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Assignee: Espec Corp.


Location: Osaka, JP
No. of patents: 16

NumberTitleIssue Date
8126666Fuel cell evaluation method and fuel cell evaluation apparatus
A fuel cell evaluation apparatus of the present invention is provided with a fuel cell for generating electricity using fuel gas and oxidizer gas; a fuel gas supplying section for supplying the fuel gas; an oxidizer gas supplying section for supplying the oxidizer g...
02/28/2012
7558064Cooling apparatus
The cooling apparatus comprises an air supply system, a water supply system, and a sprayer, and has a structure such that water and compressed air are mixed and the air is sprayed together with the water converted into mist onto the upper surface of a device attache...
07/07/2009
7498830Burn-in apparatus
The burn-in apparatus includes a water supply system and a sprayer and has a structure such that water is converted into mist and sprayed onto the upper surface of a device attached to a socket of a burn-in board. The amount of heat generated by the device that gene...
03/03/2009
7497136Environmental test apparatus
A second tank for accommodating a sample is disposed within a first tank. A heater for heating gas is provided inside the second tank. A heater controller controls the heater such that temperature of gas becomes a set temperature. A guide portion which guides conden...
03/03/2009
7396606Fuel-cell evaluation equipment
A fuel-cell evaluation equipment includes a gas passageway for supplying gas to a fuel cell and a thermostat adapted to accommodate the fuel cell, wherein the gas passageway includes a first temperature regulator adapted to regulate the temperature of gas and a humi...
07/08/2008
7324746Fluid heater and evaluation equipment incorporating the same
A temperature regulator has two headers connected to both ends of a heat receiving tube in which gas flows. The heat receiving tube has a heating element at the outer periphery thereof and a mixer accommodated therein to cause turbulent flow of gas passing through t...
01/29/2008
7312522Mounting member of semiconductor device, mounting configuration of semiconductor device, and drive unit of semiconductor device
A mounting member of a semiconductor device according to the present invention includes a wiring substrate to input and/or output actuating signals to a semiconductor device, a power supplying conductor plate to supply actuating power to the semiconductor device, an...
12/25/2007
7311528IC socket
An IC socket comprises a plurality of conductive connecting sections each having a holding section for holding one of a plurality of lead terminals of an IC; and a plurality of conductive coil springs, which are protruded from the IC socket and respectively fixed to...
12/25/2007
7257956Cooling apparatus
A cooling apparatus configured such that a cooling body provided with heat-dissipating plates is pressed against a device to which a socket of a burn-in board is attached, and air is provided by a blower such that the air passes between the heat-dissipating plates, ...
08/21/2007
7214961Semiconductor testing device and semiconductor testing method
A semiconductor testing device of the invention has a measuring substrate that is provided with holes therethrough for exposing a pad of each of the dies of a semiconductor wafer mounted on the measuring substrate, the semiconductor wafer being supported by a wafer ...
05/08/2007
7199598Burn-in substrate for semiconductor devices
Input and output of small-current signals between a mother board and semiconductor devices subjected to a burn-in test are made via a device driving unit. Large-current main power is supplied via the device driving unit through bus bars without passing through the m...
04/03/2007
7140260Gas flow measuring device and gas flow measuring method
The present invention realizes (i) a gas flow measuring device which can measure a gas flow of a low-boiling gas in a mixed gas including two types of gasses having different boiling points, and (ii) a method of measuring a gas flow easily but highly precisely, usin...
11/28/2006
7115838Unit for varying a temperature of a test piece and testing instrument incorporating same
A disc-type unit 10 adjusts temperature of a control face 14 by means of a heater 12 and coolant, with a hollow plate 11 to which the heater 12 is secured, a cavity 13 formed in the hollow plate 11 and a piping 20
10/03/2006
6955551Card edge connector jig and card edge connector connection mechanism
The short circuit metal fitting 12 is made to realize such an arrangement that the distance from the contact position of the connection terminals 3 of the electronic circuit board 1 and the short circuit metal fitting 12 in the opening se...
10/18/2005
6938432Cooling apparatus and a thermostat with the apparatus installed therein
A cooling apparatus (1) has a compressor (2), a condenser (3), an expansion valve (5), an evaporator (6) and an electric valve (10), all connected to each other in this order by a piping line to form a refrigeration circuit....
09/06/2005
6767221IC socket module
In order to carry out the electric property evaluation of internal wiring of an IC, the IC is attached to an IC socket, and terminals of the IC socket are connected with the external wiring via leads and coaxial connectors. The IC is directly in touch with a heating...
07/27/2004
 
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