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Assignee: Hitachi Science Systems, Ltd.


Location: Hitachinaka, JP
No. of patents: 8

NumberTitleIssue Date
7364698Automatic analyzer
Without causing an increase in size and complication of an automatic analyzer, the efficiency of washing cuvettes can be increased and the amount of detergent used can be more effectively saved in comparison with known analyzers. In an automatic analyzer in which a ...
04/29/2008
7163379Gradient liquid feed pump system, and liquid chromatograph
A gradient liquid feed pump system capable of liquid feed in a correct mixing ratio even in the case of liquid feed in which the mixing ratio varies. Specifically, it comprises a first plunger pump for sucking and delivering an eluate, a second the first and second ...
01/16/2007
7146872Micro manipulator
Provision of a 3-DOF micro manipulator easy to operate and capable of executing accurate positioning, wherein the link mechanisms of the micro manipulator whose main operation is parallel 3-DOF operation are implemented by cutting, folding, and moding a sheet of met...
12/12/2006
7041977Electron microscope
An object of the present invention is to provide an electron microscope that is capable of improving work efficiency when restarting sample observation. A control unit for controlling observation-condition setting devices, which include an electron-gun control unit,...
05/09/2006
6972405Nanoscale standard sample and its manufacturing method
An indicator indicating the direction of a diffraction grating pattern is provided on a chip so that the direction of the pattern can be accurately determined. The indicator includes an anisotropic shape of the chip and the formation of a marking-off line or a mark ...
12/06/2005
6920703Microstructure drying treatment method and its apparatus and its high pressure vessel
The object of the present invention is to provide a microstructure drying treatment method by which a substrate having a microstructure has a fine pattern of less than 30 nm and a large-caliber substrate of 100 mm or more can be dried uniformly and in a short time w...
07/26/2005
6495838Sample heating holder, method of observing a sample and charged particle beam apparatus
High resolution observation of a sample at a high temperature above 1000° C. is accomplished by suppressing sample drift by heating over a short time and with small electric current. A heater envelope made of a ceramic having a carbon coating on the surf...
12/17/2002
5591980Bi-axial-tilting specimen fine motion device and method of correcting image shifting
In a eucentric side entry goniometer stage used in an electron microscope controlled in five-axes of specimen positions (x, y, z) and specimen tilt angles (θx, θy), image shifting during tilting a specimen is automatically correcte...
01/07/1997
 
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