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| Number | Title | Issue Date |
| 8046843 | Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample material with respect to each other, and a controller. The controlle... | 10/25/2011 |
| 7947952 | Nanomachining method and apparatus Methods and apparatus are disclosed for nanomachining operations. Excitation energy settings are provided to minimize machine induced scan cutting. Cut operations can be operated in a feedback mode to provide controlled cutting operations. Measurement and sweep tech... | 05/24/2011 |
| 7946020 | Manufacturing of micro-objects such as miniature diamond tool tips Techniques for affixing a micro-object to a mounting structure at a desired relative orientation. A shaped portion of a work piece is caused to become embedded in two or more reference structures at stages during fabrication. The micro-object may have dimensions les... | 05/24/2011 |
| 7930766 | Fluid delivery for scanning probe microscopy The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or Nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging... | 04/19/2011 |
| 7631549 | Method and apparatus for micromachines, microstructures, nanomachines and nanostructures Parts and structures are described for micro and nano machines and the creation of macro structures with nano and micro layers of special materials to provide improved performance. ... | 12/15/2009 |
| 7503206 | Fluid delivery for scanning probe microscopy The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging... | 03/17/2009 |
| 7266998 | Method and apparatus for micromachines, microstructures, nanomachines and nanostructures Parts and structures are described for micro and nano machines and the creation of macro structures with nano and micro layers of special materials to provide improved performance. ... | 09/11/2007 |
| 7253407 | Active cantilever for nanomachining and metrology A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of t... | 08/07/2007 |
| 7196328 | Nanomachining method and apparatus Methods and apparatus are disclosed for nanomachining operations. Excitation energy settings are provided to minimize machine induced scan cutting. Cut operations can be operated in a feedback mode to provide controlled cutting operations. Measurement and sweep tech... | 03/27/2007 |
| 7178387 | Method and apparatus for scanning in scanning probe microscopy and presenting results Information is collected from a region of interest using a scanning probe microscope having a tip by moving the tip along at least one predefined path extending from a center location to a peripheral location in the region of interest and collecting information usin... | 02/20/2007 |
| 7137292 | Active cantilever for nanomachining and metrology A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the... | 11/21/2006 |
| 7109482 | Object inspection and/or modification system and method A scanning probe microscope system (100) includes an objective lens (147), a clamping circuit (404), a tip deflection measurement circuit (421), a cantilever (136), and a probe (137) for modifying and inspecting an object ( | 09/19/2006 |
| 7091476 | Scanning probe microscope assembly A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object. ... | 08/15/2006 |
| 7042828 | Nanometer scale data storage device and associated positioning system A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning a... | 05/09/2006 |
| 7030369 | Scanning probe microscope assembly A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object. ... | 04/18/2006 |
| 6998689 | Fluid delivery for scanning probe microscopy The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging... | 02/14/2006 |
| 6931710 | Manufacturing of micro-objects such as miniature diamond tool tips Techniques for affixing a micro-object to a mounting structure at a desired relative orientation. A shaped portion of a workpiece is caused to become embedded in a reference structure at a first relative orientation. The workpiece is parted into first and second por... | 08/23/2005 |
| 6923044 | Active cantilever for nanomachining and metrology A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the... | 08/02/2005 |
| 6880388 | Active cantilever for nanomachining and metrology A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of t... | 04/19/2005 |
| 6865927 | Sharpness testing of micro-objects such as miniature diamond tool tips A micro-object having a desired sharp point or edge may be optically tested during fabrication. This is accomplished by applying a known force to the workpiece against an optically opaque layer disposed on a transparent substrate, passing light down the workpiece to... | 03/15/2005 |
| 6861648 | Scanning probe microscopy inspection and modification system A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system inclu... | 03/01/2005 |
| 6813937 | Method and apparatus for micromachines, microstructures, nanomachines and nanostructures Parts and structures are described for micro and nano machines and the creation of macro structures with nano and micro layers of special materials to provide improved performance. ... | 11/09/2004 |
| 6802646 | Low-friction moving interfaces in micromachines and nanomachines A low-friction device having a moving interface comprising first and second members. Each of the members has a maximum dimension of about 100 μm or less between any two points. At least the first member is formed of diamond and the first and second members are in s... | 10/12/2004 |
| 6787768 | Method and apparatus for tool and tip design for nanomachining and measurement A single-body structure is presented for use as a tool tip for making modifications and/or collecting measurements on a target object. The single-body structure comprises a first end portion, a second end portion opposite the first portion, and a mid portion between... | 09/07/2004 |
| 6752008 | Method and apparatus for scanning in scanning probe microscopy and presenting results Information is collected from a region of interest using a scanning probe microscope having a tip by moving the tip along at least one predefined path extending from a center location to a peripheral location in the region of interest and collecting information usin... | 06/22/2004 |
| 6724712 | Nanometer scale data storage device and associated positioning system A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning a... | 04/20/2004 |
| 6507553 | Nanometer scale data storage device and associated positioning system A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a po... | 01/14/2003 |
| 6396054 | Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.... | 05/28/2002 |
| 6369379 | Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.... | 04/09/2002 |
| 6339217 | Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements A scanning probe microscope assembly (100) that has an atomic force measurement (AFM) mode (137), a scanning tunneling measurement (STM) mode (138), a near-field spectrophotometry mode (143), a near-field optical mode (151), and a hardness testing mode 19... | 01/15/2002 |
| 6229138 | Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.... | 05/08/2001 |
