a first node in a standby mode, and a second power switch connected between the first node and a second node applied with a second power voltage. ...
04/03/2012
8148267Method of forming isolation layer of semiconductor memory device
A method of forming isolation layers of a semiconductor memory device. In accordance with an embodiment of the invention, a semiconductor substrate in which trenches are formed is provided. A first dielectric layer is formed over the semiconductor substrate includin...
04/03/2012
8148231Method of fabricating capacitor
A semiconductor device and a method of fabricating the same include an electrode having a nickel layer with impurities. The electrode having a nickel layer with impurities can be a gate electrode or a capacitor electrode. The electrode having a nickel layer with imp...
04/03/2012
8143163Method for forming pattern of semiconductor device
A method for manufacturing a semiconductor device comprises performing a CMP process using an oxide film as an etching barrier film to maintain a polysilicon layer having a large open area. A word line pattern, a DSL pattern, and a SSL pattern that are formed by a f...
03/27/2012
8143160Method of forming a contact plug of a semiconductor device
In a method of forming a contact plug of a semiconductor device, a nitride layer is prevented from being broken by forming a passivation layer over the nitride layer when contact holes are formed by etching an insulating layer between select lines formed over a semi...
03/27/2012
8141005Apparatus for OPC automation and method for fabricating semiconductor device using the same
An OPC automation apparatus and manufacturing method of a semiconductor device using the same, being capable of improving the fabrication yield of a semiconductor device by establishing a system and an OPC automation apparatus in which an engineer computer and a wor...
03/20/2012
8138821High voltage pumping circuit
A swing width control circuit and a high voltage pumping circuit using the same are disclosed. The swing width control circuit includes a swing width controller for receiving a first pumping signal having a first swing width and generating a second pumping signal ha...
03/20/2012
8133818Method of forming a hard mask pattern in a semiconductor device
In a method of forming a hard mask pattern in a semiconductor device, only processes for forming patterns having a row directional line shape and a column directional line shape on a plane are performed so that the hard mask patterns can be formed to define densely ...
03/13/2012
8133547Photoresist coating composition and method for forming fine contact of semiconductor device
A coating composition containing a coating base resin and a C4-C10 alcohol as a main solvent, and a method for forming a fine contact of a semiconductor device including the steps of preparing the coating composition, forming a photoresist film...
03/13/2012
8130564Semiconductor memory device capable of read out mode register information through DQ pads
A semiconductor memory device is provided that is capable of reading out mode register information stored in a register adapted for LPDDR2 (Low Power DDR2), through DQ pads. The semiconductor memory device includes a mode register control unit configured to receive ...
03/06/2012
8130082RFID system including a programmable RF tag
A radio frequency (RF) tag is provided with an antenna coil adapted and configured to wirelessly exchange data with a read/write terminal, a RF transmitting/receiving unit adapted and configured to modulate and demodulate data exchanged via the antenna coil, a proto...
03/06/2012
8129251Metal-insulator-metal-structured capacitor formed with polysilicon
A METAL-INSULATOR-METAL structured capacitor is formed with polysilicon instead of an oxide film as a sacrificial layer material that defines a storage electrode region. A MPS (Meta-stable Poly Silicon) process is performed to increase the surface area of the sacrif...
03/06/2012
8129094Method for manufacturing a semiconductor device
A spacer is formed on side and top portions of a photoresist pattern after a mask process is performed so that the spacer may be used as an etching mask. The spacer is formed using a polymer deposition layer which is a low temperature oxide or nitride that can be de...
03/06/2012
8125828Page buffer circuit with reduced size and methods for reading and programming data with the same
A page buffer circuit with reduced size and methods for reading and programming data is provided. In the reading operation, the page buffer circuit reads out a data bit by alternatively using a higher bit register or a lower bit register regardless of whether the da...
02/28/2012
8124478Method for fabricating flash memory device having vertical floating gate
A method for fabricating a flash memory device includes forming a control gate having a hollow donut shape over an insulation layer formed over a substrate. The method also includes forming an inter-poly dielectric of a spacer shape on an inner wall of the control g...
02/28/2012
8120113Metal line in semiconductor device
A metal line in a semiconductor device includes an insulation layer having trenches formed therein, a barrier metal layer formed over the insulation layer and the trenches, a metal layer formed over the barrier metal layer, wherein the metal layer fills the trenches...
02/21/2012
8119475Method of forming gate of semiconductor device
A method of forming a gate of a semiconductor device comprising providing a semiconductor substrate over which a gate insulating layer, a first conductive layer, a dielectric layer, and a second conductive layer are sequentially formed, the semiconductor substrate d...
02/21/2012
8116155Apparatus for measuring data setup/hold time
An apparatus for measuring data setup/hold time is capable of effectively measuring a setup/hold time of data, and includes a data generating unit for delaying an external clock signal according to counting signals and generating an internal clock signal and data si...
02/14/2012
8111560Semiconductor memory device
A semiconductor memory device includes a first sense amplifier which senses data on a first line pair and generates a first output signal; and a test unit which senses the data on a first line pair and transfers a second output signal to a second line in response to...
02/07/2012
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