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| Number | Title | Issue Date |
| 6674628 | Pulse-width modulated relay A relay controller intermittently connects a power supply across a relay coil with a controlled duty cycle whenever the relay coil is to generate a magnetic field for opening or closing the relay's contacts. The duty cycle with which the controller connec... | 01/06/2004 |
| 6651016 | Jitter-corrected spectrum analyzer An analog signal is digitized by an analog-to-digital (A/D) converter clocked by a periodically jittery clock signal. Elements of the digital data sequence (vector) output of the A/D converter are sorted into a set of smaller vectors according to clock si... | 11/18/2003 |
| 6594604 | S-parameter measurement system for wideband non-linear networks A system for determining scattering parameters (S-parameters) characterizing the behavior of a network applies a wideband stimulus signal containing multiple signal components as input to the network. The system then measures incident and reflected wavefo... | 07/15/2003 |
| 6590509 | Data recovery through event based equivalent time sampling A system uses an event based equivalent time sampling method for ascertaining a value of each bit of a data frame repeated in a digital signal of indeterminate phase. The system measures time intervals between rising edges of the digital signal and a refe... | 07/08/2003 |
| 6587979 | Partitionable embedded circuit test system for integrated circuit A flexible built-in self-test (BIST) circuit is incorporated into an integrated circuit (IC) for testing one or random access memories or other memories embedded in an integrated circuit regardless of the number, size or test requirements of the memories.... | 07/01/2003 |
| 6563350 | Timing signal generator employing direct digital frequency synthesis A timing signal generator including a direct digital frequency synthesizer (DDFS), a divide-by-N counter, and a pattern generator, produces a TIMING signal conveying a timed sequence of pulses. The pattern generator produces a sequence of data pairs (FREQ... | 05/13/2003 |
| 6505138 | Function-based control interface for integrated circuit tester prober and handler devices A system for testing a set of integrated circuits (ICs) that may be implemented as dies in a group of wafers or as packaged ICs mounted in a group of load boards includes a test head for testing the ICs and a prober or handler for holding each wafer or lo... | 01/07/2003 |
| 6484117 | Predictive temperature control system for an integrated circuit Variation in temperature of a digital logic circuit that temporarily increases its heat production after a digital input signal changes state is limited using a heater that applies heat to the digital logic circuit at a variable rate. A control circuit mo... | 11/19/2002 |
| 6420989 | Programmable non-uniform clock signal generator A clock signal generator produces an output clock signal having signal pulse timing adjustable with a resolution of P seconds. To produce a clock signal having an average frequency that is other than 1/k*P, where k is an integer, the clock signal generato... | 07/16/2002 |
| 6407541 | Docking mechanism for semiconductor tester A docking mechanism docks a test head having a docking plate to a machine having a docking fixture when the docking plate is in a predetermined position with respect to the docking fixture. The test head has cam blocks which are moveable with respect to t... | 06/18/2002 |
| 6396706 | Self-heating circuit board Separate heating elements are embedded in a printed circuit board near integrated circuit (IC) packages or other parts mounted on the circuit board. Each heating element supplies heat to the part residing near it in response to an input voltage pulse. The... | 05/28/2002 |
| 6396257 | Test head manipulator for semiconductor tester with manual assist for vertical test head movement A test head manipulator for a semiconductor integrated circuit tester includes a support frame, a vertical guide attached to the support frame, a carriage mounted on the vertical guide and movable vertically therealong, a manipulator arm attached to the c... | 05/28/2002 |
| 6392866 | High frequency relay assembly for automatic test equipment A low-profile, short signal path relay assembly implementing several relays for use in an integrated circuit tester, a digitizer or other equipment requiring multiple relays, includes a chassis and a signal board mounted within the chassis. Each relay inc... | 05/21/2002 |
| 6392404 | Triggered integrated circuit tester A triggered integrated circuit (IC) tester in accordance with the invention organizes a test of an IC into a succession of test cycles. A vector generated prior to the start of each test cycle references the test activities to be carried out during the te... | 05/21/2002 |
| 6380730 | Integrated circuit tester having a program status memory An integrated circuit (IC) tester employs a pattern generator including an instruction processor executing an algorithmic program stored in a program memory. The program defines a sequence of vectors defining test activities to be carried out during succe... | 04/30/2002 |
| 6377062 | Floating interface for integrated circuit test head A floating interface assembly provides signal paths between an integrated circuit (IC) test head and contact pads on a load board or probe card accessing an IC to be tested. Pogo pins or other contactors for contacting the contact pads are mounted on the ... | 04/23/2002 |
| 6356154 | FET-based, linear voltage-controlled resistor for wide-band gain control circuit A gain control circuit for generating a differential output signal in response to a differential input signal with a gain controlled by an input control signal employs two asymmetric field effect transistors (FETs) as a linear, voltage-controlled resistor... | 03/12/2002 |
| 6356224 | Arbitrary waveform generator having programmably configurable architecture An arbitrary waveform generator (AWG) for producing an analog output current signal includes a random access memory (RAM), a programmable logic device (PLD), a programmable pattern generator, several digital-to analog converters (DACS) and a current multi... | 03/12/2002 |
| 6351814 | Field programmable gate array with program encryption A field programmable gate array (FPGA) and a decryption circuit are implemented within a common integrated circuit (IC) or within separate ICs enclosed within a common IC package. The decryption circuit decrypts an input FPGA program encrypted in accordan... | 02/26/2002 |
| 6348785 | Linear ramping digital-to-analog converter for integrated circuit tester An arbitrary waveform generator (AWG) generates an output signal that linearly ramps between discrete levels to approximate a smoothly varying waveform. The AWG includes a digital-to-analog converter (DAC) formed by a set of N ramp generators, with each r... | 02/19/2002 |
| 6331781 | Spaced adaptor plate for semiconductor tester A load board is attached to the test head of a semiconductor tester and has a receptacle surface oriented substantially perpendicular to a Z-axis and presented toward a handler location. An adaptor plate is attached to a Z axis abutment structure and has ... | 12/18/2001 |
| 6329892 | Low profile, current-driven relay for integrated circuit tester A relay includes contacts residing within a glass tube. A coil surrounding the tube and a switch are connected in parallel between two terminals of the relay. A current source supplies a current to the coil and switch. When the switch is open, substantial... | 12/11/2001 |
| 6329811 | Calibration unit for semiconductor integrated circuit tester A calibration unit for a semiconductor integrated circuit tester includes a frame, a manipulator arm which extends in cantilever fashion from the frame, and a calibration head attached to the manipulator arm at its distal end and having a downwardly direc... | 12/11/2001 |
| 6330197 | System for linearizing a programmable delay circuit A random access memory (RAM) having N addressable storage locations is addressed by input data specifying a signal delay, and the RAM reads out control data controlling the delay of a delay circuit. A linearization system automatically adjusts the value o... | 12/11/2001 |
| 6320467 | Ft multiplier amplifier with low-power biasing circuit An Ft multiplier amplifier employs N similar differential amplifier stages, each including a differential transistor pair. Bases of each pair form stage inputs and collectors of each pair form stage outputs. Inputs of adjacent stages are connec... | 11/20/2001 |
| 6321352 | Integrated circuit tester having a disk drive per channel An integrated circuit (IC) tester includes set of tester channels, each for carrying out a test activity at a separate terminal of an IC device under test (DUT) during each cycle of a test. Each tester channel includes a disk for storing several instructi... | 11/20/2001 |
| 6304989 | Built-in spare row and column replacement analysis system for embedded memories A built-in replacement analysis (BIRA) circuit allocates spare rows and columns of cells for replacing rows and columns of an array of memory cells in response to an input sequence of cell addresses, each identifying a row address and a column address of ... | 10/16/2001 |
| 6304092 | Self-aligning docking assembly for semiconductor tester A mechanical interface between the test head of a semiconductor integrated circuit tester and a wafer prober includes docking bars which are releasably attached to a docking plate of the wafer prober and an interface member between the test head and the d... | 10/16/2001 |
| 6295623 | System for testing real and simulated versions of an integrated circuit A system for testing both simulated and real versions of an integrated circuit (IC) includes an IC simulator, a simulator manager, an IC tester, and a tester manager. The IC simulator simulates response of the IC to a set of simulated IC input signals by ... | 09/25/2001 |
| 6292056 | Differential amplifier with adjustable common mode output voltage A control unit automatically adjusts the supply voltage to a differential amplifier so that the amplifier has a common mode output voltage matching an input control voltage. The control unit employs circuit elements analogous to circuit elements forming t... | 09/18/2001 |
| 6288560 | Self-soldering integrated circuit probe assembly A probe assembly for probing pins of an integrated circuit (IC) includes a base providing a set of solder-coated contacts arranged to contact a corresponding set of IC pins when the base is placed over the IC pins. The base also includes an heating elemen... | 09/11/2001 |
| 6288555 | Fixture for use in measuring an electrical characteristic of a pogo pin An electrical parameter of a rod-form conductive element is measured using a measurement fixture which includes an insulating support on which a first conductive element is mounted. A transmission line connector mounted on the insulating support and has a... | 09/11/2001 |
| 6256757 | Apparatus for testing memories with redundant storage elements A memory tester tests a random access memory device under test (DUT) comprising addressable rows and columns of memory cells, and provides a host computer with enough information to determine how to efficiently allocate spare rows and columns for replacin... | 07/03/2001 |
| 6246737 | Apparatus for measuring intervals between signal edges An apparatus for measuring a time interval between a start signal edge and a stop signal edge provides a stable clock signal as input to a delay line formed by a series of similar logic gates. The output signal of the last gate of the series is phase lock... | 06/12/2001 |
| 6232759 | Linear ramping digital-to-analog converter for integrated circuit tester An integrated circuit (IC) tester includes a separate arbitrary waveform generator (AWG) for each input terminal of an IC to be tested. Each AWG generates a test signal input to the IC terminal that linearly ramps between discrete levels to approximate a ... | 05/15/2001 |
| 6202186 | Integrated circuit tester having pattern generator controlled data bus An integrated circuit tester includes a host computer, a pattern generator and a set of tester circuits for performing a series of tests on an integrated circuit. The pattern generator is programmed to supply a sequence of pattern data as input to the tes... | 03/13/2001 |
| 6194911 | Integrated circuit tester with compensation for leakage current In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source a... | 02/27/2001 |
| 6191595 | Adhesive attaching, thermal releasing flat pack probe assembly A probe assembly contacts pins of a flat pack or other integrated circuit (IC) package having a body with a flat upper surface and a plurality of pins extending horizontally outward from the IC package body. The probe assembly includes a base that is bond... | 02/20/2001 |
| 6184676 | Cooling system for test head A test head for a semiconductor integrated circuit tester comprises a housing which has an air inlet opening and an air outlet opening and bounds a pin card space and an air chamber. Multiple pin cards are located in the pin card space and radiate from an... | 02/06/2001 |
| 6181151 | Integrated circuit tester with disk-based data streaming An integrated circuit (IC) tester includes set of tester channels, each for carrying out a test activity at a separate terminal of an IC device under test (DUT) during each cycle of a test. The tester also includes a disk drive having a removable disk for... | 01/30/2001 |
