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A sealed crustless sandwich for providing a convenient sandwich without an outer crust which can be stored for long periods of time without a central filling from leaking outwardly.
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| Number | Title | Issue Date |
| 7388199 | Probe manufacturing method, probe, and scanning probe microscope A probe is made by attaching a carbon nanotube 12 to a mounting base end 13, which eliminates the effects of a carbon contamination film, to increase the bonding strength, increase the conductivity of the probe, and strengthen the bonding performance t... | 06/17/2008 |
| 7350404 | Scanning type probe microscope and probe moving control method therefor The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is... | 04/01/2008 |
| 7333191 | Scanning probe microscope and measurement method using the same A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to m... | 02/19/2008 |
| 7243441 | Method and apparatus for measuring depth of holes formed on a specimen A method an apparatus for measuring the depths of many fine holes formed in the surface of a sample by etching. Positional information on a plurality of hole patterns is acquired by scanning, with a stylus, the surface of the sample in which the hole patterns are fo... | 07/17/2007 |
| 6745617 | Scanning probe microscope This scanning probe microscope is provided with a cantilever with a probe tip facing a sample, a Z fine movement section for changing a distance between the sample and the probe tip, a XY scanning control section for providing relative displacement toward a sample s... | 06/08/2004 |
| 6698291 | Ultrasonic inspection apparatus An ultrasonic inspection apparatus obtains information on the interface of a sample as digital waveform data for any "unit measurement range" and is provided with at least two data memories and controlled by a scan state monitoring signal showing the scan... | 03/02/2004 |
