"That’s an amazing invention, but who would ever want to use one of them?"
President Rutherford B. Hayes ; Said in 1876, after Alexander Graham Bell demonstrated the telephone to him at the White House
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| Number | Title | Issue Date |
| 8116909 | Gantry position tracking using redundant position sensors An x-y robotic motion control system includes a controller, a first rail and a second rail spaced from the first rail wherein the first and second rails are substantially parallel to one another. A gantry has a first end movable along the first rail and a second end... | 02/14/2012 |
| 8064068 | Multi-source sensor for three-dimensional imaging using phased structured light A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point o... | 11/22/2011 |
| 8059280 | Method for three-dimensional imaging using multi-phase structured light A method for mapping height of a feature upon a test surface is provided. The method includes projecting patterned illumination upon the feature, the patterned illumination having a plurality of distinct fringe periods. A first image of the feature is acquired while... | 11/15/2011 |
| 7813559 | Image analysis for pick and place machines with in situ component placement inspection The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece... | 10/12/2010 |
| 7746481 | Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam A method of measuring and storing a center of rotation of a nozzle in a pick and place machine is provided. The method includes coupling an artifact to the nozzle. A substantially collimated laser beam is directed at the artifact, which is rotated while the collimat... | 06/29/2010 |
| 7706595 | Pick and place machine with workpiece motion inspection Embodiments include measuring motion characteristics of the workpiece through the placement process. Since the component is placed on the workpiece with some force to ensure proper adhesion to the workpiece, some deflection of the workpiece is expected during the pl... | 04/27/2010 |
| 7559134 | Pick and place machine with improved component placement inspection Embodiments of the present invention improve upon component level inspection performed by pick and place machines. Such improvements include using a position sensitive device that measures the position of the placement head relative to the workpiece as the placement... | 07/14/2009 |
| 7555831 | Method of validating component feeder exchanges A method and apparatus for facilitating validation of component feeder exchanges in pick and place machines are provided. A pre-exchange image of a component from a feeder is acquired and compared with an image a component from the exchanged feeder placed after the ... | 07/07/2009 |
| 7545514 | Pick and place machine with improved component pick image processing A pick and place machine includes a sensor disposed to acquire an image of a nozzle before a pick operation, and one or more images after the pick operation. Image analytics based upon these images reveal important characteristics that can be used to classify the pi... | 06/09/2009 |
| 7369334 | Optical device with alignment compensation An optical device is provided which includes a plurality of optical modules and an alignment compensation module. Each optical module includes an optical component fixedly coupled to a relative reference mount. The relative reference mount is configured to attach to... | 05/06/2008 |
| 7346420 | Component feeder exchange diagnostic tool A method and apparatus for facilitating validation of component feeder exchanges in pick and place machines are provided. A pre-exchange image of a component from a feeder is acquired and compared with an image a component from the exchanged feeder placed after the ... | 03/18/2008 |
| 7346419 | Component feeder exchange diagnostic tool A method and apparatus for facilitating validation of component feeder exchanges in pick and place machines are provided. A pre-exchange image of a component from a feeder is acquired and compared with an image a component from the exchanged feeder placed after the ... | 03/18/2008 |
| 7239399 | Pick and place machine with component placement inspection Improved component placement inspection and verification is performed by a pick and place machine. Improvements include stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination i... | 07/03/2007 |
| 7190393 | Camera with improved illuminator An illumination and imaging system is provided with a co-axial illuminator that does not include a beamsplitter. The co-axial illuminator achieves efficiencies substantially in excess of those achieved with a beamsplitter. In one aspect, an optical stop is used to r... | 03/13/2007 |
| 7027639 | High speed optical image acquisition system with extended dynamic range A high-speed image acquisition system includes a source of light; a sensor for acquiring a plurality of images of the target; a system for determining relative movement between the source and the target; and an image processor for processing the acquired images to g... | 04/11/2006 |
| 7010855 | Optical module An optical module for use in an optical device is provided. The module includes an optical component and relative reference mount. The optical component is fixed spacially relative to a registration feature. The registration feature is configured to couple to a fixe... | 03/14/2006 |
| 6971164 | Optical device An optical device is provided which includes a plurality of optical modules. Each optical module includes an optical component fixedly coupled to a relative reference mount. The relative reference mount is configured to attach to a substrate. A plurality of optical ... | 12/06/2005 |
| 6956999 | Optical device An optical device includes a fixed reference. A first optical module has a first optical component prealigned with respect to a reference feature, the first optical module is subsequently mounted to a first predetermined location on the fixed reference. A second opt... | 10/18/2005 |
| 6954681 | Board align image acquisition device with improved interface An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be cou... | 10/11/2005 |
| 6825486 | System for mapping wafers using predictive dynamic lighting A wafer mapping system includes an imaging array, at least one lighting module and a controller coupled to the imaging array and the lighting module. The controller is adapted to receive information relative to an initial acquired wafer image and adjust illumination... | 11/30/2004 |
| 6762847 | Laser align sensor with sequencing light sources A sensor for sensing placement information of a component to be placed by a pick and place machine is disclosed. The sensor includes a plurality of light sources each of which is disposed to direct illumination at different angles of incidence upon the component. Ea... | 07/13/2004 |
| 6750899 | Solder paste inspection system A novel inspection system for inspecting an article of manufacture, such as a printed circuit board, is disclosed, where the system includes a strobed illuminator adapted to project light through a reticle so as to project a pattern of light onto an area of the prin... | 06/15/2004 |
| 6744499 | Calibration methods for placement machines incorporating on-head linescan sensing A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized c... | 06/01/2004 |